JPWO2025028283A1 - - Google Patents
Info
- Publication number
- JPWO2025028283A1 JPWO2025028283A1 JP2025537837A JP2025537837A JPWO2025028283A1 JP WO2025028283 A1 JPWO2025028283 A1 JP WO2025028283A1 JP 2025537837 A JP2025537837 A JP 2025537837A JP 2025537837 A JP2025537837 A JP 2025537837A JP WO2025028283 A1 JPWO2025028283 A1 JP WO2025028283A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023125997 | 2023-08-02 | ||
| PCT/JP2024/025774 WO2025028283A1 (ja) | 2023-08-02 | 2024-07-18 | パワー半導体測定装置およびプローブ治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2025028283A1 true JPWO2025028283A1 (https=) | 2025-02-06 |
| JPWO2025028283A5 JPWO2025028283A5 (https=) | 2025-10-22 |
Family
ID=94395096
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025537837A Pending JPWO2025028283A1 (https=) | 2023-08-02 | 2024-07-18 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2025028283A1 (https=) |
| WO (1) | WO2025028283A1 (https=) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11133060A (ja) * | 1997-10-31 | 1999-05-21 | Tani Denki Kogyo Kk | テスト用端子 |
| WO2004102207A1 (ja) * | 2003-05-13 | 2004-11-25 | Kabushiki Kaisha Nihon Micronics | 通電試験用プローブ |
| JP2013171005A (ja) * | 2012-02-22 | 2013-09-02 | Micronics Japan Co Ltd | 非接触型プローブカード |
| JP2016148566A (ja) * | 2015-02-12 | 2016-08-18 | 日本電子材料株式会社 | プローブカード |
| JP2017142220A (ja) * | 2016-02-10 | 2017-08-17 | インクス株式会社 | パワー半導体用プローブ装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002365308A (ja) * | 2001-06-08 | 2002-12-18 | Japan Electronic Materials Corp | 垂直ブレード型プローブ、垂直ブレード型プローブユニット及びそれを用いた垂直ブレード型プローブカード |
| KR100651694B1 (ko) * | 2005-03-22 | 2006-12-01 | 주식회사 씨어테크 | 웨이퍼 검사용 프로브카드 |
| JP5096737B2 (ja) * | 2006-12-14 | 2012-12-12 | 株式会社日本マイクロニクス | プローブおよびその製造方法 |
| JP2009063381A (ja) * | 2007-09-05 | 2009-03-26 | Japan Electronic Materials Corp | プローブ |
| CN208520905U (zh) * | 2018-07-18 | 2019-02-19 | 罗日伟 | 一种fpc测试用的探针 |
-
2024
- 2024-07-18 JP JP2025537837A patent/JPWO2025028283A1/ja active Pending
- 2024-07-18 WO PCT/JP2024/025774 patent/WO2025028283A1/ja active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11133060A (ja) * | 1997-10-31 | 1999-05-21 | Tani Denki Kogyo Kk | テスト用端子 |
| WO2004102207A1 (ja) * | 2003-05-13 | 2004-11-25 | Kabushiki Kaisha Nihon Micronics | 通電試験用プローブ |
| JP2013171005A (ja) * | 2012-02-22 | 2013-09-02 | Micronics Japan Co Ltd | 非接触型プローブカード |
| JP2016148566A (ja) * | 2015-02-12 | 2016-08-18 | 日本電子材料株式会社 | プローブカード |
| JP2017142220A (ja) * | 2016-02-10 | 2017-08-17 | インクス株式会社 | パワー半導体用プローブ装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2025028283A1 (ja) | 2025-02-06 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20250808 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20250808 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20260407 |