JPWO2024201700A1 - - Google Patents
Info
- Publication number
- JPWO2024201700A1 JPWO2024201700A1 JP2025509323A JP2025509323A JPWO2024201700A1 JP WO2024201700 A1 JPWO2024201700 A1 JP WO2024201700A1 JP 2025509323 A JP2025509323 A JP 2025509323A JP 2025509323 A JP2025509323 A JP 2025509323A JP WO2024201700 A1 JPWO2024201700 A1 JP WO2024201700A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2023/012443 WO2024201700A1 (ja) | 2023-03-28 | 2023-03-28 | 測定装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024201700A1 true JPWO2024201700A1 (https=) | 2024-10-03 |
Family
ID=92904291
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025509323A Pending JPWO2024201700A1 (https=) | 2023-03-28 | 2023-03-28 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024201700A1 (https=) |
| WO (1) | WO2024201700A1 (https=) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56159769U (https=) * | 1980-04-30 | 1981-11-28 | ||
| JPS62106170U (https=) * | 1985-12-23 | 1987-07-07 | ||
| JPS63172969A (ja) * | 1987-01-12 | 1988-07-16 | Matsushita Electric Ind Co Ltd | チツプ抵抗器の抵抗値測定方法 |
| JP2001153907A (ja) * | 1999-11-24 | 2001-06-08 | Hitachi Metals Ltd | 電気特性測定方法及びワーク保持具 |
| JP4115456B2 (ja) * | 2004-02-25 | 2008-07-09 | 三洋電機株式会社 | 固体電解コンデンサの測定装置 |
| JP4396429B2 (ja) * | 2004-07-16 | 2010-01-13 | Ｊｓｒ株式会社 | 回路基板の検査装置および回路基板の検査方法 |
| CN206362826U (zh) * | 2016-12-09 | 2017-07-28 | 北京元六鸿远电子科技股份有限公司 | 一种用于片式电子元器件测试的通用测试座 |
| JP7158753B2 (ja) * | 2020-09-22 | 2022-10-24 | 株式会社Fuji | 検査装置及び電子部品実装機 |
| CN213423260U (zh) * | 2020-10-31 | 2021-06-11 | 惠州市德立电子有限公司 | 一种可靠性高的底部测试接触治具 |
-
2023
- 2023-03-28 JP JP2025509323A patent/JPWO2024201700A1/ja active Pending
- 2023-03-28 WO PCT/JP2023/012443 patent/WO2024201700A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024201700A1 (ja) | 2024-10-03 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260205 |