JP7603904B1 - 情報処理装置、検出方法、及び検出プログラム - Google Patents

情報処理装置、検出方法、及び検出プログラム Download PDF

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Publication number
JP7603904B1
JP7603904B1 JP2024559595A JP2024559595A JP7603904B1 JP 7603904 B1 JP7603904 B1 JP 7603904B1 JP 2024559595 A JP2024559595 A JP 2024559595A JP 2024559595 A JP2024559595 A JP 2024559595A JP 7603904 B1 JP7603904 B1 JP 7603904B1
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image
information processing
processing device
threshold
similarities
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JPWO2024171430A1 (https=
JPWO2024171430A5 (https=
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愛梨 守谷
崇文 小池
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02G—INSTALLATION OF ELECTRIC CABLES OR LINES, OR OF COMBINED OPTICAL AND ELECTRIC CABLES OR LINES
    • H02G1/00—Methods or apparatus specially adapted for installing, maintaining, repairing or dismantling electric cables or lines
    • H02G1/02—Methods or apparatus specially adapted for installing, maintaining, repairing or dismantling electric cables or lines for overhead lines or cables
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Analysis (AREA)
JP2024559595A 2023-02-17 2023-02-17 情報処理装置、検出方法、及び検出プログラム Active JP7603904B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2023/005707 WO2024171430A1 (ja) 2023-02-17 2023-02-17 情報処理装置、検出方法、及び検出プログラム

Publications (3)

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JPWO2024171430A1 JPWO2024171430A1 (https=) 2024-08-22
JP7603904B1 true JP7603904B1 (ja) 2024-12-20
JPWO2024171430A5 JPWO2024171430A5 (https=) 2025-01-22

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US (1) US20250322504A1 (https=)
JP (1) JP7603904B1 (https=)
GB (1) GB2640098B (https=)
WO (1) WO2024171430A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119069182B (zh) * 2024-11-05 2025-04-01 宁波凯特机械有限公司 一种批量绞线方法、系统及智能终端

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004085216A (ja) * 2002-08-22 2004-03-18 Toyota Motor Corp 良否判定装置、良否判定プログラムおよび良否判定方法
JP2005057956A (ja) * 2003-08-07 2005-03-03 Central Res Inst Of Electric Power Ind 画像処理による電線異常検出方法および装置およびプログラム並びに電線点検用画像の作成方法
CN110009638A (zh) * 2019-04-12 2019-07-12 重庆交通大学 基于局部统计特征的桥梁拉索图像外观缺陷检测方法
CN112015937A (zh) * 2020-08-31 2020-12-01 核工业北京地质研究院 一种图片地理定位方法及系统
JP2022036054A (ja) * 2020-08-20 2022-03-04 株式会社四国総合研究所 架渉線の点検装置、点検方法及び点検プログラム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004085216A (ja) * 2002-08-22 2004-03-18 Toyota Motor Corp 良否判定装置、良否判定プログラムおよび良否判定方法
JP2005057956A (ja) * 2003-08-07 2005-03-03 Central Res Inst Of Electric Power Ind 画像処理による電線異常検出方法および装置およびプログラム並びに電線点検用画像の作成方法
CN110009638A (zh) * 2019-04-12 2019-07-12 重庆交通大学 基于局部统计特征的桥梁拉索图像外观缺陷检测方法
JP2022036054A (ja) * 2020-08-20 2022-03-04 株式会社四国総合研究所 架渉線の点検装置、点検方法及び点検プログラム
CN112015937A (zh) * 2020-08-31 2020-12-01 核工业北京地质研究院 一种图片地理定位方法及系统

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US20250322504A1 (en) 2025-10-16
JPWO2024171430A1 (https=) 2024-08-22
GB202509367D0 (en) 2025-07-30
WO2024171430A1 (ja) 2024-08-22
GB2640098B (en) 2026-04-22
GB2640098A (en) 2025-10-08

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