KR100220326B1 - Display method in convergence system - Google Patents

Abstract

The present invention relates to a method for displaying an adjustment point pattern in a convergence system for controlling the center of the adjustment point of the screen displayed on the monitor, comprising an adjustment point dedicated inspection pattern generating means for generating an adjustment point pattern of a specific shape when the control signal is input; The second process of controlling the adjustment point pattern inspection means for generating the adjustment point provided in the first process in the vertical phase shift mode of the first process, the adjustment point phase shift mode to generate the adjustment point pattern, the same as the second process And a fourth process of generating a test pattern through the test pattern generating means at a time point, and a fourth process of overlapping patterns generated in the second process and the third process.

Description

How to Display Control Point Patterns in a Converged System

The present invention relates to a projection TV, and more particularly, to a method for displaying an adjustment point pattern in a convergence system for controlling the center of the adjustment point of a screen displayed on a monitor.

In general, modern people tend to spend a lot of time on leisure, and in particular, the emphasis is placed on communal life with family. In addition to these phenomena, as the life improved, I felt the desire to enjoy large screens such as theaters even when I watch TV or VTR at home.

A technology proposed to meet the needs of general users who desire a large screen as described above is a projection TV of a method of projecting the image shown in FIG.

1 shows a structure of a rear projection type projection monitor, which is a front view and a side view.

Referring to the image display method of the projection TV shown in FIG. 1, a method of implementing a full color image by enlarging and projecting each individual image into three primary colors of light such as red, blue, and green to form an image on the same point of the screen. to be.

That is, each image from the red-only CRT (R), the green-only CRT (G), and the blue-only CRT (B) is reflected by the mirror (M) and then merged on the screen (S) to have one full color image. 1, each of which has different spatial positions in the CRTs R, G, and B shown in FIG. 1 and has a Convergence Angle, that is, an angle at which the projected image is incident on the screen S. Since different, as shown in the accompanying FIG. 2, miss-convergence occurs.

Therefore, by applying an appropriate correction current in the horizontal / vertical direction to the convergence yokes of each of the CRTs R, G, and B, the misconvergence should be corrected by adjusting the path of the electron beam. The adjustment flow of miss-convergence as shown is shown.

Referring to FIG. 3, the adjuster directly confirms that the test pattern for adjustment is projected on the screen S, and then adjusts the mis-convergence between the image patterns projected from the respective CRTs R, G, and B. When the direction is determined and the information is transmitted to the microcomputer 10 by the remote controller, the microcomputer 10 stores the control point data for the corresponding point in the RAM inside the ASIC 20.

Subsequently, the ASIC 20 uses the data stored in the RAM of the EEPROM 30 and the internal RAM by the PLL 40 synchronized with the horizontal blanking signal H_BLK among the horizontal / vertical blanking signals H_BLK and V_BLK. Output the data according to the correction. The output data is converted into an analog signal through a digital-to-analog converter (D / A) and then applied to the convergence yoke (CY) and the deflection yoke through the sample / hold and filtering units (50, 60) and the amplifiers (AMP1, AMP2). It is applied to correct the miss convergence.

4 illustrates an internal configuration of the ASIC. When the microcomputer 10 accesses the convergence reference data stored in the EEPROM 30 and transmits the data to the ASIC 20, the adjustment is stored in the internal RAM 23. Through the point data, the horizontal / vertical correction unit 26 calculates correction data using the horizontal / vertical interpolation equation as follows.

The horizontal interpolation formula is

In addition, the vertical interpolation equation is as follows.

After that, the convergence correction data is output to three channels of R, G, and B in synchronization with the horizontal / vertical blocking signal of the deflection unit, and the digital / analog converter (D / A) converts and outputs the correction correction data. In 60), the input analog data is separated into horizontal / vertical correction data, filtered after the noise, and output.

Thereafter, the data output from the sample / hold and filtering unit 60 is current amplified to drive the convergence yoke CY and the horizontal / vertical convergence yoke CY of the corresponding CRTs R, G, and B for each color. Is applied to adjust the path of image projection.

Reference numeral 21, which is not described among the above-described operations, is an address generator that generates an address for accessing the RAM 23, and reference numeral 22 is an inspection pattern generator that generates an image signal according to an inspection pattern according to a control signal. Reference numeral 24 denotes an address controller for controlling the address generator 21. Reference numeral 25 denotes a test pattern control unit for controlling the test pattern generator 22 according to an address signal generated by the address control unit 24.

Therefore, the image on which the inspection pattern generated by the inspection pattern generator 22 is projected is reflected on the mirror M and then appears again on the screen S, whereby adjustment is made.

After the adjustment is completed without the mis-convergence part in the adjustment pattern, the microcomputer 10 reads the data of the adjustment point from the ROM 23 inside the ASIC 20, and then, in the EEPROM 30, each mode (for example, NTSC, PC, This saves the adjustment data for ED ...), which completes the adjustment for one mode.

At this time, since the ASIC 20 should output the converged data in real time, the ASIC 20 continuously outputs the converged data at regular intervals (see FIG. 5).

The present invention also relates to a device such as convergence correction at any point operating as described above. After that, when a signal requesting correction is input from the user, the microcomputer reads the control point data for the mode and calculates it by software. The method performs a Lagrange calculation and the like to obtain a correction value. Patent Nos. 95-3370 and 94-4398 previously filed by the applicant.

At this time, when such a projection monitor is initially powered-on or when the convergence system is initialized, the adjustment points are initially misaligned so that the center point of the screen and the adjustment points are not centered.

Due to this problem, as shown in the accompanying FIG. 5, the adjustment point phase shift mode is operated, which changes the horizontal / vertical interpolation formula so that the adjustment point pattern has a vertex at the center of the adjustment point. With this inspection pattern, the adjustment point is moved as a whole so that the vertex of the center of the adjustment point is located at the center of the screen, that is, the center of the adjustment point coincides with the center of the screen according to the adjustment point phase shift mode.

Looking at the problem of the control point phase shift mode in the above-mentioned convergence system in detail, referring to the accompanying Figures 3 and 4, in the convergence system, the path from the convergence data to the CRT and the path from the inspection pattern to the CRT Different from each other, the transmission time difference of the signal is generated.

Therefore, the phase shift mode has two modes as follows.

First, as the test pattern phase shift mode, the test pattern is generated in the ASIC in synchronization with the clock of the test pattern generator 22. When the test pattern phase shift mode is entered, the test pattern is attached to " + " The ruler pattern is generated. At this time, the grid point of the "+" pattern becomes the center point of the inspection pattern and moves it to the center of the screen to match the center point of the inspection pattern with the center point of the screen.

Secondly, as an adjustment point phase shift mode, convergence data is generated in the ASIC in synchronization with the clock of the horizontal / vertical interpolation unit 26 of FIG. 4, and when the adjustment point phase shift mode is entered, the adjustment point pattern is shown in FIG. 5. The convergence data is changed to have a shape as shown. At this time, the vertex of the generated adjustment point pattern is the center point of the adjustment point and is moved to the center of the screen to match the center point of the inspection pattern with the center point of the screen.

However, the conventional phase shift mode as described above is different from the conventional horizontal / vertical interpolation formula to form a pattern for phase shift of the adjustment points in the adjustment point phase shift mode as shown in FIG. 5. The difficulty of using snacks was a problem.

In order to solve the above problem, a method of outputting a pattern for phase shifting of the adjustment points along the output path of the test pattern rather than the convergence data output path has been proposed, but in practice, the delay of the adjustment points occurring outside the ASIC is completely eliminated. It cannot be compensated.

The reason for the above will be described with reference to the accompanying drawings.

7 is a diagram illustrating a pattern generated when the horizontal adjustment point phase shift, Figure 8 is a diagram illustrating a pattern generated when the vertical adjustment point phase shift.

The problem depends on the horizontal phase shift / vertical phase shift of the adjustment points, and the actual measurement shows that the delay outside the ASIC is about 7.5 ㎲. The distance between the scan line and the next scan line in the horizontal direction of the screen is approximately 65 in NTSC. The accuracy is not a problem at all when the horizontal phase shift of the adjustment points is achieved.

This is because the compensation point vertical phase is not delayed by more than one scan line as long as it compensates for signal propagation delay inside the ASIC. However, the above-described method cannot be used in the vertical phase shift. Since the interpolation equation is horizontal in the sixth order, the center of the adjustment point can be sufficiently identified by the existing inspection pattern alone.

That is, when only the convergence amount of the adjustment point center is increased and the convergence amount of all the remaining adjustment points is reduced, the existing inspection pattern is shown as shown in FIG. 7. However, the inspection pattern alone can find the center of the adjustment point. Since the interpolation formula is vertical, it appears as shown in FIG. 8 attached to it, and it becomes obscure to identify the center of an adjustment point.

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and its object is to provide an adjustment point dedicated inspection pattern generating means that operates in the same manner as the existing inspection pattern, apart from the existing inspection pattern, and the adjustment point phase shift mode. In one embodiment, the present invention provides a method for displaying an adjustment point pattern in a convergence system for overlapping an adjustment point check pattern generated by convergence data with an existing check pattern.

1 is an exemplary view showing the structure of a rear projection type projection monitor

2 is an example of miss-convergence

3 is a flow chart according to a common miss-convergence correction

4 is a view illustrating a connection configuration between an internal configuration of an ASIC and a peripheral device of FIG.

5 is an exemplary diagram for explaining an adjustment point phase shift mode at the time of convergence correction;

6 is an exemplary diagram for describing a pattern phase shift mode during pattern correction.

7 is an exemplary view of a pattern generated when the horizontal adjustment point phase shift

8 illustrates an example of a pattern generated when the vertical adjustment point phase shifts.

9 is a block diagram illustrating a control point pattern display method according to the present invention;

10 is an exemplary diagram of a pattern for phase shifting of adjustment points overlapping an existing inspection pattern according to the present invention.

The present invention for achieving the above object is synchronized to the clock of the test pattern generating means in the convergence system for storing any reference interpolation data and corrects the convergence according to the request based on the reference interpolation data stored at the time of the convergence request. The inspection pattern phase shift mode in which the center point of the generated inspection pattern is matched with the center point of the screen, and the adjustment generated in synchronization with the clock of the horizontal / vertical interpolation means using a specific interpolation formula in the phase shift mode of the adjustment point. A pattern display method in a phase shift mode divided into an adjustment point phase shift mode in which a vertex of a dot pattern is matched with a center point of a screen:

A first step of providing a control point dedicated inspection pattern generating means for generating a control point pattern of a specific shape when inputting a control signal, the control point dedicated in the first process in the vertical phase shift mode of the control point phase shift mode A second process of generating an adjustment point pattern by controlling the inspection pattern generating means, a third process of generating the inspection pattern through the inspection pattern generating means at the same time when the second process is performed, and the second process and the third process The present invention provides a method for displaying an adjustment point pattern in a convergence system, comprising a fourth process of overlapping a pattern generated in a process.

Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings.

FIG. 9 is a block diagram illustrating an adjustment point pattern display method according to the present invention, and FIG. 10 is an exemplary view illustrating a pattern for phase shift of adjustment points overlapping an existing inspection pattern according to the present invention.

Referring to the accompanying drawings, the configuration of the apparatus according to the control point pattern display method in the convergence system according to the present invention is as follows.

When the microcomputer 10 accesses and transmits the convergence reference data stored in the EEPROM 30, the microcomputer 10 outputs the control point data to the horizontal / vertical correction unit 26 through the adjustment point data stored in the internal RAM 23 based on the reference. The vertical corrector 26 calculates correction data by using a horizontal / vertical interpolation equation. Thereafter, the convergence correction data is output to three channels of R, G, and B in synchronization with the horizontal / vertical blocking signal of the deflection unit.

When the digital-to-analog converter (D / A) converts it and outputs it, the sample / hold and filtering unit 60 separates input analog data into horizontal / vertical correction data and filters and outputs noise. Thereafter, the data output from the sample / hold and filtering unit 60 is current amplified to drive the convergence yoke CY and the horizontal / vertical convergence yoke CY of the corresponding CRTs R, G, and B for each color. Is applied to adjust the path of image projection.

Reference numeral 21, which is not described among the above-described operations, is an address generator that generates an address for accessing the RAM 23, and reference numeral 22 is an inspection pattern generator that generates an image signal according to an inspection pattern according to a control signal. Reference numeral 24 denotes an address controller for controlling the address generator 21. Reference numeral 25 denotes a test pattern control unit for controlling the test pattern generator 22 according to an address signal generated by the address control unit 24.

Therefore, the image on which the inspection pattern generated by the inspection pattern generator 22 is projected is reflected on the mirror M and then appears again on the screen S, whereby adjustment is made.

After the adjustment is completed without the mis-convergence part in the adjustment pattern, the microcomputer 10 reads the data of the adjustment point from the ROM 23 inside the ASIC 20, and then, in the EEPROM 30, each mode (for example, NTSC, PC, It stores the adjustment data for ED ...).

This saves the adjustment for one mode.

In this case, the newly added adjustment point dedicated inspection pattern generator 27 generates data for the vertical phase in the adjustment point phase shift mode in the horizontal / vertical correction unit 26 by receiving data according to the ">" form. Will generate an inspection pattern dedicated to the control points.

At this time, the pattern of "> " generated in the control point dedicated inspection pattern generation unit 27, that is, the pattern for phase shifting of the adjustment points (see FIG. 10) is synchronized with the clock of the horizontal / vertical interpolation unit. By shifting the pattern, delays in convergence data occurring inside the ASIC can be fully compensated.

In the convergence system according to the present invention operating as described above, if the control point pattern display method is provided, the design difficulty can be overcome because the horizontal / vertical interpolation is not used to find the center of the control point as in the conventional method. In other words, it is possible to solve the decision ambiguity generated in the technique using the control point phase shift mode path of the test pattern phase shift mode.

Claims (1)

In the convergence system that stores arbitrary reference interpolation data and corrects convergence according to the request based on the stored reference interpolation data, the center point of the test pattern generated in synchronization with the clock of the test pattern generating means is Method of matching the vertex of the adjustment point pattern generated in synchronization with the clock of the horizontal / vertical interpolation means using a specific interpolation formula in the phase shift mode of the check pattern and the adjustment point In the pattern display method in the phase shift mode divided by the control point phase shift mode of: A first step of providing an adjustment point exclusive inspection pattern generating means for generating an adjustment point pattern of a specific shape when a control signal is input; A second step of generating an adjustment point pattern by controlling an adjustment point exclusive inspection pattern generating means provided in the first step in the vertical phase shift mode of the adjustment point phase shift mode; A third process of generating a test pattern through a test pattern generating means at the same time when the second process is performed; And a fourth process of overlapping the pattern generated in the second process and the third process.