KR100995804B1 - ?-nitride semiconductor light emitting device - Google Patents
?-nitride semiconductor light emitting device Download PDFInfo
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- KR100995804B1 KR100995804B1 KR20050029195A KR20050029195A KR100995804B1 KR 100995804 B1 KR100995804 B1 KR 100995804B1 KR 20050029195 A KR20050029195 A KR 20050029195A KR 20050029195 A KR20050029195 A KR 20050029195A KR 100995804 B1 KR100995804 B1 KR 100995804B1
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- nitride semiconductor
- light emitting
- emitting device
- semiconductor layer
- bonding pad
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Abstract
The present invention solves the problem of current concentration at the end of the n-side or p-side electrode by providing a current blocking portion between the n-side electrode and the p-side electrode. .
Light Emitting Device, High Power, Electrode, Current Blocker, Reliability
Description
1 is a view showing a conventional group III nitride semiconductor light emitting device,
2A is a view showing an example of a plan view of a conventional light emitting device;
2B is a view showing another example of a plan view of a conventional light emitting device;
3A is a view for explaining that current concentration phenomenon occurs in the light emitting device of FIG. 2A;
FIG. 3B is a diagram illustrating that a current concentration phenomenon occurs in the light emitting device of FIG. 2B;
4 is a view showing a conventional general high power light emitting device,
5 is a view for explaining a disadvantage of a conventional general high power light emitting device;
6A and 6B illustrate an example of a group III nitride semiconductor light emitting device according to the present invention;
6C and 6D show another example of the group III nitride semiconductor light emitting device according to the present invention;
7A and 7B are views illustrating an example in which the present invention is applied to a high output light emitting device;
7C is a view showing another example in which the present invention is applied to a high power light emitting device;
7d is a view showing another example of the current interrupting unit according to the present invention;
7E is a view showing a modification of the light emitting device of FIG. 7C;
8A is a view showing another example in which the present invention is applied to a high power light emitting device;
8B is a view illustrating an example of a cross section along the A-B line of FIG. 8A,
9A is a view showing another example in which the present invention is applied to a high power light emitting device;
9B is a view illustrating an example of a cross section along the A-B line of FIG. 9A;
10A is a view showing another example of a light emitting device according to the present invention;
10B is a view showing another example of a light emitting device according to the present invention;
The present invention relates to a group III nitride semiconductor light emitting device, and more particularly, to a structure having a current blocking unit to block a current concentration phenomenon to improve the performance of the device.
Here, the group III nitride semiconductor light emitting device has a compound semiconductor layer of Al (x) Ga (y) In (1-xy) N (0 ≦ x ≦ 1, 0 ≦ y ≦ 1, 0 ≦ x + y ≦ 1). Means a light emitting device, such as a light emitting diode including a, and additionally excludes that the semiconductor layer or the material itself of the other group elements, such as SiC, SiN, SiCN, CN, etc. It is not.
1 is a view showing a conventional group III nitride semiconductor light emitting device, wherein the light emitting device is an epitaxially grown n-type nitride semiconductor layer over a
2A is a view showing an example of a plan view of a conventional light emitting device, and has a
2B is a view showing another example of a plan view of a conventional light emitting device, in which an n-
FIG. 3A is a diagram illustrating that a current concentration phenomenon occurs in the light emitting device of FIG. 2A. When the current density is large in the light emitting device shown in FIG. 2A, the p-
FIG. 3B is a diagram illustrating the occurrence of the current concentration phenomenon in the light emitting device of FIG. 2B. As in FIG. 3A, the current concentration phenomenon occurs at the shortest distance between the p-
4 is a diagram illustrating a conventional general high output light emitting device, in order to implement a high output light emitting device having a large chip size, a p-side electrode having a plurality of
However, this type of electrode has a big disadvantage. FIG. 5 is a view illustrating a disadvantage of a conventional general high output light emitting device. In the case where both
SUMMARY OF THE INVENTION In view of the above problems, an object of the present invention is to provide a group III nitride semiconductor light emitting device in which a current concentration prevention pattern is formed between electrodes to improve the reliability of the light emitting device and to improve the performance of the light emitting device.
Hereinafter, with reference to the accompanying drawings will be described the present invention in more detail.
6A and 6B illustrate an example of a group III nitride semiconductor light emitting device according to the present invention, wherein an n-type
6C and 6D illustrate another example of the group III nitride semiconductor light emitting device according to the present invention, wherein the p-
7A and 7B are diagrams illustrating an example in which the present invention is applied to a high output light emitting device, and the
FIG. 7C is a diagram illustrating another example in which the present invention is applied to a high output light emitting device, and the
In FIG. 7D, a portion of the
FIG. 7E illustrates an example in which the
FIG. 8A is a view showing another example in which the present invention is applied to a high output light emitting device, and in the case of the electrode structure shown in FIG. While the condensation occurs, the embodiment illustrated in FIG. 8A illustrates a structure in which the number of the ends of the arms of the electrode is minimized as much as possible. That is, the n-
FIG. 8B is a view showing an example of a cross section along the A-B line of FIG. 8A, in which a
FIG. 9A is a diagram illustrating another example in which the present invention is applied to a high output light emitting device. Unlike FIG. 8A, a p-
FIG. 9B is a diagram illustrating an example of a cross section along the A-B line of FIG. 9A. Since the center portion is etched to form a
As described above, the wire bonding pad may be formed at various positions of the light emitting device, and FIGS. 10A to 10C illustrate examples thereof.
In the case of Fig. 10A, a wire bonding pad 102a1 is formed at one end of the p-
In the case of FIG. 10B, the pad 102b1 for wire bonding is positioned in the middle of the p-
The present invention solves the problem of current concentration at the end of the n-side or p-side electrode by providing a current blocking portion between the n-side electrode and the p-side electrode. .
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR20050029195A KR100995804B1 (en) | 2005-04-07 | 2005-04-07 | ?-nitride semiconductor light emitting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR20050029195A KR100995804B1 (en) | 2005-04-07 | 2005-04-07 | ?-nitride semiconductor light emitting device |
Publications (2)
Publication Number | Publication Date |
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KR20060107158A KR20060107158A (en) | 2006-10-13 |
KR100995804B1 true KR100995804B1 (en) | 2010-11-22 |
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Family Applications (1)
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KR20050029195A KR100995804B1 (en) | 2005-04-07 | 2005-04-07 | ?-nitride semiconductor light emitting device |
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Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101068001B1 (en) * | 2011-06-20 | 2011-09-26 | (주)더리즈 | Semiconductor light-emitting device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001024222A (en) | 1999-07-06 | 2001-01-26 | Matsushita Electric Ind Co Ltd | Gallium nitride compound semiconductor light-emitting element and its manufacture |
JP2002026386A (en) | 2000-07-10 | 2002-01-25 | Toyoda Gosei Co Ltd | Iii nitride compound semiconductor light emitting element |
JP2002164574A (en) | 2000-11-24 | 2002-06-07 | Mitsubishi Cable Ind Ltd | Semiconductor light emitting element |
JP2004087930A (en) | 2002-08-28 | 2004-03-18 | Nichia Chem Ind Ltd | Nitride semiconductor light-emitting device |
-
2005
- 2005-04-07 KR KR20050029195A patent/KR100995804B1/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001024222A (en) | 1999-07-06 | 2001-01-26 | Matsushita Electric Ind Co Ltd | Gallium nitride compound semiconductor light-emitting element and its manufacture |
JP2002026386A (en) | 2000-07-10 | 2002-01-25 | Toyoda Gosei Co Ltd | Iii nitride compound semiconductor light emitting element |
JP2002164574A (en) | 2000-11-24 | 2002-06-07 | Mitsubishi Cable Ind Ltd | Semiconductor light emitting element |
JP2004087930A (en) | 2002-08-28 | 2004-03-18 | Nichia Chem Ind Ltd | Nitride semiconductor light-emitting device |
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KR20060107158A (en) | 2006-10-13 |
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