JPWO2024034168A1 - - Google Patents

Info

Publication number
JPWO2024034168A1
JPWO2024034168A1 JP2024540249A JP2024540249A JPWO2024034168A1 JP WO2024034168 A1 JPWO2024034168 A1 JP WO2024034168A1 JP 2024540249 A JP2024540249 A JP 2024540249A JP 2024540249 A JP2024540249 A JP 2024540249A JP WO2024034168 A1 JPWO2024034168 A1 JP WO2024034168A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024540249A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2024034168A1 publication Critical patent/JPWO2024034168A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0011—Arrangements or instruments for measuring magnetic variables comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/098—Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
JP2024540249A 2022-08-12 2023-03-03 Pending JPWO2024034168A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022128866 2022-08-12
PCT/JP2023/008061 WO2024034168A1 (ja) 2022-08-12 2023-03-03 磁気センサ

Publications (1)

Publication Number Publication Date
JPWO2024034168A1 true JPWO2024034168A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2024-02-15

Family

ID=89851443

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024540249A Pending JPWO2024034168A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2022-08-12 2023-03-03

Country Status (5)

Country Link
US (1) US20250172640A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPWO2024034168A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN (1) CN119404110A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE112023003456T5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (1) WO2024034168A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5244374U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1975-09-25 1977-03-29
JPH08233865A (ja) * 1995-02-28 1996-09-13 Victor Co Of Japan Ltd 電流検知ユニット
JP2002250759A (ja) * 2001-02-26 2002-09-06 Systec:Kk 磁気センサのバイアス構造
JP2007064813A (ja) * 2005-08-31 2007-03-15 Mitsubishi Electric Corp 磁界検出装置およびそれを調整する方法
JP2008020402A (ja) * 2006-07-14 2008-01-31 Asahi Kasei Electronics Co Ltd 電流検出機構
US20110215800A1 (en) * 2010-03-05 2011-09-08 Headway Technologies, Inc. MR sensor with flux guide enhanced hard bias structure
JP2012132889A (ja) * 2010-12-21 2012-07-12 Kohshin Electric Corp 磁気検出装置および電流検出装置
JP2015179042A (ja) * 2014-03-19 2015-10-08 株式会社デンソー 電流センサ
JP2016223825A (ja) * 2015-05-28 2016-12-28 アルプス電気株式会社 磁界検出装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5244374U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1975-09-25 1977-03-29
JPH08233865A (ja) * 1995-02-28 1996-09-13 Victor Co Of Japan Ltd 電流検知ユニット
JP2002250759A (ja) * 2001-02-26 2002-09-06 Systec:Kk 磁気センサのバイアス構造
JP2007064813A (ja) * 2005-08-31 2007-03-15 Mitsubishi Electric Corp 磁界検出装置およびそれを調整する方法
JP2008020402A (ja) * 2006-07-14 2008-01-31 Asahi Kasei Electronics Co Ltd 電流検出機構
US20110215800A1 (en) * 2010-03-05 2011-09-08 Headway Technologies, Inc. MR sensor with flux guide enhanced hard bias structure
JP2012132889A (ja) * 2010-12-21 2012-07-12 Kohshin Electric Corp 磁気検出装置および電流検出装置
JP2015179042A (ja) * 2014-03-19 2015-10-08 株式会社デンソー 電流センサ
JP2016223825A (ja) * 2015-05-28 2016-12-28 アルプス電気株式会社 磁界検出装置

Also Published As

Publication number Publication date
US20250172640A1 (en) 2025-05-29
CN119404110A (zh) 2025-02-07
DE112023003456T5 (de) 2025-05-28
WO2024034168A1 (ja) 2024-02-15

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