KR100532026B1 - 박막트랜지스터 광센서의 스토리지커패시터 및 그 제조방법 - Google Patents
박막트랜지스터 광센서의 스토리지커패시터 및 그 제조방법 Download PDFInfo
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- KR100532026B1 KR100532026B1 KR1019980053124A KR19980053124A KR100532026B1 KR 100532026 B1 KR100532026 B1 KR 100532026B1 KR 1019980053124 A KR1019980053124 A KR 1019980053124A KR 19980053124 A KR19980053124 A KR 19980053124A KR 100532026 B1 KR100532026 B1 KR 100532026B1
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- Prior art keywords
- storage electrode
- thin film
- film transistor
- storage
- insulating film
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- 238000003860 storage Methods 0.000 title claims abstract description 115
- 239000010409 thin film Substances 0.000 title claims abstract description 53
- 239000003990 capacitor Substances 0.000 title claims abstract description 29
- 230000003287 optical effect Effects 0.000 title claims abstract description 24
- 238000004519 manufacturing process Methods 0.000 title claims description 10
- 239000010408 film Substances 0.000 claims abstract description 46
- 239000000758 substrate Substances 0.000 claims abstract description 38
- 229910052751 metal Inorganic materials 0.000 claims abstract description 16
- 239000002184 metal Substances 0.000 claims abstract description 16
- 238000000034 method Methods 0.000 claims abstract description 11
- 238000000151 deposition Methods 0.000 claims abstract description 9
- 238000000059 patterning Methods 0.000 claims abstract description 9
- 238000005530 etching Methods 0.000 claims abstract description 5
- 239000004065 semiconductor Substances 0.000 description 17
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1255—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs integrated with passive devices, e.g. auxiliary capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/14612—Pixel-elements with integrated switching, control, storage or amplification elements involving a transistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14689—MOS based technologies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14692—Thin film technologies, e.g. amorphous, poly, micro- or nanocrystalline silicon
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Description
Claims (5)
- 게이트와 소스 및 드레인 전극이 각각 형성된 센서 박막트랜지스터와 스위치 박막트랜지스터를 포함하여 일 화소로 정의되는 박막트랜지스터 광센서의 스토리지 커패시터 제조방법으로서,투명한 기판을 구비하는 단계와;상기 기판상에 도전성금속을 증착하고 패터닝하여 상기 기판상에 소정의 면적을 가진 제1 스토리지전극과 상기 센서박막트랜지스터와 스위치박막트랜지스터의 게이트전극을 동시에 형성하는 단계와;상기 제1 스토리지전극이 형성된 기판상에 제1 절연막을 전면에 걸쳐 형성하는 단계와;상기 제1 절연막상에 도전성금속을 증착하고 패터닝하여 상기 제1 스토리지전극과 대응되도록 소정의 면적을 가진 제2 스토리지전극과 상기 센서박막트랜지스터와 스위치박막트랜지스터의 소스 및 드레인전극을 동시에 형성하는 단계와;상기 제2 스토리지전극이 형성된 제1 절연막상에 제2 절연막을 전면에 걸쳐 형성하는 단계와;상기 제1 스토리지전극상의 일 끝단이 노출되도록 상기 제2 절연막 및 제1 절연막을 식각하여 콘택홀을 형성하는 단계와;상기 콘택홀을 충진하면서 상기 제2 절연막상에 도전성금속을 증착하고 패터닝하여 상기 제2 스토리지전극과 대응되는 위치에 상기 콘택홀을 통해 제1 스토리지전극과 전기적으로 연결되는 제3 스토리지전극을 형성하는 단계를 포함하는 박막트랜지스터 광센서의 스토리지커패시터의 제조방법.
- 게이트와 소스 및 드레인 전극이 각각 형성된 센서 박막트랜지스터와 스위치 박막트랜지스터를 포함하여 일 화소로 정의되는 박막트랜지스터 광센서의 스토리지 커패시터로서,투명한 기판과;상기 기판상에 소정의 면적을 가지도록 형성되며, 상기 센서 박막트랜지스터와 스위치 박막트랜지스터의 게이트전극과 동일 레이어에 형성되는 제1 스토리지전극과;상기 제1 스토리지전극이 형성된 기판상의 전면에 걸쳐 형성된 제1 절연막과;상기 제1 절연막상의 상기 제1 스토리지전극과 대응되는 위치에 소정의 면적을 가지도록 형성되며, 상기 센서 박막트랜지스터와 스위치 박막트랜지스터의 소스 및 드레인전극과 동일 레이어에 형성되는 제2 스토리지전극과;상기 제2 스토리지전극이 형성된 제1 절연막상의 전면에 걸쳐 형성된 제2 절연막과;상기 제1 스토리지전극과 전기적으로 연결되고, 상기 제2 스토리지전극과 대응되는 위치에 소정의 면적을 가진 제3 스토리지전극을 포함하는 박막트랜지스터 광센서의 스토리지커패시터.
- 제 2 항에 있어서,상기 제1 스토리지전극과 제3 스토리지전극은 콘택홀을 통하여 전기적으로 연결된 박막트랜지스터 광센서의 스토리지커패시터.
- 제 2 항 및 제 3 항중 일 항에 있어서,상기 콘택홀은 상기 제1 스토리지전극의 일 끝단의 상측이 노출되도록 상기 제1 절연막 및 제2 절연막을 식각하여 형성된 박막트랜지스터 광센서의 스토리지커패시터.
- 제 2 항에 있어서,상기 센서 박막트랜지스터의 드레인전극은 상기 제2스토리지전극과 전기적으로 연결되는 것을 특징으로 하는 박막트랜지스터 광센서의 스토리지커패시터.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1019980053124A KR100532026B1 (ko) | 1998-12-04 | 1998-12-04 | 박막트랜지스터 광센서의 스토리지커패시터 및 그 제조방법 |
Applications Claiming Priority (1)
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KR1019980053124A KR100532026B1 (ko) | 1998-12-04 | 1998-12-04 | 박막트랜지스터 광센서의 스토리지커패시터 및 그 제조방법 |
Publications (2)
Publication Number | Publication Date |
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KR20000038217A KR20000038217A (ko) | 2000-07-05 |
KR100532026B1 true KR100532026B1 (ko) | 2006-03-14 |
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KR1019980053124A KR100532026B1 (ko) | 1998-12-04 | 1998-12-04 | 박막트랜지스터 광센서의 스토리지커패시터 및 그 제조방법 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20020028754A (ko) * | 2001-05-04 | 2002-04-17 | 안준영 | 액정표시겸 지문입력 패널 |
KR101279265B1 (ko) * | 2005-11-04 | 2013-06-26 | 엘지디스플레이 주식회사 | 액정표시장치 및 그 제조방법 |
TWI347680B (en) * | 2007-09-28 | 2011-08-21 | Prime View Int Co Ltd | A photo sensor and a method for manufacturing thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07270824A (ja) * | 1994-03-31 | 1995-10-20 | Mitsubishi Electric Corp | 液晶表示装置及びその製造方法 |
JPH09233257A (ja) * | 1996-02-21 | 1997-09-05 | Alps Electric Co Ltd | エリアイメージセンサ |
KR19980015435A (ko) * | 1996-08-21 | 1998-05-25 | 김광호 | 액정표시장치 및 그 제조방법 |
KR100212273B1 (ko) * | 1995-01-20 | 1999-08-02 | 윤종용 | 박막트랜지스터 액정 디스플레이 소자의 스토리지 캐패시터구조 및 그 제조방법 |
KR100339346B1 (ko) * | 1994-07-29 | 2003-05-17 | 엘지전자주식회사 | 액정표시소자제조방법 |
-
1998
- 1998-12-04 KR KR1019980053124A patent/KR100532026B1/ko not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07270824A (ja) * | 1994-03-31 | 1995-10-20 | Mitsubishi Electric Corp | 液晶表示装置及びその製造方法 |
KR100339346B1 (ko) * | 1994-07-29 | 2003-05-17 | 엘지전자주식회사 | 액정표시소자제조방법 |
KR100212273B1 (ko) * | 1995-01-20 | 1999-08-02 | 윤종용 | 박막트랜지스터 액정 디스플레이 소자의 스토리지 캐패시터구조 및 그 제조방법 |
JPH09233257A (ja) * | 1996-02-21 | 1997-09-05 | Alps Electric Co Ltd | エリアイメージセンサ |
KR19980015435A (ko) * | 1996-08-21 | 1998-05-25 | 김광호 | 액정표시장치 및 그 제조방법 |
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