KR0136992B1 - Magnet valve & lamp checking method - Google Patents

Abstract

The present invention relates to an ACT (Air Controlled Transmission) system. In the conventional A-C system, the driver shifts gears for gear shifting, and accordingly, the ECU is commanded. Even if it got down, it was impossible to know whether this command was delivered to the magnet valve, and since it was not possible to detect when the failure of the magnet valve port occurred, the stability and reliability of the system There was a problem of deterioration.

Therefore, the present invention determines whether the operation of the magnet valve and the lamp is correctly controlled from the microcomputer, and if a failure occurs in the magnet valve and the lamp, it is fed back to the microcomputer so that it is possible to know which magnet valve and the lamp has occurred. -Increase the stability and reliability of the tee system.

Description

Magnetic valve and lamp checking method and circuit

1 is a circuit diagram for checking the magnet valve and the lamp of the present invention,

2 is a flow chart for the inspection method of the magnet valve and the lamp of the present invention,

3 is a flowchart of another embodiment of the present invention for a method of checking a magnet valve and a lamp,

4 is a flow chart of another embodiment of the invention for a method of checking a magnet valve and a lamp.

* Explanation of symbols for the main parts of the drawings

10: transistor drive unit 20: magnet valve and lamp drive unit

30: magnet valve portion 40: lamp portion

50: magnet valve and lamp inspection unit 60: microcomputer

TR ₁ -TR ₈ : Transistor MV ₁ -MV ₆ : Magnet valve

LAMP ₁ -LAMP ₂ : Lamp R _1- R ₂₄ : Resistance

D ₁ -D ₆ : Diode

The present invention relates to an inspection method for controlling the operation state of a magnet valve and a lamp and a circuit thereof. In particular, when a fail occurs after determining whether the operation of the magnet valve and the lamp is correctly controlled from the microcomputer, a feedback is returned to the microcomputer. The present invention relates to a magnet valve and lamp inspection method and a circuit for identifying a magnet valve and a lamp port in which a failure occurs.

In the conventional air controlled transmission (ACT) system, when the driver shifts for gear shifting, the electronic control unit (ECU) commands a corresponding shift operation. It is supposed to be.

However, such a conventional ACT system has an electronic control unit adapted to the driver's operation.

There was a disadvantage that the driver could not know whether the command was sent to the magnet valve, and the electronic control unit (ECU) could not detect the failure of the magnet valve port. It was a problem that the reliability is lowered.

Accordingly, the present invention has been proposed to solve various problems occurring in the conventional ACT system as described above. The present invention determines whether the operation of the magnet valve and the lamp is correctly controlled from the microcomputer and generates a fail in the magnet valve and the lamp port. This method provides a method and circuit for checking magnet valves and lamps to improve the stability and reliability of A-C system by feeding back to the microcomputer to identify which magnet valves and lamp ports have failed. Its purpose is to.

Hereinafter, with reference to the accompanying drawings, preferred embodiments 1 to 4 of the present invention for achieving the above object is as follows.

FIG. 1 is a circuit diagram for checking a magnet valve and a lamp according to the present invention, and outputs a magnet valve and lamp driving signal or checks which magnet valve and lamp have a failure when a failure occurs in the magnet valve and the lamp. And a transistor driver 10 for receiving a magnet valve and a lamp driving signal output from the microcomputer 60 to generate a drive signal for operating the magnet valve and the lamp driving transistor, and outputting the transistor driver 10 from the transistor driver 10. The magnet valve and the lamp driver 20 for driving the magnet valve and the lamp driving transistor according to the transistor driving signal, and the magnet valve for driving the magnet valve and the lamp according to the operation of the transistors in the magnet valve and the lamp driver 20. The part 30 and the lamp part 40 and the said mug A magnet valve is connected to a mutual control line between the valve and lamp driver 20, the magnet valve unit 30, and the lamp unit 40, and detects a signal of the control line when the transistor in the magnet valve and the lamp driver 20 operates. And a magnet valve and a lamp checking unit 50 which transmits the failure signal of the lamp port to the microcomputer 60.

In the above, the magnet valve and the lamp driver 20 includes a plurality of resistors R _1- R ₁₆ and a resistor R _1- R ₆ for dividing the transistor composition signal output from the transistor driver 10, respectively. And a plurality of transistors (TR _1- TR ₈ ) driven at a voltage divided by.

In addition, the magnet valve unit 30 includes a reverse current prevention diode (D1-D6), and a plurality of magnet valves (MV ₁ ) driven when the transistors TR ₁ -TR _{6 in} the magnet valve and the lamp driver 20 operate. -MV ₆ ).

In addition, the lamp unit 40 includes the lamps LAMP ₁ and LAMP _{2 that} are turned on when the transistors TR _{7 to} TR ₈ in the magnet valve and the lamp driver 20 are operated.

2 is a flowchart illustrating a method of inspecting a magnet valve and a lamp according to the present invention.

As shown therein, the magnet valve and the lamp driving transistor (TR ₁ -TR ₈ ) outputting the driving signal through the terminals (PC _0- PC _1- PC ₂ ) outputting the driving signal for driving the magnet valve and the lamp. Driving);

Providing a signal for selecting the magnet valve and the lamp to be inspected by the magnet valve and the lamp inspection unit;

Selecting a magnet valve and a lamp to be checked and receiving a check signal output from the magnet valve and lamp checking unit;

Searching the input check signal and determining whether there is an abnormality of a magnet valve or a lamp selected as a result value and an abnormality of a driving transistor.

The operation and method of the magnet valve and the lamp inspection circuit according to the present invention configured and made as described above will be described in detail with reference to FIGS. 1 and 2 as follows.

First, the microcomputer 60 outputs the magnet valve and the lamp driving signal to check whether the magnet valves MV _{1 to} MV ₆ and the lamps LAMP _{1 to} LAMP ₂ drive transistors TR _{1 to} TR ₈ are abnormal. The output terminal (PC _0- PC ₂ ) outputs a high signal (H).

When a high signal is output to the output terminals PC _0- PC ₂ , the transistor driver 10 outputs 8-bit high to the data terminals B _0- B ₇ that output a transistor driving signal based on the applied high signal. The signal is output (step 1).

The 8-bit high signal thus output is divided through the resistors R _1- R ₁₆ in the magnet valve and the lamp driver 20 and applied to the base side of the transistors TR _1- TR ₈ connected to the corresponding resistors, respectively. Transistors TR _{1 to} TR ₈ are driven (step 2).

As the transistors TR _{1 to} TR _{8 in} the magnet valve and the lamp driver 20 are driven, a plurality of magnet valves MV _{1 to} MV ₆ in the magnet valve unit 30 are driven, and at the same time, the lamp unit ( The lamps LAMP ₁ and LAMP _{2 in} 40 are lit.

In this state, in order to check whether the magnet valves MV1-MV ₆ and the lamps LAMP1-LAMP ₂ fail or the transistors driving the magnet valves and the lamps, the terminals generating the magnet valves and the lamp selection signal ( PC _4- PC ₇ to generate a selection signal indicating the magnet valve and the lamp to be checked (step 3).

As the transistors TR _{1 to} TR ₈ are driven by the magnet valve and lamp selection signals, the plurality of magnet valves and the lamp checking unit 50 in the magnet valve unit 30 select a magnet valve and a lamp to be checked. And driving the selected magnet valve and lamp driving signal to the input terminal PC ₃ of the microcomputer 60 to drive the magnet valve and the lamp selected by the microcomputer 60, or to drive the magnet valve and the lamp. It is possible to confirm whether or not the transistor is abnormal (step 4).

That is, the magnet valve and the lamp checker 50 are connected such that each of the input ports D ₀ -D ₇ correspond to the collector terminals of the driving transistors TR _1- TR ₇ one-to-one, respectively. When the magnet valve and the lamp to be checked by the microcomputer 60 are selected, the output of the collector terminal of the driving transistors TR _{1 to} TR ₇ of the selected magnet valve or lamp is output to the input terminal PC ₃ of the microcomputer 60. ) As a check signal (D ₀ -D ₇ ).

When the check signal (D _0- D ₇ ) of the selected magnet valve or lamp is transmitted to the microcomputer 60, the microcomputer 60 searches for the input check signal (D _0- D ₇ ) for the corresponding driving. It is determined whether the transistor is abnormal.

That is, the microcomputer 60 searches for a signal input to the port PC ₃ while the magnet valve or lamp to be checked is selected, and if the signal is a low signal, the microcomputer 60 determines that the selected magnet valve and lamp driving transistor are normal. In order to check another magnet valve and lamp driving transistor, the method returns to step 3 to select the magnet valve and lamp to be checked again (steps 5 and 8).

If the check signal corresponding to the selected magnet valve and lamp is a high signal, it is determined that an error has occurred in the selected magnet valve or lamp driving transistor, and the unique number (ID) of the transistor in which the error occurs is stored in the memory. To store it for future reference (steps 5 to 7).

For example, if the magnet valve and the lamp driving transistor to be checked by the microcomputer 60 are TR1, the magnet valve and the lamp checking unit 50 may be configured to include the transistor TR1 of the plurality of input terminals D0-D7. The input signal of the input terminal D0 connected to the collector terminal is transmitted to the input terminal PC ₃ of the microcomputer 60 as a check signal.

In this case, when the transistor TR1 is normally driven, the power supply V flows through the magnet valve MV1 and is driven. When everything is normally driven, the input signal of the input terminal D0 is low. It becomes a signal.

However, when an error occurs in the transistor TR1 and the transistor TR1 does not operate or an error occurs in the magnet valve MV1, current does not flow to the magnet valve MV1, and thus the input terminal ( The signal input to D0) becomes a high signal.

Therefore, since the check signal of the corresponding driving transistor when the above abnormality is generated is also input to the input terminal PC ₃ of the microcomputer 60 as a high signal, the microcomputer 60 causes an abnormality in any driving transistor. It will be easy to see if it is.

On the other hand, although not shown in the drawing, when the driver transistor is abnormal as a result of the inspection of the driver transistor in the microcomputer 60, the driver by warning through the display (liquid crystal display unit) or the warning sound transmitting and hearing warning by hearing It is easy to check where the failure occurred.

When the inspection of all the driving transistors to be checked in this process is finished, the microcomputer 60 ends the inspection operation.

On the other hand, Figure 3 is a flow chart of another embodiment of the inspection method of the magnet valve and the lamp according to the present invention, which is a magnet valve and when the ON signal is output from the driving transistor (TR _1- TR ₈ ) (step 1) Check whether the signal of the input terminal D0 of the lamp check unit 50 is low (step 2), otherwise process the output terminal of the driving transistor TR ₁ as an error (step 3). If the signal of the input terminal D0 is low, then it is checked whether the signal of the input terminal D ₁ is low (step 4). If not _, the output terminal of the composition transistor TR ₂ is treated as an error. In step 5, if the signal of the input terminal D ₁ is low, the input signal of the next input terminal D ₂ is searched for. In this process, the input signal of all the input terminals D0-D7 is searched by the microcomputer 60 to check whether there is an abnormality in the driving transistor output terminal (step 7).

When an OFF signal is output from the driving transistors TR _1- TR ₈ (step 8), it is checked whether the signal of the input terminal D ₀ is high (step 9). The output terminal of the driving transistor TR ₁ is treated as an error (step 10), and if the signal of the input terminal D ₀ is high, all the input terminals are checked by checking whether the next input terminal D ₁ is high. The input signal of (D ₀ -D ₇ ) is searched to determine whether an output terminal error of the driving transistor is detected (steps 11 to 12).

4 is a flowchart of another embodiment of the method for checking the magnet valve and the lamp according to the present invention, in which the transistor TR ₁ is turned on by the output of the arbitrary transistors TR _1- TR ₈ (step 1). ON) checks whether the output (step 2), if not, checks whether or not the input terminal (D0) is high (step 3) if not the output terminal of the driving transistor TR1 as an error ( Step 4), if the driving transistor TR ₁ is on output, check whether the signal of the input terminal D ₀ is low (step 5), and if not, output terminal of the driving transistor TR ₁ . Is treated as an error (step 4), and if the driving transistor TR ₁ is on output, it is checked whether the signal of the input terminal D ₀ is low (step 5). processing the output of the TR ₁₎ as an error (step 4), the Check the jacks whether (D ₀₎ is a signal output the driving transistor (TR ₂₎ for back-low-one (step 6), or on-check to whether the signal on the input terminal (D ₁₎ High (step 7), and not a high confirmed whether or not applied to the signal of the drive process for an output terminal of the transistor (TR ₂₎ as an error (step 8), and on when the input terminal (D ₁₎ for the low (step 9) If not low, the output terminal of the driving transistor TR ₂ is treated as an error.

In this way, the signals of all the input terminals D ₂ -D ₇ are searched to check the state of the driving transistors TR _3- TR ₈ .

As described above, in the present invention, when a command generated from the electronic control unit is delivered to the magnet valve, the fail is returned to the microcomputer to determine which magnet valve and lamp generate the fail. To improve the stability and reliability of the S-Tee system.

Claims (5)

Magnet valve and lamp driving transistor TR1 by outputting a driving signal through the terminals PC ₀ -PC ₁ -PC ₂ for outputting driving signals for driving the magnet valves MV1-MV6 and the lamps LAMP1, LAMP2. -TR8); Providing a signal for selecting the magnet valve and the lamp to be checked to the magnet valve and the lamp checking unit 50; Selecting a magnet valve and a lamp to be checked and receiving a check signal (D0-D7) output from the magnet valve and lamp checker (50); Searching for the input check signal (D0-D7) and determining whether there is a magnet valve or lamp selected as a result value and whether there is an abnormality of a driving transistor. The microcomputer 60 outputs the magnet valve and the lamp driving signal or checks which magnet valve and the lamp have failed when the magnet valve and the lamp fail, and the magnet valve and the lamp driving signal output from the microcomputer 60. The transistor driver 10 generates a driving signal for operating the magnet valves and the lamp driving transistors TR1-TR8 by receiving a signal, and the magnet valve and the lamp driving according to the transistor driving signal output from the transistor driver 10. A magnet valve and lamp driver 20 for driving the transistor for use, a magnet valve 30 and a lamp unit 40 for driving the magnet valve and the lamp according to the operation of the transistors in the magnet valve and the lamp driver 20, and Between the magnet valve and the lamp driving unit 20 and the magnet valve unit 30 and the lamp unit 40 And a magnet valve and a lamp checking unit 50 connected to the mutual control line of the magnet valve and detecting the signal of the control line and transmitting the signal of the control line to the microcomputer 60 during the operation of the transistor in the magnet valve and the lamp driving unit 20. Magnet valve and lamp check circuit. 2. The transistor of claim 1, wherein when the transistors TR1 to TR8 are on output, the input signal of the input terminal D ₀ of the magnet valve and lamp check unit 50 is low. A processing step of processing the output terminal of ₁ ) as an error, and if the input signal of the input terminal D ₀ is low, it is checked whether the input signal of the next input terminal D ₁ is low. TR ₂ ) processing the output stage as an error, and repeating the above steps to check the input signals of all the input terminals D ₂ -D ₇ to check the output stages of the remaining transistors TR _3- TR _8. Magnetic valve and lamp inspection method characterized in that consisting of steps. The input terminal D ₀ of the magnet valve and lamp check unit 50 according to claim 1, wherein the output of any of the transistors TR1-TR8 confirms whether or not the transistor TR ₁ is on _. A process of processing the output terminal of the transistor TR ₁ as an error by checking whether the input signal of the input signal is high or not, and inputting the input terminal D ₀ if the transistor TR ₁ is on output. If it is low by checking whether the signal is low or not, it is checked whether the transistor TR ₂ is on output. If not, if it is not on, it is again checked whether the input signal of the input terminal D ₁ is high. TR ₂ ) processing the output terminal as an error, and repeating the above process to search the input signal of all the input terminals (D ₂ -D ₇ ) of the magnet valve and lamp check unit 50 to drive the transformer Magnet valve and lamp checking method comprising the step of searching for the output terminal of the jitter (TR ₃ -TR ₈₎ . The magnet valve and the lamp driver 20 includes a plurality of resistors R1-R16 and a resistor R1-R16 for dividing a transistor driving signal output from the transistor driver 10, respectively. And a plurality of transistors (TR ₁ -TR ₈ ) driven by the divided voltages.