JPWO2024171430A1 - - Google Patents

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Publication number
JPWO2024171430A1
JPWO2024171430A1 JP2024559595A JP2024559595A JPWO2024171430A1 JP WO2024171430 A1 JPWO2024171430 A1 JP WO2024171430A1 JP 2024559595 A JP2024559595 A JP 2024559595A JP 2024559595 A JP2024559595 A JP 2024559595A JP WO2024171430 A1 JPWO2024171430 A1 JP WO2024171430A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024559595A
Other languages
Japanese (ja)
Other versions
JP7603904B1 (ja
JPWO2024171430A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2024171430A1 publication Critical patent/JPWO2024171430A1/ja
Application granted granted Critical
Publication of JP7603904B1 publication Critical patent/JP7603904B1/ja
Publication of JPWO2024171430A5 publication Critical patent/JPWO2024171430A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02GINSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G1/00Methods or apparatus specially adapted for installing, maintaining, repairing or dismantling electric cables or lines
    • H02G1/02Methods or apparatus specially adapted for installing, maintaining, repairing or dismantling electric cables or lines for overhead lines or cables
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20021Dividing image into blocks, subimages or windows
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Analysis (AREA)
JP2024559595A 2023-02-17 2023-02-17 情報処理装置、検出方法、及び検出プログラム Active JP7603904B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2023/005707 WO2024171430A1 (ja) 2023-02-17 2023-02-17 情報処理装置、検出方法、及び検出プログラム

Publications (3)

Publication Number Publication Date
JPWO2024171430A1 true JPWO2024171430A1 (https=) 2024-08-22
JP7603904B1 JP7603904B1 (ja) 2024-12-20
JPWO2024171430A5 JPWO2024171430A5 (https=) 2025-01-22

Family

ID=92421380

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024559595A Active JP7603904B1 (ja) 2023-02-17 2023-02-17 情報処理装置、検出方法、及び検出プログラム

Country Status (4)

Country Link
US (1) US20250322504A1 (https=)
JP (1) JP7603904B1 (https=)
GB (1) GB2640098B (https=)
WO (1) WO2024171430A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119069182B (zh) * 2024-11-05 2025-04-01 宁波凯特机械有限公司 一种批量绞线方法、系统及智能终端

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3733094B2 (ja) * 2002-08-22 2006-01-11 トヨタ自動車株式会社 良否判定装置、良否判定プログラムおよび良否判定方法
JP4255065B2 (ja) * 2003-08-07 2009-04-15 財団法人電力中央研究所 画像処理による電線異常検出方法および装置およびプログラム並びに電線点検用画像の作成方法
CN110009638B (zh) * 2019-04-12 2023-01-03 重庆交通大学 基于局部统计特征的桥梁拉索图像外观缺陷检测方法
JP2022036054A (ja) * 2020-08-20 2022-03-04 株式会社四国総合研究所 架渉線の点検装置、点検方法及び点検プログラム
CN112015937B (zh) * 2020-08-31 2024-01-19 核工业北京地质研究院 一种图片地理定位方法及系统

Also Published As

Publication number Publication date
US20250322504A1 (en) 2025-10-16
JP7603904B1 (ja) 2024-12-20
GB202509367D0 (en) 2025-07-30
WO2024171430A1 (ja) 2024-08-22
GB2640098B (en) 2026-04-22
GB2640098A (en) 2025-10-08

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