JPWO2023243365A1 - - Google Patents

Info

Publication number
JPWO2023243365A1
JPWO2023243365A1 JP2024528652A JP2024528652A JPWO2023243365A1 JP WO2023243365 A1 JPWO2023243365 A1 JP WO2023243365A1 JP 2024528652 A JP2024528652 A JP 2024528652A JP 2024528652 A JP2024528652 A JP 2024528652A JP WO2023243365 A1 JPWO2023243365 A1 JP WO2023243365A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024528652A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023243365A1 publication Critical patent/JPWO2023243365A1/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/10038—Amplitude control
    • H01S3/10046—Pulse repetition rate control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • G01B9/02008—Two or more frequencies or sources used for interferometric measurement by using a frequency comb
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005—Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0057—Temporal shaping, e.g. pulse compression, frequency chirping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/1305—Feedback control systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/1307—Stabilisation of the phase
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • H01S3/136—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling devices placed within the cavity
    • H01S3/137—Stabilisation of laser output parameters, e.g. frequency or amplitude by controlling devices placed within the cavity for stabilising of frequency
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/23—Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Automation & Control Theory (AREA)
  • General Physics & Mathematics (AREA)
  • Lasers (AREA)
JP2024528652A 2022-06-14 2023-05-26 Pending JPWO2023243365A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022095868 2022-06-14
PCT/JP2023/019655 WO2023243365A1 (ja) 2022-06-14 2023-05-26 レーザ装置

Publications (1)

Publication Number Publication Date
JPWO2023243365A1 true JPWO2023243365A1 (https=) 2023-12-21

Family

ID=89191184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024528652A Pending JPWO2023243365A1 (https=) 2022-06-14 2023-05-26

Country Status (5)

Country Link
US (1) US20250096516A1 (https=)
EP (1) EP4542796A4 (https=)
JP (1) JPWO2023243365A1 (https=)
CN (1) CN119301828A (https=)
WO (1) WO2023243365A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2023163018A1 (https=) * 2022-02-24 2023-08-31

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5687261A (en) * 1996-01-24 1997-11-11 California Institute Of Technology Fiber-optic delay-line stabilization of heterodyne optical signal generator and method using same
US8120778B2 (en) 2009-03-06 2012-02-21 Imra America, Inc. Optical scanning and imaging systems based on dual pulsed laser systems
JP5099696B2 (ja) * 2008-03-24 2012-12-19 国立大学法人電気通信大学 広帯域離散スペクトル発生装置、及び、その周波数制御方法
JP5764566B2 (ja) * 2009-10-02 2015-08-19 イムラ アメリカ インコーポレイテッド モード同期レーザによる光信号処理
JP6269213B2 (ja) * 2014-03-19 2018-01-31 アイシン精機株式会社 距離測定装置及び距離測定方法
KR101603909B1 (ko) * 2014-10-02 2016-03-16 광주과학기술원 위상잡음 보상 방법을 이용한 광혼합 방식의 연속파 테라헤르츠 발생 및 검출 장치
CN104316180B (zh) * 2014-11-02 2016-06-01 华东师范大学 基于连续稳频激光的双光学频率梳光学成像方法
US10753801B2 (en) * 2016-12-07 2020-08-25 UNIVERSITé LAVAL Methods for performing dual-comb interferometry using a frequency offset relation
WO2018159445A1 (ja) 2017-02-28 2018-09-07 国立大学法人電気通信大学 光コムの制御方法及び光コムの制御装置
EP3850335B1 (en) * 2018-09-14 2023-08-16 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Particle analysis method and apparatus for a spectrometry-based particle analysis
US11686622B2 (en) * 2019-09-16 2023-06-27 The Regents Of The University Of Colorado, A Body Corporate Systems and methods for dual comb spectroscopy
EP4174569B1 (en) * 2020-06-26 2026-03-11 Panasonic Intellectual Property Management Co., Ltd. Dual optical frequency comb generation device and measurement device
CN113295106B (zh) * 2021-05-26 2022-07-15 清华大学 一种双光梳散斑干涉测量系统及测量方法

Also Published As

Publication number Publication date
EP4542796A4 (en) 2025-09-17
CN119301828A (zh) 2025-01-10
US20250096516A1 (en) 2025-03-20
WO2023243365A1 (ja) 2023-12-21
EP4542796A1 (en) 2025-04-23

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Legal Events

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Effective date: 20260325