KR100974346B1 - Digital probe inspection device and its method - Google Patents

Abstract

The present invention relates to a digital probe inspection device and an inspection method, comprising a digital device such as an AD converter, a control unit (MCU), an output unit, a memory unit to store the standard data of the probe, By comparing the measurement data of the test probes to determine whether there is an abnormality of the probes, by providing the user with the presence or absence of the probe failure and accurate inspection data can improve the inspection accuracy and ease of use.

Digital, probe, inspection

Description

Digital probe inspection device and its method

The present invention relates to a digital probe inspection device and an inspection method for quickly determining an abnormality of a probe at an installation site, and improving convenience of installation and management of a corresponding line monitoring device.

As a device for monitoring and controlling a distribution system, a distribution line switchgear, a distribution transformer monitoring device, and a distribution line multifunctional terminal device have been put into practical use. Among these devices, a contact or non-contact probe is used as a sensor for measuring the current and voltage of the distribution line. I use it.

The contact probe is a sensor for measuring the current and the voltage of the line at the same time, the non-contact probe means a sensor for measuring only the current of the line, the contact probe performs the role of CT and PT of the switchgear of the distribution line at the same time, The contactless probe may serve as a CT.

Various failures may occur when operating a distribution line monitoring and control device using the probe, but it is difficult to determine whether the failure is a device or a probe serving as a sensor.

In addition, in the case of overhead lines, many wired communication lines other than power distribution lines are very complicated, and it is difficult to determine whether the probe is correctly installed.

Therefore, an apparatus for evaluating the health of the probe itself used for the distribution line monitoring apparatus is desired.

In order to solve the problems of the prior art, the present invention generates a respective reference signal according to the type of probe, and performs a series of standard data setting procedures for obtaining a standard output value by applying the reference signal S1 to a reference probe. Digital probe inspection that can improve the inspection accuracy and convenience of use by determining whether the probe is abnormal by comparing the measured data measured by applying the same reference signal to the test probe to be measured and the standard data stored in the inspection apparatus. It is an object to provide an apparatus and an inspection method.

In order to achieve the above object, in the digital probe inspection device and inspection method of the present invention, a reference probe is constructed by configuring the inspection device with digital elements such as an AD converter, a DA converter, a control unit (MCU), an input unit, an output unit, and a memory unit. The standard data may be stored through a series of setting procedures, and the standard data may be compared with the measurement data of the test probe to determine whether there is an abnormality of the corresponding test probe, and the user may be provided with accurate test data.

The present invention relates to a digital probe test apparatus, and includes an input unit for inputting standard data set values of a reference probe and an execution command of a test probe, wherein the standard data of the reference probe is grouped according to the reference probe type. A memory unit for forming and storing each of the plurality of resistors, and selectively connecting a plurality of resistors and measuring the reference signal and the reference signal generated by the reference data set value of the reference probe to the reference probe or the test probe. It includes an analog multiplexer that adjusts the phase and magnitude differences of the signal. And a controller configured to control the input unit, the memory unit, and the analog multiplexer, and determine whether there is an abnormality of the probe, and to convert the reference signal formed by the controller into an analog signal and apply the analog signal to the analog multiplexer. do. In addition, the analog multiplexer is connected to the terminating resistor of the analog multiplexer, and converts the measurement signal into a digital signal and transmits to the control unit, and is connected to the control unit, the standard data of the reference probe and the measurement of the test probe It is preferred to include an output for displaying data.

In the present invention, it is preferable to further include an external terminal for monitoring the reference signal, the measurement signal, the standard data and the measurement data in real time, and a communication unit for connecting the control unit.

In the present invention, the input unit preferably includes a measurement, execution, movement, setting and number input buttons.

In the present invention, the standard data of the reference probe includes a standard set value including the type of probe input by the user, the magnitude and frequency of the reference signal, the resistance used, the measurement period, the phase difference tolerance rate and the magnitude difference tolerance rate. And, it is preferably made of a standard measurement value including a standard phase difference average value and the standard magnitude difference average value measured from the reference probe.

In the present invention, it is preferable that the average value of the phase difference and the magnitude difference is calculated using the N phase difference and the magnitude difference obtained by measuring the output signal of the reference probe for N periods.

In addition, the present invention relates to a digital probe test method comprising the step of connecting a reference probe to the digital probe test device and inputting a standard setting value through the setting button of the input unit, the reference signal through the standard setting value And generating a standard output value from the output signal output by applying the generated reference signal to the reference probe, and storing the standard data including the standard setting value and the standard output value in a memory unit. It includes. And removing the reference probe, removing the test probe, and inputting a measurement button of an input unit, and comparing the data measured by the test probe with the standard data to determine whether the probe is normal. It is preferable to include.

According to the present invention, it is possible to improve inspection accuracy by determining whether an abnormality of the probe itself is detected by using an inspection device composed of digital elements, and indicating correct inspection data through the output unit as well as whether the probe is normal or malfunctioning.

In addition, by storing and reusing the standard data according to the type of probe to the memory unit, it is possible to improve the economics by performing a test on a plurality of probes with the same test device.

In addition, since the standard data according to the type of each probe is stored in the memory unit, even if the type of the test probe is changed, a separate setting process is unnecessary, thereby improving user convenience.

According to the present invention, a method of manufacturing a digital probe inspection device and setting a device of a probe includes connecting a reference probe to a terminal of the inspection device, and then pressing a setting button to select a probe type, a measurement period, a magnitude and frequency of a reference signal, and use the probe. The initial value can be saved in the memory by changing the item to be set among the resistance value, the phase difference tolerance rate, and the size difference tolerance rate using the move button and the execute button. Here, if the initial values for a plurality of types of probes are stored in one device, future tests for various probes may be easily performed with the same device.

When the probe to be connected to the probe is connected to the terminal of the inspection apparatus and the measurement button is pressed, the controller compares the initial value and the measured value of the probe to the controller and displays the result through the output unit. Inspection data can be visually determined.

Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. In adding reference numerals to components of the following drawings, it is determined that the same components have the same reference numerals as much as possible even if displayed on different drawings, and it is determined that they may unnecessarily obscure the subject matter of the present invention. Detailed descriptions of well-known functions and configurations will be omitted.

1 is a block diagram showing a digital probe inspection device according to an embodiment of the present invention.

Referring to FIG. 1, an input unit 100, a memory unit 110, an analog multiplexer 120, a controller 130, a digital-analog converter 140, an analog-digital converter 150, an output unit 160, and It includes a communication unit 170.

The input unit 100 is a keypad for inputting a command required to drive a test apparatus, but is not limited to a measurement, execution, movement, setting, and numeric input buttons, and other function keys for other user input interfaces. It may include.

The measurement button continuously calculates an average value by measuring a phase difference and a magnitude difference between the reference signal S1 and the measurement signal S2 for a set measurement period N times, and the execution button is a value input through the keypad ( Measurement, movement, and setting) can be transferred to the control unit (microcontroller).

The move button is a key for moving between items, and can be used for moving each item of a standard setting value, changing a probe type, changing a measurement period, and changing a phase difference and magnitude difference error rate.

The setting button may set standard data for each type of the probe and store the standard data in the memory unit 110.

The memory unit 110 may be used to store standard data of the probe or to store variables required in the operation of the controller 130, and may include a type of probe, a magnitude and frequency of a reference waveform S1, and an analog. Multiple types of probes are stored by grouping and storing the termination resistance value, measurement period, phase difference tolerance rate, magnitude difference tolerance rate, average value of standard phase difference, and average value of standard magnitude difference of the multiplexer. The standard data of the can be stored separately.

Accordingly, it is possible to distinguish between normal and abnormal using a plurality of probes with a single inspection device of the present invention, thereby increasing user convenience and improving economics.

The analog multiplexer 120 receives the reference signal S1 output by the control unit 130 via the digital-analog converter 140 to R1, R2,... It can be selectively connected to the resistance of Rn.

That is, the analog multiplexer 120 matches R1, R2,..., Which is equal to the terminal resistance value stored in the memory unit 110. The Rn resistor is connected to the reference signal S1. Accordingly, the phase difference and the magnitude difference between the reference waveform S1 and the measurement carrier S2 output from the probe can be adjusted.

The controller 130 may include the input unit 100, the memory unit 110, the analog multiplexer 120, the digital-to-analog converter 140, the analog-to-digital converter 150, the output unit 160, and the communication unit ( 170 may be connected to control each unit, and a failure of the probe may be determined by comparing an allowable error rate and a measurement error rate of the probe connected to the inspection apparatus.

That is, the controller 130 may include a microcontroller (MCU) that controls the entire probe inspection device and may perform inspection on the probe through a digital probe inspection method as shown in FIGS. 2 and 3.

The digital-to-analog converter 140 generates a sine wave (reference signal) S1 from the digital signal output from the controller 130, that is, generates the digital signal corresponding to the corresponding standard data in the controller 130, The digital signal may be converted into an analog signal through the digital analog converter 140 to generate a reference signal S1. In addition, the measurement signal S2 uses the reference signal S1 applied to the analog multiplexer 120 by Kirchhoff's Voltage Law (KVL) to terminate the resistance R _i (i = 1, 2, ..., n) and the voltage distribution between the synthetic impedances X _L and R _{N in} the probe.
The analog-to-digital converter 150 may convert the output signal S2 of the probe into a digital value.

The output unit 160 indicates a standard output value, a measured output value, and a measurement error rate of the probe through the LED and the LCD screen, and the output content is not limited thereto, but the type of the probe, the measurement period value, and the standard currently applied to the probe. The magnitude, frequency, and resistance of the waveform connected to the end of the analog multiplexer 120, phase difference (standard output value, measurement output value, measurement error rate), magnitude difference (standard output value, measurement output value, measurement error rate), normal and failure status, etc. It is preferable to represent.

The output unit 160 determines only whether the probe is normal or abnormal in the existing probe inspection device, and displays accurate inspection information of the probe numerically so that the user can obtain accurate inspection data to perform more precise inspection. Can be.

The communication unit 170 may connect an external terminal capable of real-time monitoring of the reference signal S1, the measurement signal S2, the standard data, and the measurement data with the controller 130 by wire or wireless.

2 is a flowchart illustrating standard data setting according to an embodiment of the present invention.

Referring to FIG. 2, after the reference probe, which is a standard, is connected to the digital probe inspection apparatus (S200), the setting button S202 of the input unit is pressed.

The type of the probe, the magnitude and frequency of the reference signal S1, the termination resistance Rn of the analog multiplexer, the measurement period N, the phase difference tolerance rate, and the size difference tolerance rate are obtained by using the input button and the numeric buttons. Input the set value of (S204).

A reference signal is generated through the input set value (S206), and the reference signal is transmitted to the analog multiplexer. In addition, the carrier applied to the reference probe through a path of the termination resistance value selected by the analog multiplexer and output at the same time, that is, the measurement signal S2, may be measured (S208).

Acquiring N measured values of one cycle from the measured signal S2 measured during the measurement period N, and calculating standard output values such as a standard phase difference average value and a standard magnitude difference average value corresponding to one cycle (S210). )can do.

The standard data such as the set value input in the step S204 and the standard output value in the step S210 may be stored in the memory unit (S212), and the contents thereof may be output through the output unit (S214).

3 is a flowchart illustrating a digital probe inspection method according to an embodiment of the present invention.

Referring to FIG. 3, the test probe may be connected to a digital probe inspection apparatus in which standard data of a reference probe is stored in a memory unit to determine whether the test probe is normal.

After connecting the test probe to the digital inspection apparatus (S300), and pressing the measurement button of the input unit (S302), the standard data of the same type as the test probe is searched among the standard data of the reference probe stored in the memory unit (S304). do.

The set value of the retrieved standard data is output as a reference signal S1 through a control unit S306, and the reference signal S1 is transmitted to an analog multiplexer through a digital-to-analog converter.

Then, the carrier is applied to the test probe through the path of the termination resistance value selected by the analog multiplexer, and the carrier signal, that is, the measurement signal S2 is measured at the same time (S310). In this case, the standard data may be output through the output unit (S308).

In the measuring step S310, the measuring signal S2 may be measured while the reference signal S1 reaches N periods, thereby obtaining N measured values during one period. .

In the calculating of the measured average value and the error rate (S312), the measured phase difference average value and the measured phase difference error rate, the measured magnitude difference average value, and the measured magnitude difference during one period of the measured signal S2 and the reference signal S1 measured above The error rate can be calculated. In addition, the measured value (measurement data) may be output through the output unit (S314).

Determining whether the test probe is abnormal (S316) compares the phase difference error rate of the reference probe stored in the memory unit with the measurement phase difference error rate calculated in step S312, and the measured magnitude difference error rate calculated in step S312 The size difference tolerance rate of the reference probe stored in the memory unit may be compared to determine whether or not the probe is abnormal.

At this time, if the allowable error rate of the reference probe is larger than the measurement error rate of the test probe, it is determined that the probe is operating normally, and outputs a normal message to the output unit (S318). An abnormal message is outputted (S320).

For the names of the standard data and the measurement data of FIGS. 2 and 3, reference may be made to the following table.

As described above, it has been described with reference to a preferred embodiment of the present invention, but those skilled in the art various modifications and changes of the present invention without departing from the spirit and scope of the invention described in the claims below I can understand that you can.

1 is a block diagram showing a digital probe inspection device according to an embodiment of the present invention.

2 is a flowchart illustrating standard data setting according to an embodiment of the present invention.

Figure 3 is a flow chart showing a digital probe test method according to an embodiment of the present invention.

             <Explanation of symbols for the main parts of the drawings>

100: input unit 110: memory unit

120: analog multiplexer 130: control unit

140: digital to analog converter 150: analog to digital converter

160: output unit 170: communication unit

Claims (6)

An input unit to which a standard data set value of a reference probe and an execution command of a test probe are input; A memory unit configured to store standard data of the reference probe as a group according to the reference probe type and to store each group; A plurality of resistors are selectively connected, and the phase signal and magnitude difference of the measured signal measured by applying the reference signal and the reference signal generated by the standard data set value of the reference probe to the reference probe or the test probe is adjusted. Analog multiplexer; A control unit controlling the input unit, the memory unit, and the analog multiplexer, and determining whether or not the probe is abnormal; A digital analog converter converting the reference signal formed by the controller into an analog signal and applying the analog signal to the analog multiplexer; An analog-digital converter connected to a termination resistor of the analog multiplexer and converting the measured signal into a digital signal and transmitting the converted digital signal to the controller; And And an output unit connected to the controller and configured to display standard data of the reference probe and measurement data of the test probe. The apparatus of claim 1, further comprising an external terminal for monitoring the reference signal, the measurement signal, the standard data, and the measurement data in real time, and a communication unit connecting the control unit. The apparatus of claim 1, wherein the input unit includes a measurement, execution, movement, setting, and number input button. The method of claim 1, wherein the standard data of the reference probe is A standard setting value including a type of probe input by a user, a magnitude and frequency of a reference signal, a resistance value used, a measurement period, a phase difference tolerance rate, and a magnitude difference tolerance rate; And And a standard measurement value including a standard phase difference average value and a standard magnitude difference average value measured from the reference probe. The method of claim 4, wherein the standard phase difference average value and the standard magnitude difference average value are: And an average value of the phase difference and the magnitude difference using the N phase difference and the magnitude difference obtained by measuring the output signal of the reference probe for N periods. Connecting a reference probe to the digital probe inspection device of claim 1 and inputting a standard setting value through a setting button of an input unit; Generating a reference signal through the standard setting value, and calculating the standard output value from the output signal which is generated by applying the generated reference signal to the reference probe; Storing standard data consisting of the standard setting value and the standard output value in a memory unit; Removing the reference probe, removing the test probe, and inputting a measurement button of an input unit; And And comparing the data measured by the test probe with the standard data to determine whether the probe is normal.

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