JPWO2025115438A1 - - Google Patents

Info

Publication number
JPWO2025115438A1
JPWO2025115438A1 JP2025521123A JP2025521123A JPWO2025115438A1 JP WO2025115438 A1 JPWO2025115438 A1 JP WO2025115438A1 JP 2025521123 A JP2025521123 A JP 2025521123A JP 2025521123 A JP2025521123 A JP 2025521123A JP WO2025115438 A1 JPWO2025115438 A1 JP WO2025115438A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025521123A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2025115438A1 publication Critical patent/JPWO2025115438A1/ja
Priority to JP2025188923A priority Critical patent/JP2026012442A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
    • G03F1/24Reflection masks; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
JP2025521123A 2023-11-27 2024-10-16 Pending JPWO2025115438A1 (https=)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025188923A JP2026012442A (ja) 2023-11-27 2025-11-10 反射型マスクブランク、反射型マスク、反射型マスクの製造方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023199954 2023-11-27
PCT/JP2024/036843 WO2025115438A1 (ja) 2023-11-27 2024-10-16 反射型マスクブランク、反射型マスク、反射型マスクの製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025188923A Division JP2026012442A (ja) 2023-11-27 2025-11-10 反射型マスクブランク、反射型マスク、反射型マスクの製造方法

Publications (1)

Publication Number Publication Date
JPWO2025115438A1 true JPWO2025115438A1 (https=) 2025-06-05

Family

ID=95897295

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2025521123A Pending JPWO2025115438A1 (https=) 2023-11-27 2024-10-16
JP2025188923A Pending JP2026012442A (ja) 2023-11-27 2025-11-10 反射型マスクブランク、反射型マスク、反射型マスクの製造方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025188923A Pending JP2026012442A (ja) 2023-11-27 2025-11-10 反射型マスクブランク、反射型マスク、反射型マスクの製造方法

Country Status (3)

Country Link
JP (2) JPWO2025115438A1 (https=)
TW (1) TW202538394A (https=)
WO (1) WO2025115438A1 (https=)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220121105A1 (en) * 2019-02-07 2022-04-21 Asml Netherlands B.V. A patterning device and method of use thereof
WO2023112767A1 (ja) * 2021-12-13 2023-06-22 Agc株式会社 反射型マスクブランク、反射型マスク、反射型マスクブランクの製造方法、及び反射型マスクの製造方法
WO2023190696A1 (ja) * 2022-03-29 2023-10-05 株式会社トッパンフォトマスク 反射型フォトマスクブランク及び反射型フォトマスク
JP2023168532A (ja) * 2022-04-28 2023-11-24 Agc株式会社 反射型マスクブランク

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220121105A1 (en) * 2019-02-07 2022-04-21 Asml Netherlands B.V. A patterning device and method of use thereof
WO2023112767A1 (ja) * 2021-12-13 2023-06-22 Agc株式会社 反射型マスクブランク、反射型マスク、反射型マスクブランクの製造方法、及び反射型マスクの製造方法
WO2023190696A1 (ja) * 2022-03-29 2023-10-05 株式会社トッパンフォトマスク 反射型フォトマスクブランク及び反射型フォトマスク
JP2023168532A (ja) * 2022-04-28 2023-11-24 Agc株式会社 反射型マスクブランク

Also Published As

Publication number Publication date
TW202538394A (zh) 2025-10-01
JP2026012442A (ja) 2026-01-23
WO2025115438A1 (ja) 2025-06-05

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