KR0163967B1 - 테스트 동안 바운더리-스캔 포트에 의해 복수의 시스템을 제어하기 위한 방법 및 장치 - Google Patents

테스트 동안 바운더리-스캔 포트에 의해 복수의 시스템을 제어하기 위한 방법 및 장치 Download PDF

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Publication number
KR0163967B1
KR0163967B1 KR1019940033844A KR19940033844A KR0163967B1 KR 0163967 B1 KR0163967 B1 KR 0163967B1 KR 1019940033844 A KR1019940033844 A KR 1019940033844A KR 19940033844 A KR19940033844 A KR 19940033844A KR 0163967 B1 KR0163967 B1 KR 0163967B1
Authority
KR
South Korea
Prior art keywords
boundary
scan
buffer
control signal
systems
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019940033844A
Other languages
English (en)
Korean (ko)
Other versions
KR950019756A (ko
Inventor
케이. 레 듀이
Original Assignee
알. 비이. 레비
에이티 앤드 티 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 알. 비이. 레비, 에이티 앤드 티 코포레이션 filed Critical 알. 비이. 레비
Publication of KR950019756A publication Critical patent/KR950019756A/ko
Application granted granted Critical
Publication of KR0163967B1 publication Critical patent/KR0163967B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1019940033844A 1993-12-23 1994-12-13 테스트 동안 바운더리-스캔 포트에 의해 복수의 시스템을 제어하기 위한 방법 및 장치 Expired - Fee Related KR0163967B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US173,732 1993-12-23
US08/173,732 US5535222A (en) 1993-12-23 1993-12-23 Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing

Publications (2)

Publication Number Publication Date
KR950019756A KR950019756A (ko) 1995-07-24
KR0163967B1 true KR0163967B1 (ko) 1999-03-20

Family

ID=22633248

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940033844A Expired - Fee Related KR0163967B1 (ko) 1993-12-23 1994-12-13 테스트 동안 바운더리-스캔 포트에 의해 복수의 시스템을 제어하기 위한 방법 및 장치

Country Status (6)

Country Link
US (1) US5535222A (https=)
EP (1) EP0661551A3 (https=)
JP (1) JPH08226954A (https=)
KR (1) KR0163967B1 (https=)
CA (1) CA2135680C (https=)
TW (1) TW251352B (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100502123B1 (ko) * 1996-08-30 2005-11-08 텍사스 인스트루먼츠 인코포레이티드 다중테스트억세스포트환경에서테스트억세스포트의선택적억세싱
EP0826974B1 (en) * 1996-08-30 2005-10-19 Texas Instruments Incorporated Device for testing integrated circuits
US6658614B1 (en) * 1997-06-02 2003-12-02 Koken Co., Ltd. Boundary scan element and communication device made by using the same
GB9818377D0 (en) * 1998-08-21 1998-10-21 Sgs Thomson Microelectronics An integrated circuit with multiple processing cores
US6988123B2 (en) * 1998-11-06 2006-01-17 Seiko Epson Corporation Methods and apparatus for remote execution of an application over the internet
US6636891B1 (en) 1998-11-06 2003-10-21 Seiko Epson Corporation Methods and apparatus for controlling an input or output device over the internet
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
TWI383692B (zh) * 2008-10-17 2013-01-21 Wistron Corp 電子裝置之麥克風測試方法與系統
US8516316B2 (en) 2009-03-26 2013-08-20 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for diagnosing an integrated circuit
US11143703B2 (en) * 2018-09-28 2021-10-12 Marvell Israel (M.I.S.L) Ltd. Method and apparatus for testing a multi-die integrated circuit device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4701921A (en) * 1985-10-23 1987-10-20 Texas Instruments Incorporated Modularized scan path for serially tested logic circuit
US4947395A (en) * 1989-02-10 1990-08-07 Ncr Corporation Bus executed scan testing method and apparatus
JP2676169B2 (ja) * 1989-12-27 1997-11-12 三菱電機株式会社 スキャンパス回路
US5198759A (en) * 1990-11-27 1993-03-30 Alcatel N.V. Test apparatus and method for testing digital system
US5400345A (en) * 1992-03-06 1995-03-21 Pitney Bowes Inc. Communications system to boundary-scan logic interface
US5416783A (en) * 1993-08-09 1995-05-16 Motorola, Inc. Method and apparatus for generating pseudorandom numbers or for performing data compression in a data processor

Also Published As

Publication number Publication date
EP0661551A3 (en) 1999-03-03
CA2135680C (en) 1999-02-02
TW251352B (https=) 1995-07-11
JPH08226954A (ja) 1996-09-03
EP0661551A2 (en) 1995-07-05
KR950019756A (ko) 1995-07-24
CA2135680A1 (en) 1995-06-24
US5535222A (en) 1996-07-09

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