JPWO2024218906A1 - - Google Patents

Info

Publication number
JPWO2024218906A1
JPWO2024218906A1 JP2025514964A JP2025514964A JPWO2024218906A1 JP WO2024218906 A1 JPWO2024218906 A1 JP WO2024218906A1 JP 2025514964 A JP2025514964 A JP 2025514964A JP 2025514964 A JP2025514964 A JP 2025514964A JP WO2024218906 A1 JPWO2024218906 A1 JP WO2024218906A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2025514964A
Other languages
Japanese (ja)
Other versions
JP7781345B2 (ja
JPWO2024218906A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2024218906A1 publication Critical patent/JPWO2024218906A1/ja
Publication of JPWO2024218906A5 publication Critical patent/JPWO2024218906A5/ja
Application granted granted Critical
Publication of JP7781345B2 publication Critical patent/JP7781345B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • G05B23/0248—Causal models, e.g. fault tree; digraphs; qualitative physics
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • G06Q10/063—Operations research, analysis or management
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
    • G06Q50/06—Energy or water supply

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Business, Economics & Management (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Economics (AREA)
  • Human Resources & Organizations (AREA)
  • Strategic Management (AREA)
  • Tourism & Hospitality (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Theoretical Computer Science (AREA)
  • General Business, Economics & Management (AREA)
  • Marketing (AREA)
  • Health & Medical Sciences (AREA)
  • Primary Health Care (AREA)
  • General Health & Medical Sciences (AREA)
  • Water Supply & Treatment (AREA)
  • Development Economics (AREA)
  • Educational Administration (AREA)
  • Public Health (AREA)
  • Game Theory and Decision Science (AREA)
  • Operations Research (AREA)
  • Quality & Reliability (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2025514964A 2023-04-19 2023-04-19 監視制御装置 Active JP7781345B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2023/015628 WO2024218906A1 (ja) 2023-04-19 2023-04-19 監視制御装置および監視制御システム

Publications (3)

Publication Number Publication Date
JPWO2024218906A1 true JPWO2024218906A1 (https=) 2024-10-24
JPWO2024218906A5 JPWO2024218906A5 (ja) 2025-07-02
JP7781345B2 JP7781345B2 (ja) 2025-12-05

Family

ID=93152458

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025514964A Active JP7781345B2 (ja) 2023-04-19 2023-04-19 監視制御装置

Country Status (5)

Country Link
US (1) US20260111020A1 (https=)
JP (1) JP7781345B2 (https=)
CN (1) CN120958402A (https=)
DE (1) DE112023005803T5 (https=)
WO (1) WO2024218906A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7682423B1 (ja) * 2024-11-13 2025-05-23 三菱電機株式会社 データ管理装置及びデータ管理システム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018073955A1 (ja) * 2016-10-21 2018-04-26 日本電気株式会社 システム分析方法、システム分析装置、および、プログラム
JP2020052714A (ja) * 2018-09-27 2020-04-02 株式会社日立製作所 監視システム及び監視方法
WO2021241576A1 (ja) * 2020-05-29 2021-12-02 株式会社ダイセル 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4882239B2 (ja) * 2005-02-16 2012-02-22 東京エレクトロン株式会社 半導体製造装置、コンピュータプログラム及び記憶媒体
JP6991833B2 (ja) * 2017-10-31 2022-01-13 株式会社日立製作所 因果関係モデル構築システムおよび方法
JP7237029B2 (ja) * 2020-02-12 2023-03-10 三菱電機株式会社 監視制御装置
JP7188470B2 (ja) * 2021-01-28 2022-12-13 横河電機株式会社 分析方法、分析プログラムおよび情報処理装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018073955A1 (ja) * 2016-10-21 2018-04-26 日本電気株式会社 システム分析方法、システム分析装置、および、プログラム
JP2020052714A (ja) * 2018-09-27 2020-04-02 株式会社日立製作所 監視システム及び監視方法
WO2021241576A1 (ja) * 2020-05-29 2021-12-02 株式会社ダイセル 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

Also Published As

Publication number Publication date
DE112023005803T5 (de) 2025-12-11
US20260111020A1 (en) 2026-04-23
WO2024218906A1 (ja) 2024-10-24
JP7781345B2 (ja) 2025-12-05
CN120958402A (zh) 2025-11-14

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