KR100828972B1 - 웨이퍼 유무 판별 장치 - Google Patents
웨이퍼 유무 판별 장치 Download PDFInfo
- Publication number
- KR100828972B1 KR100828972B1 KR1020070002704A KR20070002704A KR100828972B1 KR 100828972 B1 KR100828972 B1 KR 100828972B1 KR 1020070002704 A KR1020070002704 A KR 1020070002704A KR 20070002704 A KR20070002704 A KR 20070002704A KR 100828972 B1 KR100828972 B1 KR 100828972B1
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- South Korea
- Prior art keywords
- wafer
- cassette
- camera
- images
- unit
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
170 : 핸드
Claims (4)
- 다수의 웨이퍼가 적재된 카세트 내의 웨이퍼 유무 판별 장치에 있어서,특정 파장대역의 빛을 제공하는 조명부;상기 조명부에 의해 제공되는 파장 대역의 빛에 대한 영상만을 통과시키는 필터가 장착되어 있는 카메라; 및상기 카메라로부터 상기 필터를 통과한 영상을 수신하고, 수신된 영상을 이미지 프로세싱한 후 분석하여 상기 카세트내의 슬롯들중에서 웨이퍼가 적재되어있는 슬롯들을 판별하는 중앙 처리부를 구비하고,상기 카메라는 상기 카세트 내에 적재된 웨이퍼를 이동시키는 로봇암에 장착되어 로봇암의 이동에 의해 이동하는 것을 특징으로 하며,상기 중앙 처리부는 상기 로봇암을 이동시키면서 다양한 위치와 다양한 각도에서의 상기 카세트의 개구부에 대한 다수 개의 영상을 획득하고, 상기 영상들을 분석하여 상기 카세트내의 슬롯들 중에서 웨이퍼가 적재되어 있는 슬롯들을 판별하고 판별 결과를 제공하는 것을 특징으로 하는 카세트 내의 웨이퍼 유무 판별 장치.
- 삭제
- 제1항에 있어서, 상기 웨이퍼 유무 판별 장치는 디스플레이부를 더 구비하고, 상기 중앙 처리부는 상기 영상들을 분석하여 웨이퍼가 적재되어 있는 슬롯에 대한 정보들을 추출하고, 추출된 정보들을 상기 디스플레이부에 출력시키는 것을 특징으로 하는 카세트 내의 웨이퍼 유무 판별 장치.
- 제1항에 있어서, 상기 웨이퍼 유무 판별 장치는 메모리부를 더 구비하고, 상기 중앙 처리부는 상기 영상들을 분석하여 웨이퍼가 적재되어 있는 슬롯에 대한 정보들을 추출하고, 추출된 정보들을 상기 메모리부에 저장시키는 것을 특징으로 하는 카세트 내의 웨이퍼 유무 판별 장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070002704A KR100828972B1 (ko) | 2007-01-10 | 2007-01-10 | 웨이퍼 유무 판별 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070002704A KR100828972B1 (ko) | 2007-01-10 | 2007-01-10 | 웨이퍼 유무 판별 장치 |
Publications (1)
Publication Number | Publication Date |
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KR100828972B1 true KR100828972B1 (ko) | 2008-05-13 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020070002704A KR100828972B1 (ko) | 2007-01-10 | 2007-01-10 | 웨이퍼 유무 판별 장치 |
Country Status (1)
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KR (1) | KR100828972B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114740017A (zh) * | 2021-01-07 | 2022-07-12 | 富泰华工业(深圳)有限公司 | 晶圆盒内晶圆摆放状态的检测方法及检测系统 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200248325Y1 (ko) * | 1997-03-20 | 2001-12-17 | 윤종용 | 카세트내의웨이퍼의유무판별장치 |
KR20040069853A (ko) * | 2003-01-30 | 2004-08-06 | 아남반도체 주식회사 | 반도체 웨이퍼 검사장비 및 검사방법 |
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2007
- 2007-01-10 KR KR1020070002704A patent/KR100828972B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR200248325Y1 (ko) * | 1997-03-20 | 2001-12-17 | 윤종용 | 카세트내의웨이퍼의유무판별장치 |
KR20040069853A (ko) * | 2003-01-30 | 2004-08-06 | 아남반도체 주식회사 | 반도체 웨이퍼 검사장비 및 검사방법 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114740017A (zh) * | 2021-01-07 | 2022-07-12 | 富泰华工业(深圳)有限公司 | 晶圆盒内晶圆摆放状态的检测方法及检测系统 |
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