JPWO2022195765A1 - - Google Patents
Info
- Publication number
- JPWO2022195765A1 JPWO2022195765A1 JP2023506591A JP2023506591A JPWO2022195765A1 JP WO2022195765 A1 JPWO2022195765 A1 JP WO2022195765A1 JP 2023506591 A JP2023506591 A JP 2023506591A JP 2023506591 A JP2023506591 A JP 2023506591A JP WO2022195765 A1 JPWO2022195765 A1 JP WO2022195765A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
Landscapes
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/010836 WO2022195765A1 (ja) | 2021-03-17 | 2021-03-17 | 推定装置、推定システム、推定方法、及び記録媒体 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2022195765A1 true JPWO2022195765A1 (ja) | 2022-09-22 |
JPWO2022195765A5 JPWO2022195765A5 (ja) | 2023-11-30 |
Family
ID=83321998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023506591A Pending JPWO2022195765A1 (ja) | 2021-03-17 | 2021-03-17 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20230417664A1 (ja) |
JP (1) | JPWO2022195765A1 (ja) |
WO (1) | WO2022195765A1 (ja) |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7646490B2 (en) * | 2006-07-25 | 2010-01-12 | Zetetic Institute | Apparatus and method for in situ and ex situ measurement of spatial impulse response of an optical system using phase shifting point-diffraction interferometry |
JP5035798B2 (ja) * | 2007-08-31 | 2012-09-26 | 国立大学法人秋田大学 | 微粒子光捕捉回転制御装置 |
JP5021054B2 (ja) * | 2010-05-25 | 2012-09-05 | キヤノン株式会社 | 屈折率分布計測方法および屈折率分布計測装置 |
JP5008763B2 (ja) * | 2010-12-03 | 2012-08-22 | キヤノン株式会社 | 屈折率分布計測方法、屈折率分布計測装置および光学素子の製造方法 |
JP2013037751A (ja) * | 2011-08-10 | 2013-02-21 | Utsunomiya Univ | 光情報記録装置 |
JP5575161B2 (ja) * | 2012-02-10 | 2014-08-20 | キヤノン株式会社 | 屈折率分布計測方法および屈折率分布計測装置 |
JP6518041B2 (ja) * | 2014-05-21 | 2019-05-22 | 浜松ホトニクス株式会社 | 光刺激装置及び光刺激方法 |
US11125686B2 (en) * | 2017-07-06 | 2021-09-21 | Ramot At Tel-Aviv University Ltd. | System and method for three-dimensional label-free optical imaging of a biological cell sample in an environmental chamber |
JP2019078635A (ja) * | 2017-10-25 | 2019-05-23 | キヤノン株式会社 | 測定装置、データ処理装置、データ処理方法およびプログラム |
US20230010572A1 (en) * | 2018-07-13 | 2023-01-12 | The University Of Tokyo | Image generating apparatus and image generating method |
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2021
- 2021-03-17 JP JP2023506591A patent/JPWO2022195765A1/ja active Pending
- 2021-03-17 WO PCT/JP2021/010836 patent/WO2022195765A1/ja active Application Filing
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2023
- 2023-09-09 US US18/464,211 patent/US20230417664A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
US20230417664A1 (en) | 2023-12-28 |
WO2022195765A1 (ja) | 2022-09-22 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230904 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230904 |