JPWO2022181746A1 - - Google Patents

Info

Publication number
JPWO2022181746A1
JPWO2022181746A1 JP2023502523A JP2023502523A JPWO2022181746A1 JP WO2022181746 A1 JPWO2022181746 A1 JP WO2022181746A1 JP 2023502523 A JP2023502523 A JP 2023502523A JP 2023502523 A JP2023502523 A JP 2023502523A JP WO2022181746 A1 JPWO2022181746 A1 JP WO2022181746A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023502523A
Other languages
Japanese (ja)
Other versions
JPWO2022181746A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022181746A1 publication Critical patent/JPWO2022181746A1/ja
Publication of JPWO2022181746A5 publication Critical patent/JPWO2022181746A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/50—Information retrieval; Database structures therefor; File system structures therefor of still image data
    • G06F16/53—Querying
    • G06F16/532—Query formulation, e.g. graphical querying
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user
    • G06T2207/20104—Interactive definition of region of interest [ROI]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Databases & Information Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
JP2023502523A 2021-02-26 2022-02-25 Pending JPWO2022181746A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021031133 2021-02-26
PCT/JP2022/007786 WO2022181746A1 (ja) 2021-02-26 2022-02-25 画像表示装置、画像表示方法及びプログラム

Publications (2)

Publication Number Publication Date
JPWO2022181746A1 true JPWO2022181746A1 (https=) 2022-09-01
JPWO2022181746A5 JPWO2022181746A5 (https=) 2023-11-27

Family

ID=83049137

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023502523A Pending JPWO2022181746A1 (https=) 2021-02-26 2022-02-25

Country Status (5)

Country Link
US (1) US20230401696A1 (https=)
EP (1) EP4300084A4 (https=)
JP (1) JPWO2022181746A1 (https=)
CN (1) CN116897282A (https=)
WO (1) WO2022181746A1 (https=)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016065875A (ja) * 2015-11-13 2016-04-28 株式会社キーエンス 画像処理装置及び画像処理方法
JP2017227466A (ja) * 2016-06-20 2017-12-28 富士フイルム株式会社 計測支援装置及び計測支援方法
JP2019053050A (ja) * 2017-09-13 2019-04-04 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP2019527876A (ja) * 2016-06-24 2019-10-03 ベックマン コールター， インコーポレイテッド 画像アトラスシステム及び方法
JP2020042053A (ja) * 2019-12-23 2020-03-19 株式会社キーエンス 画像検査装置および画像検査方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100428277C (zh) * 1999-11-29 2008-10-22 奥林巴斯光学工业株式会社 缺陷检查系统
JP2004078690A (ja) 2002-08-20 2004-03-11 Olympus Corp 画像比較装置、画像比較方法および画像比較をコンピュータにて実行させるためのプログラム
US7561753B2 (en) * 2004-01-09 2009-07-14 The Boeing Company System and method for comparing images with different contrast levels
US10964014B2 (en) * 2017-10-30 2021-03-30 Taiwan Semiconductor Manufacturing Company, Ltd. Defect detecting method and defect detecting system
JP7073785B2 (ja) * 2018-03-05 2022-05-24 オムロン株式会社 画像検査装置、画像検査方法及び画像検査プログラム
JP7624355B2 (ja) * 2021-06-22 2025-01-30 株式会社日立ハイテク 試料観察装置および方法
KR20240077289A (ko) * 2022-11-24 2024-05-31 한국과학기술원 이미지의 밝기를 보정하는 방법 및 그 장치

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016065875A (ja) * 2015-11-13 2016-04-28 株式会社キーエンス 画像処理装置及び画像処理方法
JP2017227466A (ja) * 2016-06-20 2017-12-28 富士フイルム株式会社 計測支援装置及び計測支援方法
JP2019527876A (ja) * 2016-06-24 2019-10-03 ベックマン コールター， インコーポレイテッド 画像アトラスシステム及び方法
JP2019053050A (ja) * 2017-09-13 2019-04-04 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
JP2020042053A (ja) * 2019-12-23 2020-03-19 株式会社キーエンス 画像検査装置および画像検査方法

Also Published As

Publication number Publication date
CN116897282A (zh) 2023-10-17
US20230401696A1 (en) 2023-12-14
EP4300084A4 (en) 2024-08-14
WO2022181746A1 (ja) 2022-09-01
EP4300084A1 (en) 2024-01-03

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