KR100897495B1 - Novel gallium amino-alkoxide complexes and process for preparing thereof - Google Patents
Novel gallium amino-alkoxide complexes and process for preparing thereof Download PDFInfo
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- 229910052733 gallium Inorganic materials 0.000 title claims abstract description 35
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 title claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 title claims description 6
- 150000001875 compounds Chemical class 0.000 claims abstract description 35
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 26
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 claims abstract description 17
- 229910001195 gallium oxide Inorganic materials 0.000 claims abstract description 16
- 239000002243 precursor Substances 0.000 claims abstract description 13
- 239000001257 hydrogen Substances 0.000 claims abstract description 11
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 11
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 9
- 125000005103 alkyl silyl group Chemical group 0.000 claims abstract description 9
- 238000000231 atomic layer deposition Methods 0.000 claims abstract description 8
- 125000002947 alkylene group Chemical group 0.000 claims abstract description 7
- 150000002259 gallium compounds Chemical class 0.000 claims abstract description 6
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 claims abstract description 4
- 238000005229 chemical vapour deposition Methods 0.000 claims abstract description 3
- -1 gallium amino alkoxide compound Chemical class 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 12
- 229910052783 alkali metal Inorganic materials 0.000 claims description 3
- 229910052801 chlorine Inorganic materials 0.000 claims description 3
- 150000002431 hydrogen Chemical class 0.000 claims description 2
- 229910052744 lithium Inorganic materials 0.000 claims description 2
- 229910052700 potassium Inorganic materials 0.000 claims description 2
- 229910052708 sodium Inorganic materials 0.000 claims description 2
- 239000010409 thin film Substances 0.000 abstract description 8
- 239000000463 material Substances 0.000 abstract description 5
- 239000007787 solid Substances 0.000 abstract description 5
- 238000002360 preparation method Methods 0.000 abstract description 3
- 125000002524 organometallic group Chemical group 0.000 abstract description 2
- 229910000807 Ga alloy Inorganic materials 0.000 abstract 1
- 239000002994 raw material Substances 0.000 abstract 1
- 238000000427 thin-film deposition Methods 0.000 abstract 1
- XRIBIDPMFSLGFS-UHFFFAOYSA-N 2-(dimethylamino)-2-methylpropan-1-ol Chemical compound CN(C)C(C)(C)CO XRIBIDPMFSLGFS-UHFFFAOYSA-N 0.000 description 10
- 238000005481 NMR spectroscopy Methods 0.000 description 9
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 238000004455 differential thermal analysis Methods 0.000 description 8
- 238000002411 thermogravimetry Methods 0.000 description 8
- 229910005191 Ga 2 O 3 Inorganic materials 0.000 description 7
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 6
- 239000003446 ligand Substances 0.000 description 6
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 6
- 239000003960 organic solvent Substances 0.000 description 6
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 5
- 239000011737 fluorine Substances 0.000 description 5
- 229910052731 fluorine Inorganic materials 0.000 description 5
- 239000001301 oxygen Substances 0.000 description 5
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 150000004703 alkoxides Chemical class 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000000460 chlorine Substances 0.000 description 3
- 238000000921 elemental analysis Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 238000003786 synthesis reaction Methods 0.000 description 3
- 238000005160 1H NMR spectroscopy Methods 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 125000003368 amide group Chemical group 0.000 description 2
- 150000001721 carbon Chemical group 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000002086 nanomaterial Substances 0.000 description 2
- 238000010992 reflux Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 125000000026 trimethylsilyl group Chemical group [H]C([H])([H])[Si]([*])(C([H])([H])[H])C([H])([H])[H] 0.000 description 2
- XTYRIICDYQTTTC-UHFFFAOYSA-N 1-(dimethylamino)-2-methylpropan-2-ol Chemical compound CN(C)CC(C)(C)O XTYRIICDYQTTTC-UHFFFAOYSA-N 0.000 description 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 150000001447 alkali salts Chemical class 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- XGIUDIMNNMKGDE-UHFFFAOYSA-N bis(trimethylsilyl)azanide Chemical compound C[Si](C)(C)[N-][Si](C)(C)C XGIUDIMNNMKGDE-UHFFFAOYSA-N 0.000 description 1
- 238000001460 carbon-13 nuclear magnetic resonance spectrum Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- XOYLJNJLGBYDTH-UHFFFAOYSA-M chlorogallium Chemical compound [Ga]Cl XOYLJNJLGBYDTH-UHFFFAOYSA-M 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- WXXZSFJVAMRMPV-UHFFFAOYSA-K gallium(iii) fluoride Chemical compound F[Ga](F)F WXXZSFJVAMRMPV-UHFFFAOYSA-K 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 230000009878 intermolecular interaction Effects 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 239000000615 nonconductor Substances 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000001954 sterilising effect Effects 0.000 description 1
- 238000004659 sterilization and disinfection Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000003039 volatile agent Substances 0.000 description 1
- 230000004580 weight loss Effects 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic Table
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
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Abstract
본 발명은 하기 화학식 1로 표시되는 신규의 갈륨 아미노알콕사이드 화합물 및 그 제조방법에 관한 것이다.The present invention relates to a novel gallium aminoalkoxide compound represented by the following formula (1) and a preparation method thereof.
[화학식 1][Formula 1]
[상기 화학식 1에서, A는 C2-C5의 알킬렌이고, 상기 A는 하나 이상의 C1-C5의 선형 또는 분지형 알킬기로 더 치환될 수 있고; R1 및 R2는 서로 독립적으로 수소 또는 C1-C5의 선형 또는 분지형 알킬기이고; R3는 C1-C5의 선형 또는 분지형 알킬기 또는 트리(C1-C5)알킬실릴기이다.][In Formula 1, A is alkylene of C 2 -C 5 , wherein A may be further substituted with one or more C 1 -C 5 linear or branched alkyl groups; R 1 and R 2 are independently of each other hydrogen or a C 1 -C 5 linear or branched alkyl group; R 3 is a C 1 -C 5 linear or branched alkyl group or a tri (C 1 -C 5 ) alkylsilyl group.]
본 발명에 따르는 갈륨 화합물은 갈륨 또는 산화 갈륨의 선구 물질로서 상온에서 고체 상태로 존재하며 낮은 온도에서 승화되는 특성을 나타냄으로 갈륨을 포함하는 물질의 박막 증착 또는 여러 가지 합금 제조에 갈륨 원료 물질로 유용하게 사용될 수 있다.The gallium compound according to the present invention is a precursor of gallium or gallium oxide, which is present in the solid state at room temperature and sublimes at low temperature, and thus is useful as a gallium raw material for thin film deposition or preparation of various alloys of gallium-containing materials. Can be used.
갈륨, 갈륨 산화물 선구물질, 갈륨 산화물, 박막, 유기금속 화학기상 증착법(MOCVD), 원자층 증착법(ALD) Gallium, gallium oxide precursors, gallium oxide, thin films, organometallic chemical vapor deposition (MOCVD), atomic layer deposition (ALD)
Description
본 발명은 신규한 갈륨 3가의 아미노알콕사이드 화합물에 관한 것으로서, 보다 상세하게는 갈륨을 포함하는 물질을 제조하는데 선구 물질로서 유용한 갈륨 아미노알콕사이드 화합물 및 그 제조 방법에 관한 것이다.The present invention relates to a novel gallium trivalent aminoalkoxide compound, and more particularly, to a gallium aminoalkoxide compound useful as a precursor for preparing a material containing gallium and a method for producing the same.
갈륨 옥사이드(Ga2O3)는 가스 센서(gas sensors), 투과성 전도체( transparent conductor), 형광체(phosphor) 등에 대한 새로운 물질로서 관심을 받고 있으며 넓은 밴드 갭 화합물(wide band gap compound, 4.8 eV)로써 다른 화합물의 첨가에 의해 산소가 약간 부족한 상태에서는 n-타입 반도체(n-type semiconductor)가 된다. 또한 Ga2O3는 상온에서는 전기 절연체(electrical insulator)이고, 화학적, 열적으로 안정한 단사결정계 형태(monoclinic form)를 갖는 500 ℃ 이상의 온도에서는 반도체(semiconducting)이다. 900 ℃ 이상에서는 산소의 농도에 의존해 전기 전도성이 변하기 때문에 산소의 농도(oxygen concentration)를 검출할 수 있다. 900 ℃ 이하에서는 에탄올과 같은 가스를 줄이 기 위한 표면 조절 형태의 센서(surface-control-type sensor)로 작용한다. 그러므로 온도에 따른 가스 센서(gas sensor)로 이용할 수 있다. (J. S. Kim, S. B. Lee, J. H. Bahng, J. C. Choi, H. L. Park, S. I. Mho, T. W. Kim, Y. H. Whang, G. C. Kim, Phys . Stat . Sol . , 2001, 187, 569; S. Basharat, C. J. Carmalt, S. J. King, E. S. Peters, D. A. Tocher, Dalton Trans ., 2004, 3475; R. Binions, C. J. Carmalt, I. P. Parkin, K. F. E. Pratt, G. A. Shaw, Chem . Mater ., 2004, 16, 2489 ). 그리고 β-Ga2O3와 비결정성(amorphous) Ga2O3는 박막 전기 발광 소자(thin-film electroluminescent (TFEL) devices)에서의 새로운 형광 임자(phosphor host) 물질로서 집중을 받고 있다. 또한 Ga2O3:Mn, Ga2O3:Cr, Ga2O3:Eu는 박막 방출 층(thin-film emitting layer)과 두꺼운 세라믹 절연층(thick ceramic insulating layer)에서 높은 발광 다색 방출(high luminescence multicolor emissions)이 관찰되었다. (T. Miyata, T. Nakatani, T. Minami, Thin Solid Films, 2000, 373, 145; T. Minami, H. Yamada, Y. Kubota, T. Miyata, Jpn. J. Appl . Phys ., 1997, 31, L1191; T. Xiao, A. H. Kitai, G. Liu, A. Nakua, J. Barbier, Appl . Phys . Lett ., 1998, 72, 3356) 또한 전사법(lithography), 표면 개질(surface modification), 음이온 발생 (anion generation), 멸균 등의 목적으로 자외선 이용이 증가되고 있는데, 넓은 영역의 자외선 광학(deep UV optics)과 융화할 수 있는 물질의 중요성 또한 증대되고 있다. 이러한 관점에서 주석(tin)이 도핑된 β-Ga2O3 막은 넓은 영역의자외선 빛을 투과함과 동시에 전기전도성을 나타내는 독특한 산화물 막(oxide film)이라고 할 수 있다.(M. Orita, H. Hiramatsu, H. Ohta, M. Hirano, H. Hosono, Thin Solid Films, 2002, 411, 134; M. Orita, H. Hirano, H. Hosono, Appl . Phys . Lett ., 2000, 77, 4166).Gallium oxide (Ga 2 O 3 ) is attracting attention as a new material for gas sensors, transparent conductors, phosphors, etc., and as a wide band gap compound (4.8 eV) In the state where oxygen is slightly deficient by addition of another compound, it becomes an n-type semiconductor. Ga 2 O 3 is an electrical insulator at room temperature and a semiconductor at temperatures above 500 ° C. having a chemically and thermally stable monoclinic form. Above 900 ° C, since the electrical conductivity changes depending on the concentration of oxygen, the oxygen concentration can be detected. Below 900 ° C it acts as a surface-control-type sensor to reduce gases such as ethanol. Therefore, it can be used as a gas sensor according to temperature. . (JS Kim, SB Lee, JH Bahng, JC Choi, HL Park, SI Mho, TW Kim, YH Whang, GC Kim, Phys Stat Sol, 2001, 187, 569;.. S. Basharat, CJ Carmalt, SJ King , ES Peters, DA Tocher, Dalton Trans . , 2004 , 3475; R. Binions, CJ Carmalt, IP Parkin, KFE Pratt, GA Shaw, Chem . Mater . , 2004 , 16, 2489). In addition, β-Ga 2 O 3 and amorphous Ga 2 O 3 are being concentrated as new phosphor host materials in thin-film electroluminescent (TFEL) devices. In addition, Ga 2 O 3 : Mn, Ga 2 O 3 : Cr, Ga 2 O 3 : Eu is a high emission multicolor emission in a thin-film emitting layer and a thick ceramic insulating layer luminescence multicolor emissions) were observed. (T. Miyata, T. Nakatani, T. Minami, Thin Solid Films , 2000 , 373, 145; T. Minami, H. Yamada, Y. Kubota, T. Miyata, Jpn. J. Appl . Phys . , 1997 , 31, L1191; T. Xiao, AH Kitai, G. Liu, A. Nakua, J. Barbier, Appl . Phys . Lett . , 1998 , 72, 3356) In addition, the use of ultraviolet light for the purposes of lithography, surface modification, anion generation, sterilization, etc., is increasing. The importance of materials that are compatible with each other is also increasing. In this respect, the tin-doped β-Ga 2 O 3 film is a unique oxide film that transmits a wide range of ultraviolet light and exhibits electrical conductivity. (M. Orita, H. Hiramatsu, H. Ohta, M. Hirano, H. Hosono, Thin Solid Films , 2002 , 411, 134; M. Orita, H. Hirano, H. Hosono, Appl . Phys . Lett . , 2000 , 77, 4166).
산화 갈륨 증착에 사용되고 있는 선구 물질로는 [Ga(hfac)]3 (hfac = hexafluoroacetoacetonate), [Ga(OCH(CF3)2)3(HNMe2)]등과 같은 불소(fluorine)를 포함하는 화합물과 [Ga(OBut)3]2, [Ga(OPri)3]4, [Ga(OCMe2Et)3]2 등의 갈륨 알콕사이드가 알려져 있다. 그러나 위에서 언급된 화합물들은 박막 증착 시 불소에 의해 불화갈륨(GaF3)이 형성되어 박막에 오염을 일으키며 알콕사이드 형태의 화합물은 단위체가 아니기 때문에 휘발성이 좋지 않은 단점을 가지고 있다. (G. A. Battiston, R. Gerbasi, M. Porchia, R. Bertoncello, F. Caccavale, Thin Solid Films, 1996, 279,115; L. Miinea, S. Suh, S. G. Bott, J.-R. Liu, W.-K. Chu, D. M. Hoffmam, J. Mater . Chem ., 1999, 9, 929; M. Valet, D. M. Hoffman, Chem . mater ., 2001, 13, 2135)Precursors used for gallium oxide deposition include compounds containing fluorine such as [Ga (hfac)] 3 (hfac = hexafluoroacetoacetonate), [Ga (OCH (CF 3 ) 2 ) 3 (HNMe 2 )], and the like. Gallium alkoxides such as [Ga (OBu t ) 3 ] 2 , [Ga (OPr i ) 3 ] 4 , and [Ga (OCMe 2 Et) 3 ] 2 are known. However, the above-mentioned compounds have a disadvantage in that gallium fluoride (GaF 3 ) is formed by fluorine when the thin film is deposited to contaminate the thin film, and the alkoxide type compound is not a unit, and thus has a poor volatility. (GA Battiston, R. Gerbasi, M. Porchia, R. Bertoncello, F. Caccavale, Thin Solid Films , 1996 , 279, 115; L. Miinea, S. Suh, SG Bott, J.-R. Liu, W.-K. Chu, DM Hoffmam, J. Mater . Chem . , 1999 , 9, 929; M. Valet, DM Hoffman, Chem . mater . , 2001 , 13, 2135)
일반적으로 박막이나 나노 물질용 선구 물질을 고안하고 합성하기 위하여 높은 휘발성을 갖는 화합물의 합성이 가장 중요한 문제가 되고 있는데 단순한 알콕사이드 리간드 대신에 두자리 리간드를 사용하여 금속의 배위 자리를 포화시키는 방법이 알려져 있으며 또한 두자리 리간드 중에서도 아미노알콕사이드 계통이 알콕시알콕사이드보다 더 유용하다고 알려져 있다 (L. G. Hubert-Pfalzgraf, H. Guillon, Appl . Organomet. Chem ., 1998, 12, 221). In general, the synthesis of compounds having high volatility is the most important problem for designing and synthesizing precursors for thin films or nanomaterials, and a method of saturating the coordination sites of metals using a bidentate ligand instead of a simple alkoxide ligand is known. Among the bidentate ligands, aminoalkoxide strains are known to be more useful than alkoxyalkoxides (LG Hubert-Pfalzgraf, H. Guillon, Appl . Organomet. Chem ., 1998 , 12 , 221).
이상과 같이 종래에 알려진 갈륨 3가 화합물은 충분하지 못한 휘발성, 제조된 막에 생기는 불소(fluorine) 오염 등의 문제점을 가지고 있다. 따라서 산화갈륨 박막의 제조를 위한 선구 물질로서 화합물 자체에 불소를 포함하지 않으면서 높은 휘발성을 나타내는 갈륨 3가 화합물 및 나노 물질의 용이한 합성을 위해 유기 용매에 용해도가 좋으며 낮은 온도에서도 분해될 수 있는 갈륨 3가 화합물의 개발은 그 의미가 상당히 크다고 할 수 있다.As described above, the gallium trivalent compound known in the art has problems such as insufficient volatility and fluorine contamination generated in the manufactured film. Therefore, for the easy synthesis of gallium trivalent compounds and nanomaterials having high volatility without containing fluorine in the compound itself as a precursor for the production of gallium oxide thin film, it is well soluble in organic solvents and can be decomposed at low temperatures. The development of gallium trivalent compounds is quite significant.
본 발명은 상기한 종래의 문제점을 해결하고자 안출된 것으로서, 본 발명의 목적은 열적으로 안정하면서 휘발성이 매우 높으며 낮은 온도에서 순수한 산화갈륨의 제조가 가능한, 불소나 염소를 포함하지 않는 아미노알콕사이드를 포함하는 갈륨 화합물 및 그 제조 방법을 제공하는 것이다.The present invention has been made to solve the above-mentioned problems, the object of the present invention is a thermally stable, highly volatile and capable of producing pure gallium oxide at low temperature, it does not contain fluorine or chlorine-containing amino alkoxide It is to provide a gallium compound and a method for producing the same.
본 발명은 열적으로 안정하면서 휘발성이 매우 높으며 낮은 온도에서 순수한 산화갈륨의 제조가 가능한 신규의 갈륨 아미노알콕사이드 화합물에 관한 것으로, 하기 화학식 1로 표시되는 갈륨 아미노알콕사이드 화합물을 제공한다.The present invention relates to a novel gallium aminoalkoxide compound which is thermally stable, highly volatile and capable of producing pure gallium oxide at low temperature, and provides a gallium aminoalkoxide compound represented by the following Chemical Formula 1.
[화학식 1][Formula 1]
[상기 화학식 1에서, A는 C2-C5의 알킬렌이고, 상기 A는 하나 이상의 C1-C5의 선형 또는 분지형 알킬기로 더 치환될 수 있고; R1 및 R2는 서로 독립적으로 수소 또는 C1-C5의 선형 또는 분지형 알킬기이고; R3는 C1-C5의 선형 또는 분지형 알킬기 또는 트리(C1-C5)알킬실릴기이다.][In Formula 1, A is alkylene of C 2 -C 5 , wherein A may be further substituted with one or more C 1 -C 5 linear or branched alkyl groups; R 1 and R 2 are independently of each other hydrogen or a C 1 -C 5 linear or branched alkyl group; R 3 is a C 1 -C 5 linear or branched alkyl group or a tri (C 1 -C 5 ) alkylsilyl group.]
더 상세하게는 상기 화학식 1의 갈륨 아미노알콕사이드 화합물은 하기 화학식 2로 표시되는 갈륨 아미노알콕사이드 화합물을 포함한다.More specifically, the gallium aminoalkoxide compound of Formula 1 includes a gallium aminoalkoxide compound represented by Formula 2 below.
[화학식 2][Formula 2]
[상기 화학식 2에서, R1, R2, R4 및 R5는 서로 독립적으로 수소 또는 C1-C5의 선형 또는 분지형 알킬기이고; R3는 C1-C5의 선형 또는 분지형 알킬기 또는 트리(C1-C5)알킬실릴기이고; m은 1 내지 3의 정수이다.][In
보다 바람직하게는 상기 화학식 2에서 m이 1 또는 2인 갈륨 아미노알콕사이드 화합물이 바람직하며, 구체적으로는 상기 화학식 2에서 R1, R2, R4 및 R5는 서로 독립적으로 수소, CH3, C2H5, CH(CH3)2 및 C(CH3)3로부터 선택되며, R3는 CH3, C2H5, CH(CH3)2, C(CH3)3, Si(CH3)3, Si(C2H5)3 또는 Si(CH3)2(C2H5)로부터 선택되는 갈륨 아미노알콕사이드 화합물이 예시된다.More preferably, a gallium aminoalkoxide compound having m of 1 or 2 in
이하, 본 발명을 더욱 상세히 설명한다.Hereinafter, the present invention will be described in more detail.
본 발명에 따른 상기 화학식 1로 표시되는 갈륨 아미노알콕사이드 화합물은 출발 물질로서 하기 화학식 3으로 표시되는 갈륨 화합물과 화학식 4로 표시되는 알칼리 금속염을 유기 용매에서 반응시켜 하기 화학식 5로 표시되는 화합물을 얻고, 얻어진 화학식 5의 화합물과 화학식 6의 디알킬아미드 또는 비스트리알킬실릴아미드의 알칼리염을 유기 용매에서 환류시켜 제조할 수 있으며, 상기 화학식 1의 갈륨 아미노알콕사이드 화합물을 제조하기 위한 반응식은 하기 반응식 1로 나타낼 수 있다.The gallium amino alkoxide compound represented by Formula 1 according to the present invention is a gallium compound represented by the following formula (3) and the alkali metal salt represented by the formula (4) as a starting material to obtain a compound represented by the formula (5) by reacting in an organic solvent, The obtained compound of formula (5) and the alkali salt of dialkylamide or bistrialkylsilylamide of formula (6) can be prepared by reflux in an organic solvent, the reaction scheme for preparing a gallium amino alkoxide compound of formula (1) is shown in Scheme 1 Can be represented.
[화학식 1][Formula 1]
[화학식 3][Formula 3]
[화학식 4][Formula 4]
[화학식 5][Formula 5]
[화학식 6][Formula 6]
[상기 화학식 1, 화학식 3 내지 6에서, A는 C2-C5의 알킬렌이고, 상기 A는 하나 이상의 C1-C5의 선형 또는 분지형 알킬기로 더 치환될 수 있고; R1 및 R2는 서로 독립적으로 수소 또는 C1-C5의 선형 또는 분지형 알킬기이고; R3는 C1-C5의 선형 또는 분지형 알킬기 또는 트리(C1-C5)알킬실릴기이며; M은 Li, Na 또는 K이며; X는 Cl, Br 또는 I이다.][In Formula 1, Formulas 3 to 6, A is alkylene of C 2 -C 5 , wherein A may be further substituted with one or more C 1 -C 5 linear or branched alkyl groups; R 1 and R 2 are independently of each other hydrogen or a C 1 -C 5 linear or branched alkyl group; R 3 is a C 1 -C 5 linear or branched alkyl group or a tri (C 1 -C 5 ) alkylsilyl group; M is Li, Na or K; X is Cl, Br or I.]
[반응식 1]Scheme 1
본 발명의 갈륨 화합물 를 제조하는 다른 방법으로 하기 화학식 7로 표시되는 갈륨 아미드 화합물과 화학식 8로 표시되는 아미노알코올 화합물 2 당량을 반응시키는 방법이 있다. 이에 대한 반응식을 하기 반응식 2로 나타낼 수 있다.Gallium Compounds of the Invention As another method of preparing a method, there is a method of reacting a gallium amide compound represented by Formula 7 with 2 equivalents of an aminoalcohol compound represented by Formula 8. Scheme for this can be represented by the following
[화학식 1][Formula 1]
[화학식 7][Formula 7]
[화학식 8][Formula 8]
[상기 화학식 1, 화학식 7 및 화학식 8에서, A는 C2-C5의 알킬렌이고, 상기 A는 하나 이상의 C1-C5의 선형 또는 분지형 알킬기로 더 치환될 수 있고; R1 및 R2는 서로 독립적으로 수소 또는 C1-C5의 선형 또는 분지형 알킬기이고; R3는 C1-C5의 선형 또는 분지형 알킬기 또는 트리(C1-C5)알킬실릴기이다.][In
[반응식 2]
상기 화학식 1의 신규한 갈륨 산화물 선구 물질인 갈륨 아미노알콕사이드 화합물 는 안정한 착화합물이고, 금속과 결합하는 알콕사이드의 산소에 대하여 α-탄소 위치에 비극성 알킬기가 결합해 있어 유기 용매에 대한 친화성이 높고, 중심 금속이 이웃한 리간드의 산소와 분자간 상호 작용을 일으키지 못하도록 입체 장애를 주기 때문에 단위체로 존재할 수 있다. 이러한 구조적 특성으로 인하여 상기 화학식 1의 갈륨 산화물용 선구 물질은 상온에서 안정한 고체로서 유기 용매, 예를 들면 벤젠, 테트라하이드로퓨란, 톨루엔, 클로로포름 등에 대한 용해도가 높고, 휘발성이 뛰어날 뿐만 아니라, 할로겐 원소를 포함하지 않기 때문에, 이들을 사용하여 질이 더 좋은 갈륨 산화물 박막을 얻을 수 있다.Gallium aminoalkoxide compound that is a novel gallium oxide precursor of Formula 1 Is a stable complex, has a non-polar alkyl group bonded to the α -carbon position with respect to the oxygen of the alkoxide which binds to the metal, and thus has high affinity for the organic solvent, and is steric such that the central metal does not cause intermolecular interaction with the oxygen of the neighboring ligand. It can be present as a monomer because of its disability. Due to these structural characteristics, the precursor for gallium oxide of Formula 1 is a stable solid at room temperature, has high solubility in organic solvents such as benzene, tetrahydrofuran, toluene, chloroform, and the like, and is highly volatile. Since it does not contain, a gallium oxide thin film of higher quality can be obtained by using these.
본 발명에서 합성한 갈륨 아미노알콕사이드 화합물의 열적 안정성, 휘발성 및 분해 온도를 열중량 분석 및 시차 열분석(thermogravimetric analysis/differential thermal analysis, TGA/DTA)을 이용하여 조사하였다. 도 4에서 나타낸 바와 같이 220 ℃-295 ℃ 부근에서 급격한 무게 감소가 일어나는 것을 확인하였다. 또한 단일 step을 나타내고 있으며 잔류량은 4.05%이다.The thermal stability, volatility and decomposition temperature of the gallium aminoalkoxide compounds synthesized in the present invention were investigated using thermogravimetric analysis / differential thermal analysis (TGA / DTA). As shown in Figure 4 it was confirmed that a sharp weight loss occurs in the vicinity of 220 ℃ -295 ℃. It also shows a single step and the residual amount is 4.05%.
이와 같은 결과로서 본 발명에서 합성한 갈륨 산화물 선구 물질인 갈륨 아미노알콕사이드 화합물(화학식 1)은 분해 온도 이전에 충분한 휘발성을 보일 뿐만 아니라 유기 용매에 대해 용해도가 높기 때문에 반도체 제조 공정에 널리 이용하는 유기금속 화학기상 증착법(MOCVD) 공정 또는 원자층 증착법(ALD)에 바람직하게 적용할 수 있다.As a result, the gallium amino alkoxide compound (Formula 1), which is a gallium oxide precursor synthesized in the present invention, exhibits sufficient volatility before decomposition temperature and has high solubility in organic solvents. It is preferably applicable to a vapor deposition method (MOCVD) process or an atomic layer deposition method (ALD).
본 발명에 따른 갈륨 산화물 선구 물질은 갈륨 산화물의 제조에 유리하도록 산소 원자 리간드와 결합하고 있고, 휘발성을 개선시켜줄 알킬아미드가 결합되어있음으로써 열안정성 및 휘발성이 우수할 뿐만 아니라, 보관이 유리하여 특히 질이 우수한 산화막을 제조해야 하는 유기금속 화학기상 증착법(MOCVD)이나 원자층 증착법(ALD)용의 새로운 리간드를 갖는 갈륨 선구 물질로서 유용하게 사용할 수 있다.The gallium oxide precursor according to the present invention binds to an oxygen atom ligand to favor the preparation of gallium oxide, and has an excellent thermal stability and volatility as well as an excellent storage stability due to the combination of an alkylamide which improves volatility. It can be usefully used as a gallium precursor having a novel ligand for organometallic chemical vapor deposition (MOCVD) or atomic layer deposition (ALD), which requires the production of an excellent oxide film.
본 발명은 하기의 실시예에 의하여 더 잘 이해할 수 있으며, 하기의 실시예는 본 발명의 예시 목적을 위한 것이며 첨부한 특허 청구 범위에 의하여 한정되는 보호 범위를 제한하고자 하는 것은 아니다.The invention is better understood by the following examples, which are intended for purposes of illustration of the invention and are not intended to limit the scope of protection defined by the appended claims.
[[ 실시예Example ]]
모든 실험은 장갑 상자 또는 슐렝크 관(Schlenk line)을 이용하여 비활성 아르곤 또는 질소 분위기에서 수행하였다. 반응 생성물의 구조는 양성자 핵자기 공명 분광법(1H NMR), 탄소 원자 핵자기 공명 분광법(13C NMR), 푸리에 변환 적외선 분광(FT-IR) 분석 및 원소 분석법 (elemental analysis, EA) 및 열무게 분석법/시차 열분석법(thermogravimetric analysis/differential thermal analysis, TGA/DTA)을 이용하여 분석하였다. All experiments were performed in an inert argon or nitrogen atmosphere using a glove box or Schlenk line. The structure of the reaction product is characterized by proton nuclear magnetic resonance spectroscopy ( 1 H NMR), carbon atom nuclear magnetic resonance spectroscopy ( 13 C NMR), Fourier transform infrared spectroscopy (FT-IR) analysis and elemental analysis (EA) and thermal weight Analyzes were performed using thermogravimetric analysis / differential thermal analysis (TGA / DTA).
[[ 실시예Example 1] {비스[1-디메틸아미노-2- 1] {bis [1-dimethylamino-2- 메틸methyl -2--2- 프로폭시Propoxy ][] [ 비스Vis (( 트리메틸실릴Trimethylsilyl ) 아미도]}갈륨 [Ga() Amido]} Gallium [Ga ( dmampdmamp )) 22 (btsa)]의 합성 I(btsa)] Synthesis I
헥산 (50 mL)이 들어 있는 125 mL 슐렝크 플라스크에 Na(dmamp) 2.8 g (20 mmol)을 넣고 여기에 GaCl3 1.76 g (10 mmol)을 헥산 (30 mL)에 녹여 첨가해 주었다. 이 혼합 용액을 하루 동안 환류하고, 용액을 여과한 후 감압 하에서 용매를 제거하였다. 얻어진 고체를 승화하여(74 ℃/10-2torr) 화학식 5로 나타낸 바와 같이 두 개의 알콕사이드와 하나의 할라이드가 결합한 갈륨 화합물을 흰색 고체로 얻었다. 얻어진 화합물 Ga(dmamp)2Cl 2 g (5.92 mmol)과 Li(btsa) (btsa =비스(트리메틸실릴)아미드) 1 g ( 5.92 mmol)을 125 mL 슐렝크 플라스크에 넣고 toluene (100 mL)을 첨가하여 24시간 동안 환류하였다. 혼합물을 여과하고 감압 하에서 용매를 제거한 후 승화하여(64 ℃/10-2 torr) 표제화합물 Ga(dmamp)2(btsa)를 흰색 고체로 얻었다(2.27 g, 수율 83%).2.8 g (20 mmol) of Na (dmamp) was added to a 125 mL Schlenk flask containing hexane (50 mL), and 1.76 g (10 mmol) of GaCl 3 was added to hexane (30 mL). This mixed solution was refluxed for one day, the solution was filtered and the solvent was removed under reduced pressure. The obtained solid was sublimed (74 ° C./10 −2 torr) to obtain a gallium compound in which two alkoxides and one halide were bonded to each other, as represented by the formula (5). 2 g (5.92 mmol) of compound Ga (dmamp) 2 Cl (5.92 mmol) and 1 g (5.92 mmol) of Li (btsa) (btsa = bis (trimethylsilyl) amide) were added to a 125 mL Schlenk flask and toluene (100 mL) was added. To reflux for 24 hours. The mixture was filtered, the solvent was removed under reduced pressure, and then sublimed (64 ° C./10 −2 torr) to give the title compound Ga (dmamp) 2 (btsa) as a white solid (2.27 g, yield 83%).
1H NMR (C6D6, 300.13MHz): 0.47, (s, 18H, Si(CH 3)3), 1.23, 1.27 (d, 12H, C(CH 3)2), 2.02, 1.98 (d, 2H, CH 2), 2.29 (s, 12H, N(CH 3)2), 2.25 (d, 2H,CH 2 ). 1 H NMR (C 6 D 6 , 300.13 MHz): 0.47, (s, 18H, Si (C H 3 ) 3 ), 1.23, 1.27 (d, 12H, C (C H 3 ) 2 ), 2.02, 1.98 ( d, 2H, C H 2 ), 2.29 (s, 12H, N (C H 3 ) 2 ), 2.25 (d, 2H, C H 2 ).
13C NMR (C6D6, 75.47MHz): 6.67, 32.6, 33.5, 49.1, 67.1, 68.8, 72.1 13 C NMR (C 6 D 6 , 75.47 MHz): 6.67, 32.6, 33.5, 49.1, 67.1, 68.8, 72.1
FT-IR (cm-1, KBr pellet): υ(Ga-O) 643FT-IR (cm -1 , KBr pellet): υ (Ga-O) 643
원소 분석 C18H46N3O2Si2Ga {Calcd. (Found)}: C, 46.75 (46.13); H, 10.03 (10.66); N, 9.01 (9.09).Elemental Analysis C 18 H 46 N 3 O 2 Si 2 Ga {Calcd. (Found)}: C, 46.75 (46.13); H, 10.03 (10.66); N, 9.01 (9.09).
[[ 실시예Example 2] {비스[1-디메틸아미노-2- 2] {bis [1-dimethylamino-2- 메틸methyl -2--2- 프로폭시Propoxy ][] [ 비스Vis (( 트리메틸실릴Trimethylsilyl ) 아미도]}갈륨 [) Amido]} Gallium [ GaGa (( dmampdmamp )) 22 (btsa)]의 합성 (btsa)] IIII
톨루엔 (100 mL)이 들어 있는 250 mL 슐렝크 플라스크에 Ga(btsa)3 11.02 g (20 mmol)을 넣는다. 반응 용액을 0 ℃로 낮추고 주사기를 이용하여 dmampH(1-디메틸아미노-2-메틸-2-프로판올) 4.69 g (40 mmol)을 천천히 넣는다. 반응물을 상온으로 올린 후 24시간 동안 교반하였다. 혼합물을 여과한 다음, 용액의 휘발성 물질을 감압 하에서 제거한 후 승화하여(64 ℃/10-2 torr) 화학식 1로 나타낸 바와 같은 화합물 Ga(dmamp)2(btsa)를 흰색 고체로 얻었다(7.60 g, 수율 75%).Add 11.02 g (20 mmol) of Ga (btsa) 3 to a 250 mL Schlenk flask containing toluene (100 mL). Lower the reaction solution to 0 ° C. and slowly add 4.69 g (40 mmol) of dmampH (1-dimethylamino-2-methyl-2-propanol) using a syringe. The reaction was raised to room temperature and stirred for 24 hours. The mixture was filtered, and then the volatiles of the solution were removed under reduced pressure and then sublimed (64 ° C./10 −2 torr) to give compound Ga (dmamp) 2 (btsa) as a white solid (7.60 g, Yield 75%).
상기 실시예 1에서 합성한 갈륨 산화물 선구 물질의 양성자 핵자기 공명 분광분(1H NMR)분석 결과를 도 1에, 탄소 원자 핵자기 공명 분광(13C NMR) 분석 결과를 도 2에, 푸리에 변환 적외선 분광 (FT-IR) 분석 결과를 도 3에, 열중량 분석 (TGA) 및 시차 열분석 (DTA) 결과를 도 4에 나타내었다.Proton nuclear magnetic resonance spectroscopy ( 1 H NMR) analysis results of the gallium oxide precursor synthesized in Example 1 shown in Figure 1, carbon atom nuclear magnetic resonance spectroscopy ( 13 C NMR) analysis results in Figure 2, Fourier transform Infrared spectroscopy (FT-IR) analysis results are shown in FIG. 3, and thermogravimetric analysis (TGA) and differential thermal analysis (DTA) results are shown in FIG. 4.
도 1은 실시예 1에서 제조한 Ga(dmamp)2(btsa) 화합물의 1H NMR 분석 결과이고, 1 is a result of 1 H NMR analysis of the Ga (dmamp) 2 (btsa) compound prepared in Example 1,
도 2는 실시예 1에서 제조한 Ga(dmamp)2(btsa) 화합물의 13C NMR 스펙트럼이고,FIG. 2 is Ga (dmamp) 2 (btsa) prepared in Example 1. FIG. 13 C NMR spectrum of a compound,
도 3은 실시예 1에서 제조한 Ga(dmamp)2(btsa) 화합물의 푸리에 변환 FT-IR 분석 결과이고, 3 is a Fourier transform FT-IR analysis result of the Ga (dmamp) 2 (btsa) compound prepared in Example 1,
도 4는 실시예 1에서 제조한 Ga(dmamp)2(btsa) 화합물의 열중량 분석(TGA) 및 시차 열분석 (DTA) 결과를 나타내는 그래프이다.Figure 4 is a graph showing the results of thermogravimetric analysis (TGA) and differential thermal analysis (DTA) of Ga (dmamp) 2 (btsa) compound prepared in Example 1.
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