JPWO2025074707A1 - - Google Patents

Info

Publication number
JPWO2025074707A1
JPWO2025074707A1 JP2025550764A JP2025550764A JPWO2025074707A1 JP WO2025074707 A1 JPWO2025074707 A1 JP WO2025074707A1 JP 2025550764 A JP2025550764 A JP 2025550764A JP 2025550764 A JP2025550764 A JP 2025550764A JP WO2025074707 A1 JPWO2025074707 A1 JP WO2025074707A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025550764A
Other languages
Japanese (ja)
Other versions
JPWO2025074707A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2025074707A1 publication Critical patent/JPWO2025074707A1/ja
Publication of JPWO2025074707A5 publication Critical patent/JPWO2025074707A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34—Testing dynamo-electric machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/72—Testing of electric windings
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02K—DYNAMO-ELECTRIC MACHINES
    • H02K15/00—Processes or apparatus specially adapted for manufacturing, assembling, maintaining or repairing of dynamo-electric machines
    • H02K15/04—Processes or apparatus specially adapted for manufacturing, assembling, maintaining or repairing of dynamo-electric machines of windings prior to their mounting into the machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2025550764A 2023-10-05 2024-07-17 Pending JPWO2025074707A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023173439 2023-10-05
PCT/JP2024/025561 WO2025074707A1 (ja) 2023-10-05 2024-07-17 巻線の欠陥検査装置、巻線の欠陥検査システムおよび巻線の欠陥検査方法

Publications (2)

Publication Number Publication Date
JPWO2025074707A1 true JPWO2025074707A1 (https=) 2025-04-10
JPWO2025074707A5 JPWO2025074707A5 (https=) 2026-01-22

Family

ID=95282951

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025550764A Pending JPWO2025074707A1 (https=) 2023-10-05 2024-07-17

Country Status (2)

Country Link
JP (1) JPWO2025074707A1 (https=)
WO (1) WO2025074707A1 (https=)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3096478A (en) * 1959-08-18 1963-07-02 Okonite Co Apparatus with conductive gas electrodes for detecting non-uniformity in electrically insulating and electrically semi-conducting materials
US5015959A (en) * 1990-01-05 1991-05-14 Westinghouse Electric Corp. Sense wire signal enhancements for insulation defect detection
JPH0618604A (ja) * 1992-06-29 1994-01-28 Hitachi Cable Ltd 電力ケーブルの絶縁劣化診断方法および欠陥検出方法
JP2000340925A (ja) * 1999-05-31 2000-12-08 Micro Craft Kk プリント配線基板検査装置
JP4980383B2 (ja) * 2009-01-26 2012-07-18 アール・ビー・コントロールズ株式会社 イオン発生装置の検査用治具
CN102053106B (zh) * 2009-11-09 2013-03-27 中芯国际集成电路制造(上海)有限公司 一种缺陷检测方法
JP7523403B2 (ja) * 2021-04-09 2024-07-26 株式会社日立製作所 絶縁劣化診断モデル作成装置、絶縁劣化診断装置、及び絶縁劣化診断方法
JP7668892B2 (ja) * 2021-10-13 2025-04-25 三菱電機株式会社 巻線欠陥検査装置、巻線欠陥検査装置を使用した電気機械の製造方法、及び巻線欠陥検査方法
JP7651062B2 (ja) * 2022-03-08 2025-03-25 三菱電機株式会社 コイル製造装置、コイル製造方法、ステーター製造方法および回転電機製造方法

Also Published As

Publication number Publication date
WO2025074707A1 (ja) 2025-04-10

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Legal Events

Date Code Title Description
A521 Request for written amendment filed

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Effective date: 20251017

A621 Written request for application examination

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Effective date: 20251017