KR100276271B1 - A dielectric ceramic composition with low temperature sintering and a method for manufacturing multi layer ceramic capacitor using it - Google Patents
A dielectric ceramic composition with low temperature sintering and a method for manufacturing multi layer ceramic capacitor using it Download PDFInfo
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- 239000000203 mixture Substances 0.000 title claims abstract description 38
- 239000003985 ceramic capacitor Substances 0.000 title claims abstract description 27
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 12
- 238000000034 method Methods 0.000 title claims description 6
- 239000000919 ceramic Substances 0.000 title description 8
- 238000009766 low-temperature sintering Methods 0.000 title description 2
- 238000005245 sintering Methods 0.000 claims abstract description 12
- FFQALBCXGPYQGT-UHFFFAOYSA-N 2,4-difluoro-5-(trifluoromethyl)aniline Chemical compound NC1=CC(C(F)(F)F)=C(F)C=C1F FFQALBCXGPYQGT-UHFFFAOYSA-N 0.000 claims abstract description 8
- ZLNQQNXFFQJAID-UHFFFAOYSA-L magnesium carbonate Chemical compound [Mg+2].[O-]C([O-])=O ZLNQQNXFFQJAID-UHFFFAOYSA-L 0.000 claims abstract description 8
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 claims abstract description 8
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims abstract description 7
- 229910002113 barium titanate Inorganic materials 0.000 claims abstract description 7
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims abstract description 6
- 239000000843 powder Substances 0.000 claims description 11
- 239000011230 binding agent Substances 0.000 claims description 8
- 239000002002 slurry Substances 0.000 claims description 6
- 229910018068 Li 2 O Inorganic materials 0.000 claims description 4
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 4
- 239000002904 solvent Substances 0.000 claims description 3
- 229910014458 Ca-Si Inorganic materials 0.000 claims description 2
- 238000005520 cutting process Methods 0.000 claims description 2
- 238000002156 mixing Methods 0.000 claims description 2
- 238000000465 moulding Methods 0.000 claims description 2
- 238000003825 pressing Methods 0.000 claims description 2
- 238000010304 firing Methods 0.000 abstract description 12
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Inorganic materials [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 abstract 2
- 229910018557 Si O Inorganic materials 0.000 abstract 1
- 239000000463 material Substances 0.000 description 19
- 230000000052 comparative effect Effects 0.000 description 17
- 239000000654 additive Substances 0.000 description 5
- 239000003989 dielectric material Substances 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 231100000331 toxic Toxicity 0.000 description 3
- 230000002588 toxic effect Effects 0.000 description 3
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000002003 electrode paste Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 229910000021 magnesium carbonate Inorganic materials 0.000 description 2
- 239000001095 magnesium carbonate Substances 0.000 description 2
- 229910000484 niobium oxide Inorganic materials 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- -1 CaCO 3 Inorganic materials 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 231100000614 poison Toxicity 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000003440 toxic substance Substances 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical group [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/46—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates
- C04B35/462—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates
- C04B35/465—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates
- C04B35/468—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on titanium oxides or titanates based on titanates based on alkaline earth metal titanates based on barium titanates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
- H01G4/1218—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates
- H01G4/1227—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates based on alkaline earth titanates
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- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/622—Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/64—Burning or sintering processes
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Abstract
본 발명의 저온소성용 유전체 조성물은 티탄산바륨(BaTiO3), 지르콘산스트론륨(SrZrO3), 산화이트륨(Y2O3), 탄산마그네슘(MgCO3), 산화니오븀(Nb2O5), 및 소결조제로서 Li-Ca-Si-O계를 포함하고, 그 조성은 a BaTiO3- b SrZrO3- c MgCO3- d Y2O3- e Nb2O5- f LixCa(1-x/2)SiO3의 일반식으로 표현될 때 그 몰%로, 91.40≤a≤94.55, 0.45≤b≤3.40, 0.2≤c≤9.0, 0.05≤d≤2.0, 0.05≤e≤0.70, 및 1.0≤f≤3.0의 범위로 이루어지는 것으로서, 이 조성물을 이용하여 적층 세라믹 콘덴서를 제조하는 경우 약 1100~1200℃의 저온에서 소결이 가능하여 유전체층과 Ni내부전극 간의 수축이 감소되어 매우 신뢰성이 있다.The dielectric composition for low-temperature firing of the present invention is barium titanate (BaTiO 3 ), strontium zirconate (SrZrO 3 ), yttrium oxide (Y 2 O 3 ), magnesium carbonate (MgCO 3 ), niobium oxide (Nb 2 O 5 ), And a Li-Ca-Si-O-based sintering aid, the composition of which is a BaTiO 3 -b SrZrO 3 -c MgCO 3 -d Y 2 O 3 -e Nb 2 O 5 -f Li x Ca (1- x / 2) in terms of mole percent expressed by the general formula of SiO 3 , 91.40 ≦ a ≦ 94.55, 0.45 ≦ b ≦ 3.40, 0.2 ≦ c ≦ 9.0, 0.05 ≦ d ≦ 2.0, 0.05 ≦ e ≦ 0.70, and 1.0 ≤ f ≤ 3.0, when manufacturing a multilayer ceramic capacitor using this composition can be sintered at a low temperature of about 1100 ~ 1200 ℃ to reduce the shrinkage between the dielectric layer and the Ni internal electrode is very reliable.
Description
본 발명은 적층세라믹 콘덴서에 관한 것으로서, 보다 상세하게는 세라믹 유전체 조성물과 이를 이용하여 저온에서 소성에 의해 Ni을 내부전극으로 하는 적층 세라믹 콘덴서를 제조하는 방법에 관한 것이다.The present invention relates to a multilayer ceramic capacitor, and more particularly, to a ceramic dielectric composition and a method for manufacturing a multilayer ceramic capacitor using Ni as an internal electrode by firing at a low temperature using the same.
통상 적층 세라믹 콘덴서(multi layer ceramic capacitor)는 유전체, 내부전극 페이스트(paste)와 외부전극 페이스트의 세 가지 재료로 제조된다. 적층 세라믹 콘덴서의 내부전극 재료로서 종래에는 값비싼 Pd 귀금속을 주로 사용하여 왔는데, Pd의 가격 상승에 따른 원가상승을 극복하고 고적층, 고용량품에 대한 수요에 대처하고자 최근에는 상대적으로 가격이 싼 Ni을 내부전극으로 적용하는 추세에 있다.In general, a multilayer ceramic capacitor is made of three materials: a dielectric, an internal electrode paste, and an external electrode paste. Conventionally, expensive Pd noble metals have been mainly used as internal electrode materials for multilayer ceramic capacitors. In order to cope with the cost rise due to the price increase of Pd and to cope with the demand for high lamination and high capacity products, Ni has recently been relatively inexpensive. Is applied to the internal electrode.
그러나, 종래의 유전체 조성에 Ni을 내부전극으로 사용하는 경우 산소공공(vacancy) 형성과 함께 발생되는 자유전자에 의해 유전체가 반도체화되어 적층 세라믹 콘덴서에 그대로 적용하기가 곤란하다. 따라서, 내부전극으로 Ni을 사용하려면 유전체의 산화를 방지하기 위해 환원분위기에서 소성해야 하므로 유전체에 내환원 특성을 부여할 필요가 있다. 그리고, 이렇게 내환원성 유전체의 경우 기존의 Pd을 내부전극으로 사용하는 유전체에 비해 내부에 존재하는 산소공공에 의한 신뢰성 저하가 심하다고 알려져 있으므로 이를 해결하기 위해서는 첨가제 조절에 의해 신뢰성 향상을 이루어져야만 한다.However, when Ni is used as an internal electrode in a conventional dielectric composition, the dielectric is semiconductorized by free electrons generated with oxygen vacancies, and thus it is difficult to apply it to a multilayer ceramic capacitor as it is. Therefore, in order to use Ni as the internal electrode, the dielectric material needs to be fired in a reducing atmosphere in order to prevent oxidation of the dielectric. In addition, in the case of the reduction-resistant dielectric, it is known that the degradation of reliability due to the oxygen vacancy present therein is severe compared to the dielectric using the conventional Pd as an internal electrode.
한편, 상기 Ni 내부전극을 사용한 유전체 조성물 가운데 대표적인 예로서, 일본 공개특허 평6-215979에 개시된 바에 의하면, BaTiO3-Y2O3-V2O5계의 내환원성 세라믹 유전체 조성물이 알려져 있다. 구체적으로 상기 조성물은 86.32~97.64mol%의 BaTiO3, 0.01~10.00mol%의 Y2O3, 0.01~10.00mol%의 MgO, 0.001~0.200mol%의 V2O5로 구성되거나 여기에 첨가물로서 0.01~1.0mol%의 MnO, Cr2O3, Co2O3중 적어도 1종 이상 및/또는 0.5~10.0mol%의 (Baα,Ca(1-α))SiO3(0≤α≤1)을 함유한 유전체 조성물로서, EIA(Electric Industry Association) 규격으로 X7R 특성(일본 규격으로는 B 특성)을 만족하는 것이다. 그러나, 상기 일본 공개특허 평6-215979에 개시된 유전체 조성물은 V2O5를 미량으로 첨가하는 경우 유전체의 가속수명을 크게 향상시키지만, 무엇보다도 V2O5가 유독성을 가지고 있어 환경 오염을 유발한다는 단점이 있다.On the other hand, as a representative example of the dielectric composition using the Ni internal electrode, as disclosed in Japanese Patent Laid-Open No. 6-215979, a reduction-resistant ceramic dielectric composition of BaTiO 3 -Y 2 O 3 -V 2 O 5 system is known. Specifically, the composition is composed of 86.32 to 97.64 mol% BaTiO 3 , 0.01 to 10.00 mol% Y 2 O 3 , 0.01 to 10.00 mol% MgO, 0.001 to 0.200 mol% V 2 O 5 , or as an additive thereto. 0.01-1.0 mol% of MnO, Cr 2 O 3 , Co 2 O 3 and at least one and / or 0.5-10.0 mol% of (Ba α , Ca (1-α) ) SiO 3 (0 ≦ α ≦ 1 ), Which satisfies the X7R characteristic (B characteristic in Japanese standard) according to the EIA (Electric Industry Association) standard. However, the dielectric composition disclosed in Japanese Unexamined Patent Publication No. 6-215979 greatly improves the accelerated life of the dielectric when V 2 O 5 is added in a small amount, but above all, V 2 O 5 is toxic and causes environmental pollution. There are disadvantages.
또한, 이 조성물을 이용하여 콘덴서를 제조할 때 소결온도가 1300℃이상으로 높여야 한다는 문제가 있다. 통상 Ni을 내부전극층과 세라믹 유전체층이 교차된 형태의 적층 세라믹 콘덴서를 소성할 때 내부전극층이 세라믹 유전체층보다 저온에서 수축하여 두층간의 벌어짐(delamination)이 발생하기 쉽다. 따라서, 적층 세라믹 콘덴서를 제조하는 경우 소성온도가 높아질수록 전극층의 뭉침 현상이 두드러져 내부전극간 단락(short) 불량의 발생률이 높아지는 단점이 있다.In addition, there is a problem that the sintering temperature should be increased to 1300 ℃ or more when producing a capacitor using this composition. Usually, when firing a multilayer ceramic capacitor in which Ni is intersected with an internal electrode layer and a ceramic dielectric layer, the internal electrode layer shrinks at a lower temperature than the ceramic dielectric layer, and delamination is likely to occur. Therefore, in the case of manufacturing the multilayer ceramic capacitor, as the firing temperature is increased, the aggregation of the electrode layers becomes more prominent, and thus, the incidence rate of short defects between internal electrodes is increased.
본 발명은 상기 종래의 문제점을 해결하기 위하여 제안된 것으로서, 적층 세라믹 콘덴서를 제조할 때 유독성 첨가제를 사용하지 않으면서도 저온 소성이 가능하여 Ni 내부전극층과 유전체간의 수축률의 차이가 감소되고, 이에 따라 높은 신뢰성을 갖는 적층 세라믹 콘덴서 조성물을 제공함에 그 목적이 있다.The present invention has been proposed to solve the above-mentioned problems, and when manufacturing a multilayer ceramic capacitor, low-temperature firing is possible without using toxic additives, so that the difference in shrinkage between the Ni internal electrode layers and the dielectric is reduced. It is an object to provide a multilayer ceramic capacitor composition having reliability.
또한, 본 발명의 다른 목적은 상기한 조성물을 이용하여 종래보다 저온에서 소성을 행하면서도 신뢰성이 우수한 적층 세라믹 콘덴서를 제조하는 새로운 제조방법을 제공함에 있다.In addition, another object of the present invention is to provide a novel manufacturing method for producing a multilayer ceramic capacitor having excellent reliability while firing at a lower temperature than the conventional composition using the above-described composition.
상기 목적달성을 위한 본 발명은 적층 세라믹 콘덴서에 사용되는 유전체 조성물에 있어서,The present invention for achieving the above object in the dielectric composition used in the multilayer ceramic capacitor,
적층 세라믹 콘덴서에 사용되는 유전체 조성물에 있어서,In the dielectric composition used for the multilayer ceramic capacitor,
티탄산바륨(BaTiO3), 지르콘산스트론륨(SrZrO3), 산화이트륨(Y2O3), 탄산마그네슘(MgCO3), 산화니오븀(Nb2O5), 및 소결조제로서 Li-Ca-Si-O계를 포함하고, 그 조성은 a BaTiO3- b SrZrO3- c MgCO3- d Y2O3- e Nb2O5- f LixCa(1-x/2)SiO3의 일반식으로 표현될 때 그 몰%로, 91.40≤a≤94.55, 0.45≤b≤3.40, 0.2≤c≤9.0, 0.05≤d≤2.0, 0.05≤e≤0.70, 및 1.0≤f≤3.0의 범위인 저온소성용 유전체 조성물에 관한 것이다.Barium titanate (BaTiO 3 ), strontium zirconate (SrZrO 3 ), yttrium oxide (Y 2 O 3 ), magnesium carbonate (MgCO 3 ), niobium oxide (Nb 2 O 5 ), and Li-Ca-Si as sintering aid -O system, the composition of which is a general formula of a BaTiO 3 -b SrZrO 3 -c MgCO 3 -d Y 2 O 3 -e Nb 2 O 5 -f Li x Ca (1-x / 2) SiO 3 In terms of mole%, the low-temperature firing ranges from 91.40 ≦ a ≦ 94.55, 0.45 ≦ b ≦ 3.40, 0.2 ≦ c ≦ 9.0, 0.05 ≦ d ≦ 2.0, 0.05 ≦ e ≦ 0.70, and 1.0 ≦ f ≦ 3.0. It relates to a dielectric composition for.
또한, 본 발명은 내부전극으로 Ni을 이용한 적층 세라믹 콘덴서의 제조방법에 있어서,In addition, the present invention is a method of manufacturing a multilayer ceramic capacitor using Ni as an internal electrode,
a BaTiO3- b SrZrO3- c MgCO3- d Y2O3- e Nb2O5- f LixCa(1-x/2)SiO3의 일반식으로 표현될 때 그 몰%로, 91.40≤a≤94.55, 0.45≤b≤3.40, 0.2≤c≤9.0, 0.05≤d≤2.0, 0.05≤e≤0.70, 1.0≤f≤3.0의 범위가 되도록 티탄산바륨(BaTiO3), 지르콘산스트론륨(SrZrO3), 산화이트륨(Y2O3), 탄산마그네슘(MgCO3), 산화니오븀(Nb2O5), 및 LixCa(1-x/2)SiO3분말을 첨가하여 습식혼합하여 건조하는 단계;a BaTiO 3 -b SrZrO 3 -c MgCO 3 -d Y 2 O 3 -e Nb 2 O 5 -f Li x Ca (1-x / 2) Molar percentage of the molar ratio as expressed by the general formula of SiO 3 , 91.40 Barium titanate (BaTiO 3 ), strontium zirconate () so as to be in the range of SrZrO 3 ), yttrium oxide (Y 2 O 3 ), magnesium carbonate (MgCO 3 ), niobium oxide (Nb 2 O 5 ), and Li x Ca (1-x / 2) SiO 3 powders were added and wet mixed to dry Doing;
상기 건조된 분말에 바인더와 용매를 첨가하여 슬러리를 제조하는 단계;Preparing a slurry by adding a binder and a solvent to the dried powder;
상기 슬러리를 이용하여 일정 형태의 시트상으로 성형하는 단계;Molding into a sheet having a predetermined shape using the slurry;
성형된 시트 위에 Ni 내부전극을 인쇄하고, 인쇄된 시트를 다수개 적층하여 가압하는 단계;Printing the Ni internal electrodes on the molded sheet, and stacking and pressing a plurality of printed sheets;
상기와 같이 적층된 적층물을 일정 크기로 절단하고, 소부하여 내부의 바인더를 제거하는 단계;Cutting the laminated stack to a predetermined size and baking to remove the binder therein;
탈바인더 처리된 성형체를 1100~1200℃ 온도에서 소결하는 단계; 및Sintering the debindered molded body at a temperature of 1100 to 1200 ° C; And
상기 소결체의 양단에 외부전극을 형성하는 단계; 를 포함하여 구성되는 적층 세라믹 콘덴서의 제조방법에 관한 것이다.Forming external electrodes at both ends of the sintered body; It relates to a method of manufacturing a multilayer ceramic capacitor comprising a.
이하, 본 발명에 대하여 상세히 설명한다.EMBODIMENT OF THE INVENTION Hereinafter, this invention is demonstrated in detail.
본 발명의 세라믹 유전체 조성물은 티탄산바륨(BaTiO3), 지르콘산스트론륨(SrZrO3), 산화이트륨(Y2O3), 탄산마그네슘(MgCO3), 및 산화니오븀(Nb2O5)으로 구성되는 BaTiO3- SrZrO3- MgCO3- Y2O3- Nb2O5을 주성분으로 하며, 여기에 소량의 LixCa(1-x/2)SiO3가 부성분으로서 함유되어 조성된다. 본 발명의 유전체는 X7R 특성을 갖는 적층 세라믹 콘덴서에 적합한 것으로서, 이러한 유전체 조성물은 그 입자들이 BaTiO3에 가까운 중핵(core)을 이루는 부분과 일시적인 액상에 의한 소성(transient liquid phase sintering)에 형성되는 외곽부(shell)가 입계부근에 마련되어 액상과 첨가제들이 고용되어 있다. 본 발명의 유전체 조성물을 구성하는 첨가제들은 소성후 상기 외곽부의 액상 융점을 낮추고 중핵 내로 치환이 용이하여 결국 소성온도를 크게 낮추는데 특징이 있다.The ceramic dielectric composition of the present invention is composed of barium titanate (BaTiO 3 ), strontium zirconate (SrZrO 3 ), yttrium oxide (Y 2 O 3 ), magnesium carbonate (MgCO 3 ), and niobium oxide (Nb 2 O 5 ) It contains BaTiO 3 -SrZrO 3 -MgCO 3 -Y 2 O 3 -Nb 2 O 5 as a main component, and contains a small amount of Li x Ca (1-x / 2) SiO 3 as a minor component. The dielectric of the present invention is suitable for multilayer ceramic capacitors having X7R characteristics, and the dielectric composition is formed by the part where the particles form a core close to BaTiO 3 and the outer liquid formed in transient liquid phase sintering. A shell is provided near the grain boundary and the liquid and additives are dissolved. The additives constituting the dielectric composition of the present invention are characterized by lowering the liquid melting point of the outer part after firing and easy substitution into the core, thereby lowering the firing temperature significantly.
우선, 주성분을 a BaTiO3- b SrZrO3- c MgCO3- d Y2O3- e Nb2O5- f LixCa(1-x/2)SiO3의 일반식으로 표현할 때 본 발명의 세라믹 유전체 주성분중의 티탄산바륨은 그 몰%로 91.40≤a≤94.55의 범위를 가짐이 바람직하다.First, when the main component is expressed by the general formula of a BaTiO 3 -b SrZrO 3 -c MgCO 3 -d Y 2 O 3 -e Nb 2 O 5 -f Li x Ca (1-x / 2) SiO 3 Barium titanate in the ceramic dielectric main component preferably has a range of 91.40? A?
또한, 상기 지르콘산스트론륨은 유전체내에서 확산이 용이하여 유전율을 향상시키는 작용을 하는데, 그 조성은 몰%로 0.45≤b≤3.40의 범위를 가짐이 바람직하다. 만일 b가 0.45미만인 경우 소결성이 저하되어 유전율이 나빠진다.In addition, the strontium zirconate is easy to diffuse in the dielectric to improve the dielectric constant, the composition is preferably in the range of 0.45≤b≤3.40 in mol%. If b is less than 0.45, the sinterability is lowered and the dielectric constant is worsened.
또한, 상기 산화이트륨은 Ba2+이온자리에 치환되어 수명을 향상시키는 역할을 하는데, 그 함량은 몰%로 0.2≤c≤9.0의 범위로 조성됨이 바람직하다. 만일 c가 0.2미만인 경우 손실계수가 상승하고 온도 특성이 나빠지며 9.0초과하면 콘덴서의 가속수명이 저하된다.In addition, the yttrium is substituted with Ba 2+ ion sites to improve the life, the content is preferably in the range of 0.2≤c≤9.0 in mol%. If c is less than 0.2, the loss coefficient increases, the temperature characteristics deteriorate, and if it exceeds 9.0, the accelerated life of the capacitor is reduced.
또한, 상기 탄산마그네슘은 유전체의 내환원성을 향상시키는 작용을 하는데, 그 조성은 몰%로, 0.05≤d≤2.0의 범위를 가짐이 바람직하다. 만일 d가 0.05 미만인 경우 온도특성이 나빠지고 가속수명이 저하되며 2.0초과인 경우 유전체가 반도체화된다.In addition, the magnesium carbonate has the effect of improving the reduction resistance of the dielectric, the composition is mol%, preferably has a range of 0.05≤d≤2.0. If d is less than 0.05, the temperature characteristics deteriorate, the acceleration life is deteriorated, and if it is greater than 2.0, the dielectric material is semiconductorized.
또한, 상기 산화니오븀은 신뢰성을 향상시키는 역할을 하는데, 그 함량은 몰%로 0.05≤e≤0.70의 범위로 조성됨이 바람직하다. 만일 e가 0.05미만이면 가속수명이 저하되고 0.70 초과면 유전율과 절연저항이 감소된다.In addition, the niobium oxide serves to improve the reliability, the content is preferably in the range of 0.05≤e≤0.70 in mol%. If e is less than 0.05, the accelerated lifetime decreases, and if it exceeds 0.70, the dielectric constant and insulation resistance decrease.
또한, LixCa(1-x/2)SiO3소결조제는 주성분에 대해 1.0-3.0몰%로 함유됨이 바람직하다. 이때, 상기 LixCa(1-x/2)SiO3은 Li2O, CaCO3및 SiO2분말을 첨가하여 0.1≤x≤0.6 범위를 갖는 것을 사용함이 바람직하다. x가 0.1미만이면 소결성이 나빠지고 0.6초과면 유전율이 저하된다.In addition, the Li x Ca (1-x / 2) SiO 3 sintering aid is preferably contained in 1.0-3.0 mol% based on the main component. At this time, the Li x Ca (1-x / 2) SiO 3 It is preferable to use a thing having a 0.1≤x≤0.6 by adding Li 2 O, CaCO 3 and SiO 2 powder. If x is less than 0.1, sinterability will worsen and the dielectric constant exceeding 0.6 will fall.
이상과 같이 구성된 본 발명의 세라믹 유전체 조성물은 내환원성 조성이므로 Ni을 내부전극으로 하는 X7R규격의 적층세라믹콘덴서의 유전체로서 매우 유용하다.Since the ceramic dielectric composition of the present invention configured as described above has a reducing resistance, it is very useful as a dielectric of an X7R standard multilayer ceramic capacitor having Ni as an internal electrode.
이하, 본 발명의 유전체 조성물을 이용하여 적층 세라믹 콘덴서를 제조하는 방법에 대하여 상세히 설명한다.Hereinafter, a method of manufacturing a multilayer ceramic capacitor using the dielectric composition of the present invention will be described in detail.
본 발명은 내부전극으로 Ni을 이용한 적층 세라믹 콘덴서의 제조에 매우 유용하다. 먼저, 상기한 조성이 되도록 BaTiO3, SrZrO3, MgCO3, Y2O3, Nb2O5분말과 소결조제로서 LixCa(1-x/2)SiO3을 습식혼합하여 건조한다. 상기 LixCa(1-x/2)SiO3은 Li2O, CaCO3및 SiO2분말을 혼합하여 0.1≤x≤0.6의 범위로 조성된 것을 사용함이 바람직하다.The present invention is very useful for the production of multilayer ceramic capacitors using Ni as the internal electrode. First, BaTiO 3 , SrZrO 3 , MgCO 3 , Y 2 O 3 , and Nb 2 O 5 powder and Li x Ca (1-x / 2) SiO 3 as a sintering aid are wet-mixed to dry the composition. The Li x Ca (1-x / 2) SiO 3 is preferably used by mixing Li 2 O, CaCO 3 and SiO 2 powder in the range of 0.1≤x≤0.6.
그 다음, 건조된 분말에 바인더와 용매를 첨가하여 슬러리를 제조한다. 바인더로는 통상적인 바인더라면 어느 것이나 가능한데, 예를들면 폴리비닐부틸계 또는 아크릴계를 들 수 있다.Next, a binder and a solvent are added to the dried powder to prepare a slurry. As a binder, any conventional binder can be used, for example, polyvinyl butyl-type or acryl-type.
그 다음, 이 슬러리를 이용하여 통상의 방법과 마찬가지로 일정 형태의 시트상으로 성형하고, 성형된 시트 위에 Ni 내부전극을 인쇄한다. 그리고, 인쇄된 시트를 다수개 적층하여 가압하여 가압된 성형체를 일정 크기로 절단하고, 소부(baking out)하여 내부의 바인더를 제거한다.Then, this slurry is used to form a sheet into a certain form in the same manner as in the usual method, and Ni internal electrodes are printed on the formed sheet. Then, a plurality of printed sheets are laminated and pressed to cut the press-formed body into a predetermined size, and baking out to remove the binder therein.
이렇게 탈바인더 처리된 성형체는 1100~1200℃, 바람직하게는 1150~1200℃의 온도에서 소결한다. 본 발명의 유전체 조성물은 1100~1200℃의 온도에서 소결이 가능하므로 원가를 절감하며 유전체 결정립(grain) 크기의 저하로 높은 신뢰성을 얻을 수 있다.The molded object thus debindered is sintered at a temperature of 1100 to 1200 ° C, preferably 1150 to 1200 ° C. Since the dielectric composition of the present invention can be sintered at a temperature of 1100 to 1200 ° C., cost can be reduced and high reliability can be obtained by lowering the grain size of the dielectric.
이후, 상기 소결체의 양단에 외부전극을 형성하면 Ni을 내부전극으로 한 적층 세라믹 콘덴서가 얻어진다. 이와같이, 본 발명에 의해 제조된 콘덴서는 유독성 물질을 사용하지 않고도 저온소성이 가능하고 그 유전율이 3000이상인 X7R 특성을 보인다.Subsequently, when external electrodes are formed at both ends of the sintered body, a multilayer ceramic capacitor having Ni as an internal electrode is obtained. As described above, the capacitor manufactured by the present invention exhibits X7R characteristics capable of low temperature firing without using toxic substances and having a dielectric constant of 3000 or more.
이하, 본 발명을 실시예를 통하여 구체적으로 설명하지만, 본 발명은 다음의 실시예에 제시된 예로서 한정되지 않는 것은 물론이다.Hereinafter, the present invention will be described in detail with reference to Examples, but the present invention is not limited to the examples given in the following Examples.
[실시예]EXAMPLE
출발원료로 99.5%이상의 순도를 갖는 BaTiO3, SrZrO3, Y2O3, MgCO3, Nb2O5, Li2O, CaCO3, 및 SiO2분말을 하기 표1의 각 조성이 되도록 평량하였다. 이때, 부성분은 미리 하소하여 분쇄한 후 사용하였다.BaTiO 3 , SrZrO 3 , Y 2 O 3 , MgCO 3 , Nb 2 O 5 , Li 2 O, CaCO 3 , and SiO 2 powders having a purity of at least 99.5% as a starting material were weighed to each composition of Table 1 below. . At this time, the subcomponent was used after calcining and grinding in advance.
평량된 조성분말에 폴리비닐 알코올(PVA)을 첨가하여 직경 10mm, 두께 1mm가 되도록 1000kg/㎠의 압력으로 원판을 만들었다. 성형된 원판을 표2와 같은 적정온도에서 2시간 소결하였다.Polyvinyl alcohol (PVA) was added to the weighed composition powder to make a disc at a pressure of 1000 kg / cm 2 to have a diameter of 10 mm and a thickness of 1 mm. The molded disc was sintered for 2 hours at the appropriate temperature as shown in Table 2.
이후, 소결체 양면에 In-Ga 전극처리를 하여 정전용량 및 유전손실을 -55∼125℃의 온도에서 LCR meter로 측정하고, 유전율은 환산하여 표2에 기재하였다.Thereafter, both surfaces of the sintered body were subjected to In-Ga electrode treatment, and the capacitance and dielectric loss were measured with an LCR meter at a temperature of -55 to 125 ° C.
표2에 나타난 바와 같이, 지르콘산스트론튬을 적게 사용한 비교재1의 경우 소결성이 저하되며 유전율이 크게 저하되었으며, 지르콘산스트론튬이 많은 비교재2의 경우 온도변화에 따른 용량 변화가 큼을 알 수 있었다. 또한 산화니오븀이 본 발명의 조건범위보다 다량 첨가된 비교재3의 경우 유전율이 크게 저하되었다.As shown in Table 2, in the case of Comparative Material 1 using less strontium zirconate, the sintering property was lowered and the dielectric constant was greatly reduced. In addition, in the case of Comparative Material 3 in which niobium oxide was added in a larger amount than the condition range of the present invention, the dielectric constant was greatly decreased.
한편, 소결조제의 조성에서 리튬의 함량이 본 발명의 조성범위보다 적게 함유된 유전체를 사용한 비교재4의 경우 저온소성이 곤란하였으며, 많이 함유된 유전체를 사용한 비교재5의 경우에는 유전율이 크게 못미치는 결과를 보이고 있다. 그리고, 탄산마그네슘의 함량이 적게 첨가된 비교재6의 경우 환원이 심하여 온도에 따른 용량변화가 큼을 알 수 있었다.On the other hand, in the composition of the sintering aid, the comparative material 4 using the dielectric material containing less lithium than the composition range of the present invention was difficult to be baked at low temperature, and the comparative material 5 using the dielectric material containing a lot of dielectric constant was not large. It is showing the results. In addition, in the case of Comparative Material 6, in which the content of magnesium carbonate was added little, it was found that the reduction was severe and the capacity change according to the temperature was large.
이에 반하여 본 발명의 유전체 조성물을 사용한 발명재(1-7)의 경우에는 유전율이 3000이상을 상회하는 X7R 특성을 갖으면서도 저온소성에 의해 유전층과 Ni내부전극간의 수축률이 감소되어 신뢰성이 큰 내환원성 적층 세라믹 콘덴서가 얻어짐을 알 수 있다.On the contrary, in the case of the inventive material (1-7) using the dielectric composition of the present invention, the shrinkage between the dielectric layer and the Ni internal electrode is reduced by low temperature sintering, but the X7R characteristic of the dielectric constant is higher than 3000, thereby reducing the reliability. It can be seen that a multilayer ceramic capacitor is obtained.
상술한 바와 같이, 본 발명의 유전체 조성물은 일단 유독성 첨가제가 함유되지 않으며, 이러한 유전체 조성물을 이용하여 적층 세라믹 콘덴서를 제조할 경우 저온 소성이 가능하여 Ni 내부전극층과 유전체간의 수축률의 차이가 감소되고, 이에 따라 높은 신뢰성을 보여 X7R 특성에 매우 적합한 적층 세라믹 콘덴서에 유용한 효과가 있다.As described above, the dielectric composition of the present invention does not contain toxic additives once, and when the multilayer ceramic capacitor is manufactured using the dielectric composition, low-temperature firing is possible, thereby reducing the difference in shrinkage between the Ni internal electrode layers and the dielectric, As a result, it has a high reliability and is useful for multilayer ceramic capacitors which are very suitable for X7R characteristics.
Claims (5)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019980052149A KR100276271B1 (en) | 1998-12-01 | 1998-12-01 | A dielectric ceramic composition with low temperature sintering and a method for manufacturing multi layer ceramic capacitor using it |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019980052149A KR100276271B1 (en) | 1998-12-01 | 1998-12-01 | A dielectric ceramic composition with low temperature sintering and a method for manufacturing multi layer ceramic capacitor using it |
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| Publication Number | Publication Date |
|---|---|
| KR20000037540A KR20000037540A (en) | 2000-07-05 |
| KR100276271B1 true KR100276271B1 (en) | 2000-12-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| KR1019980052149A KR100276271B1 (en) | 1998-12-01 | 1998-12-01 | A dielectric ceramic composition with low temperature sintering and a method for manufacturing multi layer ceramic capacitor using it |
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| KR (1) | KR100276271B1 (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002326868A (en) * | 2001-05-01 | 2002-11-12 | Samsung Electro Mech Co Ltd | Dielectric ceramic composition and ceramics capacitor using it and method of manufacturing them |
| JP2002326867A (en) * | 2001-05-01 | 2002-11-12 | Samsung Electro Mech Co Ltd | Dielectric ceramic composition and ceramic capacitor using it and method of manufacturing them |
| JP2002326866A (en) * | 2001-05-01 | 2002-11-12 | Samsung Electro Mech Co Ltd | Dielectric ceramic composition and ceramic capacitor using it and method of manufacturing them |
| KR100496135B1 (en) * | 2002-09-18 | 2005-06-16 | (주) 알엔투테크놀로지 | Low temperature cofired ceramic composition, and its use |
| JP2008162817A (en) * | 2006-12-27 | 2008-07-17 | Samsung Electro Mech Co Ltd | Dielectric ceramic material and its manufacturing method as well as ceramic capacitor |
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1998
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| Publication number | Publication date |
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| KR20000037540A (en) | 2000-07-05 |
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