JPWO2023171058A1 - - Google Patents
Info
- Publication number
- JPWO2023171058A1 JPWO2023171058A1 JP2022575756A JP2022575756A JPWO2023171058A1 JP WO2023171058 A1 JPWO2023171058 A1 JP WO2023171058A1 JP 2022575756 A JP2022575756 A JP 2022575756A JP 2022575756 A JP2022575756 A JP 2022575756A JP WO2023171058 A1 JPWO2023171058 A1 JP WO2023171058A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/04—Polarimeters using electric detection means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/121—Correction signals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022034965 | 2022-03-08 | ||
| PCT/JP2022/044844 WO2023171058A1 (ja) | 2022-03-08 | 2022-12-06 | 偏光評価装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023171058A1 true JPWO2023171058A1 (https=) | 2023-09-14 |
| JPWO2023171058A5 JPWO2023171058A5 (https=) | 2025-10-14 |
Family
ID=87936499
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022575756A Pending JPWO2023171058A1 (https=) | 2022-03-08 | 2022-12-06 |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP4492020A4 (https=) |
| JP (1) | JPWO2023171058A1 (https=) |
| WO (1) | WO2023171058A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR3128022B1 (fr) * | 2021-10-08 | 2023-10-06 | Tiama | Dispositif et procédé opto-informatique d’analyse en lumière traversante d’un récipient en verre à l’aide d’une caméra numérique polarimétrique |
| WO2025079431A1 (ja) * | 2023-10-13 | 2025-04-17 | ソニーグループ株式会社 | 画像処理装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4260683B2 (ja) * | 2004-05-25 | 2009-04-30 | 大日本スクリーン製造株式会社 | エリプソメータ、偏光状態取得方法および光強度取得方法 |
| DE102012220923B4 (de) * | 2012-11-15 | 2014-07-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Messung einer faserrichtung eines kohlefaserwerkstoffes und herstellung eines objekts in kohlefaserverbundbauweise |
| WO2017099253A1 (ja) * | 2015-12-11 | 2017-06-15 | 株式会社ニコン | 偏光特性画像計測装置、偏光特性画像計測方法 |
| JP2018044865A (ja) | 2016-09-14 | 2018-03-22 | 国立大学法人宇都宮大学 | 光学機器のキャリブレーション法 |
| US11262293B2 (en) * | 2017-02-08 | 2022-03-01 | Ralfy KENAZ | System and method for use in high spatial resolution ellipsometry |
| WO2019198287A1 (ja) * | 2018-04-09 | 2019-10-17 | ソニー株式会社 | 情報処理装置と情報処理方法とプログラムおよびキャリブレーション装置 |
| JP2020080366A (ja) | 2018-11-13 | 2020-05-28 | ソニーセミコンダクタソリューションズ株式会社 | 受光装置 |
| CN112417370B (zh) * | 2020-11-12 | 2024-04-30 | 南京航空航天大学 | 粗糙表面物质的穆勒琼斯矩阵估计及偏振噪声分析方法 |
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2022
- 2022-12-06 EP EP22931029.7A patent/EP4492020A4/en active Pending
- 2022-12-06 WO PCT/JP2022/044844 patent/WO2023171058A1/ja not_active Ceased
- 2022-12-06 JP JP2022575756A patent/JPWO2023171058A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP4492020A1 (en) | 2025-01-15 |
| EP4492020A4 (en) | 2026-02-25 |
| WO2023171058A1 (ja) | 2023-09-14 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20251003 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20251003 |