JPWO2022168554A1 - - Google Patents
Info
- Publication number
- JPWO2022168554A1 JPWO2022168554A1 JP2022579411A JP2022579411A JPWO2022168554A1 JP WO2022168554 A1 JPWO2022168554 A1 JP WO2022168554A1 JP 2022579411 A JP2022579411 A JP 2022579411A JP 2022579411 A JP2022579411 A JP 2022579411A JP WO2022168554 A1 JPWO2022168554 A1 JP WO2022168554A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0042—Investigating dispersion of solids
- G01N2015/0053—Investigating dispersion of solids in liquids, e.g. trouble
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021015309 | 2021-02-02 | ||
PCT/JP2022/000845 WO2022168554A1 (ja) | 2021-02-02 | 2022-01-13 | 光計測装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2022168554A1 true JPWO2022168554A1 (ja) | 2022-08-11 |
JPWO2022168554A5 JPWO2022168554A5 (ja) | 2023-10-30 |
Family
ID=82741276
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022579411A Pending JPWO2022168554A1 (ja) | 2021-02-02 | 2022-01-13 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20230375453A1 (ja) |
EP (1) | EP4290213A4 (ja) |
JP (1) | JPWO2022168554A1 (ja) |
KR (1) | KR20230125051A (ja) |
CN (1) | CN116868043A (ja) |
WO (1) | WO2022168554A1 (ja) |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008039539A (ja) | 2006-08-04 | 2008-02-21 | Shimadzu Corp | 光散乱検出装置 |
CN102323191B (zh) * | 2008-09-26 | 2013-11-06 | 株式会社堀场制作所 | 颗粒物性测量装置 |
JP5841475B2 (ja) * | 2012-03-28 | 2016-01-13 | 富士フイルム株式会社 | 低コヒーレンス光源を用いた動的光散乱測定法及び動的光散乱測定装置 |
JP6348349B2 (ja) * | 2014-06-20 | 2018-06-27 | 大塚電子株式会社 | 動的光散乱測定装置及び動的光散乱測定方法 |
JP6745349B2 (ja) * | 2016-10-28 | 2020-08-26 | 富士フイルム株式会社 | 光干渉断層画像撮像装置および計測方法 |
JP7367343B2 (ja) * | 2019-05-28 | 2023-10-24 | ソニーグループ株式会社 | 分取システム、及び分取方法 |
-
2022
- 2022-01-13 CN CN202280012000.6A patent/CN116868043A/zh active Pending
- 2022-01-13 KR KR1020237025751A patent/KR20230125051A/ko unknown
- 2022-01-13 JP JP2022579411A patent/JPWO2022168554A1/ja active Pending
- 2022-01-13 WO PCT/JP2022/000845 patent/WO2022168554A1/ja active Application Filing
- 2022-01-13 EP EP22749431.7A patent/EP4290213A4/en active Pending
-
2023
- 2023-07-30 US US18/361,895 patent/US20230375453A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
WO2022168554A1 (ja) | 2022-08-11 |
EP4290213A4 (en) | 2024-08-14 |
EP4290213A1 (en) | 2023-12-13 |
CN116868043A (zh) | 2023-10-10 |
US20230375453A1 (en) | 2023-11-23 |
KR20230125051A (ko) | 2023-08-28 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230731 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20241004 |