JPWO2024252892A1 - - Google Patents

Info

Publication number
JPWO2024252892A1
JPWO2024252892A1 JP2025526030A JP2025526030A JPWO2024252892A1 JP WO2024252892 A1 JPWO2024252892 A1 JP WO2024252892A1 JP 2025526030 A JP2025526030 A JP 2025526030A JP 2025526030 A JP2025526030 A JP 2025526030A JP WO2024252892 A1 JPWO2024252892 A1 JP WO2024252892A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025526030A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2024252892A1 publication Critical patent/JPWO2024252892A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02PCONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORS OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS
    • H02P31/00Arrangements for regulating or controlling electric motors not provided for in groups H02P1/00 - H02P5/00, H02P7/00 or H02P21/00 - H02P29/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Data Mining & Analysis (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2025526030A 2023-06-07 2024-05-16 Pending JPWO2024252892A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023093803 2023-06-07
PCT/JP2024/018246 WO2024252892A1 (ja) 2023-06-07 2024-05-16 情報処理方法、情報処理装置、及びプログラム

Publications (1)

Publication Number Publication Date
JPWO2024252892A1 true JPWO2024252892A1 (https=) 2024-12-12

Family

ID=93795350

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025526030A Pending JPWO2024252892A1 (https=) 2023-06-07 2024-05-16

Country Status (4)

Country Link
US (1) US20260099139A1 (https=)
JP (1) JPWO2024252892A1 (https=)
CN (1) CN121241510A (https=)
WO (1) WO2024252892A1 (https=)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6932160B2 (ja) * 2019-07-22 2021-09-08 株式会社安川電機 機械学習方法及び産業用機器のパラメータ又は産業用機器により制御される機器の内部状態の推定方法
JP7469991B2 (ja) * 2020-08-21 2024-04-17 株式会社日立製作所 診断装置及びパラメータ調整方法

Also Published As

Publication number Publication date
CN121241510A (zh) 2025-12-30
US20260099139A1 (en) 2026-04-09
WO2024252892A1 (ja) 2024-12-12

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