JPWO2023234154A1 - - Google Patents
Info
- Publication number
- JPWO2023234154A1 JPWO2023234154A1 JP2024524787A JP2024524787A JPWO2023234154A1 JP WO2023234154 A1 JPWO2023234154 A1 JP WO2023234154A1 JP 2024524787 A JP2024524787 A JP 2024524787A JP 2024524787 A JP2024524787 A JP 2024524787A JP WO2023234154 A1 JPWO2023234154 A1 JP WO2023234154A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/40—Stabilisation of spectrometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- High Energy & Nuclear Physics (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022088955 | 2022-05-31 | ||
| PCT/JP2023/019420 WO2023234154A1 (ja) | 2022-05-31 | 2023-05-25 | 放射線検出装置、情報処理方法及びコンピュータプログラム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023234154A1 true JPWO2023234154A1 (https=) | 2023-12-07 |
| JPWO2023234154A5 JPWO2023234154A5 (https=) | 2025-02-12 |
Family
ID=89024849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024524787A Pending JPWO2023234154A1 (https=) | 2022-05-31 | 2023-05-25 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2023234154A1 (https=) |
| DE (1) | DE112023002485T5 (https=) |
| WO (1) | WO2023234154A1 (https=) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4041606B2 (ja) * | 1998-12-04 | 2008-01-30 | 株式会社堀場製作所 | Ｘ線分析装置 |
| JP6082634B2 (ja) * | 2013-03-27 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光ｘ線分析装置 |
| CN111373287B (zh) * | 2017-12-15 | 2025-01-14 | 株式会社堀场制作所 | 放射线检测器和放射线检测装置 |
| JP7008519B2 (ja) * | 2018-01-30 | 2022-01-25 | 日本電子株式会社 | 荷電粒子線装置 |
-
2023
- 2023-05-25 WO PCT/JP2023/019420 patent/WO2023234154A1/ja not_active Ceased
- 2023-05-25 DE DE112023002485.5T patent/DE112023002485T5/de active Pending
- 2023-05-25 JP JP2024524787A patent/JPWO2023234154A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE112023002485T5 (de) | 2025-05-22 |
| WO2023234154A1 (ja) | 2023-12-07 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20241010 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20260302 |