JPWO2023182359A1 - - Google Patents

Info

Publication number
JPWO2023182359A1
JPWO2023182359A1 JP2024509166A JP2024509166A JPWO2023182359A1 JP WO2023182359 A1 JPWO2023182359 A1 JP WO2023182359A1 JP 2024509166 A JP2024509166 A JP 2024509166A JP 2024509166 A JP2024509166 A JP 2024509166A JP WO2023182359 A1 JPWO2023182359 A1 JP WO2023182359A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024509166A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023182359A1 publication Critical patent/JPWO2023182359A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G01B9/02098—Shearing interferometers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
JP2024509166A 2022-03-24 2023-03-22 Pending JPWO2023182359A1 (enrdf_load_stackoverflow)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022047944 2022-03-24
PCT/JP2023/011245 WO2023182359A1 (ja) 2022-03-24 2023-03-22 干渉計および物理量測定装置

Publications (1)

Publication Number Publication Date
JPWO2023182359A1 true JPWO2023182359A1 (enrdf_load_stackoverflow) 2023-09-28

Family

ID=88101558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024509166A Pending JPWO2023182359A1 (enrdf_load_stackoverflow) 2022-03-24 2023-03-22

Country Status (2)

Country Link
JP (1) JPWO2023182359A1 (enrdf_load_stackoverflow)
WO (1) WO2023182359A1 (enrdf_load_stackoverflow)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0315727A (ja) * 1989-01-18 1991-01-24 Photonetics Sa 光電測定装置
JPH0448230U (enrdf_load_stackoverflow) * 1990-08-24 1992-04-23
US5168324A (en) * 1986-09-25 1992-12-01 The United States Of America As Represented By The United States Department Of Energy Wavelength meter having elliptical wedge
JP2002323618A (ja) * 2001-02-20 2002-11-08 Sumitomo Osaka Cement Co Ltd 光共振器およびその製造方法ならびに波長管理モジュール
US7046374B1 (en) * 2002-03-14 2006-05-16 Avanex Corporation Interferometers for optical communications utilizing photo-sensitive materials
US20080187011A1 (en) * 2007-02-05 2008-08-07 Palo Alto Research Center Incorporated Tuning optical cavities
US20130120754A1 (en) * 2011-11-15 2013-05-16 Michael Wilson Micro-spectral sensor

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9324926D0 (en) * 1993-12-04 1994-01-26 Renishaw Plc Combined interferometer and refractometer
KR20210147932A (ko) * 2020-05-29 2021-12-07 에이지씨 가부시키가이샤 밀봉 부착 패키지 및 유기 일렉트로루미네센스 소자
CA3222615A1 (en) * 2021-03-10 2022-09-15 Ken Ogawa Physical quantity measurement device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5168324A (en) * 1986-09-25 1992-12-01 The United States Of America As Represented By The United States Department Of Energy Wavelength meter having elliptical wedge
JPH0315727A (ja) * 1989-01-18 1991-01-24 Photonetics Sa 光電測定装置
JPH0448230U (enrdf_load_stackoverflow) * 1990-08-24 1992-04-23
JP2002323618A (ja) * 2001-02-20 2002-11-08 Sumitomo Osaka Cement Co Ltd 光共振器およびその製造方法ならびに波長管理モジュール
US7046374B1 (en) * 2002-03-14 2006-05-16 Avanex Corporation Interferometers for optical communications utilizing photo-sensitive materials
US20080187011A1 (en) * 2007-02-05 2008-08-07 Palo Alto Research Center Incorporated Tuning optical cavities
US20130120754A1 (en) * 2011-11-15 2013-05-16 Michael Wilson Micro-spectral sensor

Also Published As

Publication number Publication date
WO2023182359A1 (ja) 2023-09-28

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