KR100784154B1 - 반도체 및 lcd 제조장치의 고밀도 클러스터 툴 - Google Patents
반도체 및 lcd 제조장치의 고밀도 클러스터 툴 Download PDFInfo
- Publication number
- KR100784154B1 KR100784154B1 KR1020060033906A KR20060033906A KR100784154B1 KR 100784154 B1 KR100784154 B1 KR 100784154B1 KR 1020060033906 A KR1020060033906 A KR 1020060033906A KR 20060033906 A KR20060033906 A KR 20060033906A KR 100784154 B1 KR100784154 B1 KR 100784154B1
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- cluster
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- cluster tool
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/6719—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
Abstract
Description
Claims (4)
- 프로세스 모듈과 로드 락 챔버가 장착되고, 기판을 프로세스 모듈로 이송하고 소정의 프로세스 진행이 완료된 기판을 로드 락 챔버로 이송하기 위한 진공 클러스터 모듈을 구비하는 반도체 및 LCD 제조장치의 클러스터 툴에 있어서,상기 진공 클러스터 모듈은 평면상 비대칭 구조의 다면체 면으로 구성하되, 상기 다면체 면 중 적어도 한 면은 제1 및 제2 클러스터 툴이 횡으로 도킹될 수 있는 도킹 포지션 면이 되는 것을 특징으로 하는 반도체 및 LCD 제조장치의 고밀도 클러스터 툴.
- 삭제
- 평면상 비대칭 구조의 다면체 면으로 구성되는 진공 클러스터 모듈을 구비하는 2대의 제1 및 제2 클러스터 툴들이 상기 다면체 면 중 적어도 한 면을 상기 제1 및 제2 클러스터 툴의 도킹 포지션 면으로 이용하여 횡으로 도킹됨으로써 인접한 클러스터 툴들이 상호간에 대칭적으로 배치되는 것을 특징으로 하는 반도체 및 LCD 제조장치의 고밀도 클러스터 툴.
- 청구항 3에 있어서,상기 제1 및 제2 클러스터 툴들의 도킹 포지션을 기준으로 평면상 대칭 구조의 다면체 면으로 구성되는 진공 클러스터 모듈을 구비하는 제3 클러스터 툴이 상기 제1 및 제2 클러스터 툴과 도킹되는 것을 특징으로 하는 반도체 및 LCD 제조장치의 고밀도 클러스터 툴.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060033906A KR100784154B1 (ko) | 2006-04-14 | 2006-04-14 | 반도체 및 lcd 제조장치의 고밀도 클러스터 툴 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020060033906A KR100784154B1 (ko) | 2006-04-14 | 2006-04-14 | 반도체 및 lcd 제조장치의 고밀도 클러스터 툴 |
Publications (2)
Publication Number | Publication Date |
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KR20070102142A KR20070102142A (ko) | 2007-10-18 |
KR100784154B1 true KR100784154B1 (ko) | 2007-12-10 |
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KR1020060033906A KR100784154B1 (ko) | 2006-04-14 | 2006-04-14 | 반도체 및 lcd 제조장치의 고밀도 클러스터 툴 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104701214A (zh) * | 2013-12-04 | 2015-06-10 | 中芯国际集成电路制造(上海)有限公司 | 半导体处理系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100251824B1 (ko) | 1991-05-17 | 2000-04-15 | 히가시 데츠로 | 웨이퍼 가공 클러스터 툴 배치 예열과 탈가스 방법 및 장치 |
JP2003059999A (ja) * | 2001-08-14 | 2003-02-28 | Tokyo Electron Ltd | 処理システム |
JP2003077976A (ja) * | 2001-08-31 | 2003-03-14 | Tokyo Electron Ltd | 処理システム |
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2006
- 2006-04-14 KR KR1020060033906A patent/KR100784154B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100251824B1 (ko) | 1991-05-17 | 2000-04-15 | 히가시 데츠로 | 웨이퍼 가공 클러스터 툴 배치 예열과 탈가스 방법 및 장치 |
JP2003059999A (ja) * | 2001-08-14 | 2003-02-28 | Tokyo Electron Ltd | 処理システム |
JP2003077976A (ja) * | 2001-08-31 | 2003-03-14 | Tokyo Electron Ltd | 処理システム |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104701214A (zh) * | 2013-12-04 | 2015-06-10 | 中芯国际集成电路制造(上海)有限公司 | 半导体处理系统 |
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