JPWO2023112814A1 - - Google Patents

Info

Publication number
JPWO2023112814A1
JPWO2023112814A1 JP2023567737A JP2023567737A JPWO2023112814A1 JP WO2023112814 A1 JPWO2023112814 A1 JP WO2023112814A1 JP 2023567737 A JP2023567737 A JP 2023567737A JP 2023567737 A JP2023567737 A JP 2023567737A JP WO2023112814 A1 JPWO2023112814 A1 JP WO2023112814A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023567737A
Other languages
Japanese (ja)
Other versions
JP7780771B2 (ja
JPWO2023112814A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023112814A1 publication Critical patent/JPWO2023112814A1/ja
Publication of JPWO2023112814A5 publication Critical patent/JPWO2023112814A5/ja
Application granted granted Critical
Publication of JP7780771B2 publication Critical patent/JP7780771B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
    • H10K39/30—Devices controlled by radiation
    • H10K39/32—Organic image sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP2023567737A 2021-12-15 2022-12-08 検出装置 Active JP7780771B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021203373 2021-12-15
JP2021203373 2021-12-15
PCT/JP2022/045233 WO2023112814A1 (ja) 2021-12-15 2022-12-08 検出装置

Publications (3)

Publication Number Publication Date
JPWO2023112814A1 true JPWO2023112814A1 (https=) 2023-06-22
JPWO2023112814A5 JPWO2023112814A5 (https=) 2024-10-23
JP7780771B2 JP7780771B2 (ja) 2025-12-05

Family

ID=86774658

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023567737A Active JP7780771B2 (ja) 2021-12-15 2022-12-08 検出装置

Country Status (3)

Country Link
US (2) US12313460B2 (https=)
JP (1) JP7780771B2 (https=)
WO (1) WO2023112814A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7746201B2 (ja) * 2022-03-16 2025-09-30 株式会社Magnolia White 検出装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0522516A (ja) * 1991-07-17 1993-01-29 Fuji Xerox Co Ltd イメージセンサ
JP2020518132A (ja) * 2017-04-20 2020-06-18 イソルグ 有機フォトダイオードを備えた放射線検出デバイス
WO2020137129A1 (ja) * 2018-12-28 2020-07-02 株式会社ジャパンディスプレイ 検出装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4677289A (en) * 1984-11-12 1987-06-30 Kabushiki Kaisha Toshiba Color sensor
KR20080061483A (ko) * 2006-12-28 2008-07-03 동부일렉트로닉스 주식회사 이미지 센서 및 이의 제조 방법
US7960807B2 (en) * 2007-02-09 2011-06-14 Intersil Americas Inc. Ambient light detectors using conventional CMOS image sensor process
US9595558B2 (en) * 2013-11-12 2017-03-14 Intrinsix Corporation Photodiode architectures and image capture methods having a plurality of photodiode with a shared electrode
JP6980567B2 (ja) 2018-03-07 2021-12-15 株式会社ジャパンディスプレイ 検出装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0522516A (ja) * 1991-07-17 1993-01-29 Fuji Xerox Co Ltd イメージセンサ
JP2020518132A (ja) * 2017-04-20 2020-06-18 イソルグ 有機フォトダイオードを備えた放射線検出デバイス
WO2020137129A1 (ja) * 2018-12-28 2020-07-02 株式会社ジャパンディスプレイ 検出装置

Also Published As

Publication number Publication date
US12313460B2 (en) 2025-05-27
JP7780771B2 (ja) 2025-12-05
US20240337530A1 (en) 2024-10-10
WO2023112814A1 (ja) 2023-06-22
US20250237547A1 (en) 2025-07-24

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