JPWO2024053724A1 - - Google Patents
Info
- Publication number
- JPWO2024053724A1 JPWO2024053724A1 JP2024545720A JP2024545720A JPWO2024053724A1 JP WO2024053724 A1 JPWO2024053724 A1 JP WO2024053724A1 JP 2024545720 A JP2024545720 A JP 2024545720A JP 2024545720 A JP2024545720 A JP 2024545720A JP WO2024053724 A1 JPWO2024053724 A1 JP WO2024053724A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/06—Measuring real component; Measuring reactive component
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/175—Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Measuring Phase Differences (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202263404974P | 2022-09-09 | 2022-09-09 | |
| PCT/JP2023/032792 WO2024053724A1 (ja) | 2022-09-09 | 2023-09-08 | 信号処理装置、信号処理方法及びプログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2024053724A1 true JPWO2024053724A1 (https=) | 2024-03-14 |
Family
ID=90191379
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024545720A Pending JPWO2024053724A1 (https=) | 2022-09-09 | 2023-09-08 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2024053724A1 (https=) |
| WO (1) | WO2024053724A1 (https=) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2647221B1 (fr) * | 1989-05-19 | 1991-08-16 | Thomson Csf | Chaine de mesure de la caracteristique de bruit de phase additif d'un composant au voisinage d'une frequence porteuse |
| US6460001B1 (en) * | 2000-03-29 | 2002-10-01 | Advantest Corporation | Apparatus for and method of measuring a peak jitter |
| US6735538B1 (en) * | 2000-03-29 | 2004-05-11 | Advantest Corporation | Apparatus and method for measuring quality measure of phase noise waveform |
| JP2005308512A (ja) * | 2004-04-21 | 2005-11-04 | Agilent Technol Inc | スペクトラム処理方法および該方法を用いる測定装置 |
| US8711992B2 (en) * | 2012-05-31 | 2014-04-29 | Agilent Technologies, Inc. | Phase noise extraction apparatus and technique |
| WO2018044500A1 (en) * | 2016-09-01 | 2018-03-08 | Imra America, Inc. | Ultra low noise photonic phase noise measurement system for microwave signal |
| JP2019158418A (ja) * | 2018-03-08 | 2019-09-19 | アンリツ株式会社 | 測定システム及び測定方法 |
-
2023
- 2023-09-08 WO PCT/JP2023/032792 patent/WO2024053724A1/ja not_active Ceased
- 2023-09-08 JP JP2024545720A patent/JPWO2024053724A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2024053724A1 (ja) | 2024-03-14 |