JPWO2023157900A1 - - Google Patents

Info

Publication number
JPWO2023157900A1
JPWO2023157900A1 JP2024501419A JP2024501419A JPWO2023157900A1 JP WO2023157900 A1 JPWO2023157900 A1 JP WO2023157900A1 JP 2024501419 A JP2024501419 A JP 2024501419A JP 2024501419 A JP2024501419 A JP 2024501419A JP WO2023157900 A1 JPWO2023157900 A1 JP WO2023157900A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024501419A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023157900A1 publication Critical patent/JPWO2023157900A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2024501419A 2022-02-18 2023-02-16 Pending JPWO2023157900A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202263311547P 2022-02-18 2022-02-18
PCT/JP2023/005373 WO2023157900A1 (ja) 2022-02-18 2023-02-16 プローブユニット、検査装置、検査システム、検査方法、及び半導体レーザ装置の製造方法

Publications (1)

Publication Number Publication Date
JPWO2023157900A1 true JPWO2023157900A1 (de) 2023-08-24

Family

ID=87578384

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024501419A Pending JPWO2023157900A1 (de) 2022-02-18 2023-02-16

Country Status (2)

Country Link
JP (1) JPWO2023157900A1 (de)
WO (1) WO2023157900A1 (de)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4818933A (en) * 1986-10-08 1989-04-04 Hewlett-Packard Company Board fixturing system
JP3295863B2 (ja) * 1993-09-10 2002-06-24 富士通株式会社 半導体レーザ変調分光試験方法およびそのための装置
AU4283996A (en) * 1994-11-15 1996-06-19 Formfactor, Inc. Electrical contact structures from flexible wire
KR101009751B1 (ko) * 2009-06-24 2011-01-19 주식회사 아이에스시테크놀러지 Ｌｅｄ용 전기적 검사장비
JP2015190942A (ja) * 2014-03-28 2015-11-02 株式会社ソシオネクスト 検査装置、検査方法及びプローブカード
JP6422349B2 (ja) * 2015-01-15 2018-11-14 株式会社新川 測定装置及び位置合わせ方法
JP7138463B2 (ja) * 2018-03-30 2022-09-16 株式会社日本マイクロニクス プローバ
US11366153B2 (en) * 2019-01-15 2022-06-21 Kkt Holdings Syndicate Micro LED display panel

Also Published As

Publication number Publication date
WO2023157900A1 (ja) 2023-08-24

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