JPWO2022130827A1 - - Google Patents

Info

Publication number
JPWO2022130827A1
JPWO2022130827A1 JP2022569765A JP2022569765A JPWO2022130827A1 JP WO2022130827 A1 JPWO2022130827 A1 JP WO2022130827A1 JP 2022569765 A JP2022569765 A JP 2022569765A JP 2022569765 A JP2022569765 A JP 2022569765A JP WO2022130827 A1 JPWO2022130827 A1 JP WO2022130827A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022569765A
Other versions
JPWO2022130827A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022130827A1 publication Critical patent/JPWO2022130827A1/ja
Publication of JPWO2022130827A5 publication Critical patent/JPWO2022130827A5/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
    • H03K17/08104—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G01R31/2628—Circuits therefor for testing field effect transistors, i.e. FET's for measuring thermal properties thereof
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/18—Modifications for indicating state of switch
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/28—Modifications for introducing a time delay before switching
    • H03K17/284—Modifications for introducing a time delay before switching in field effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/20—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits characterised by logic function, e.g. AND, OR, NOR, NOT circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)
JP2022569765A 2020-12-17 2021-11-08 Pending JPWO2022130827A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020209306 2020-12-17
PCT/JP2021/040996 WO2022130827A1 (ja) 2020-12-17 2021-11-08 電圧制御型半導体素子の温度検出方法および駆動装置

Publications (2)

Publication Number Publication Date
JPWO2022130827A1 true JPWO2022130827A1 (ja) 2022-06-23
JPWO2022130827A5 JPWO2022130827A5 (ja) 2023-02-24

Family

ID=82059700

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022569765A Pending JPWO2022130827A1 (ja) 2020-12-17 2021-11-08

Country Status (5)

Country Link
US (1) US20230088396A1 (ja)
JP (1) JPWO2022130827A1 (ja)
CN (1) CN115698732A (ja)
DE (1) DE112021001992T5 (ja)
WO (1) WO2022130827A1 (ja)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2615467B1 (en) 2012-01-11 2014-06-18 ABB Research Ltd. System and method for monitoring in real time the operating state of an IGBT device
US9520879B2 (en) * 2014-06-18 2016-12-13 Texas Instruments Incorporated Adaptive blanking timer for short circuit detection
EP3270513B1 (en) * 2016-07-11 2019-07-03 NXP USA, Inc. Igbt gate current slope measure to estimate miller plateau
US10574226B2 (en) * 2017-02-16 2020-02-25 Texas Instruments Incorporated Gate driver including gate sense circuit
JP7140635B2 (ja) 2018-10-31 2022-09-21 株式会社日立製作所 電力変換装置

Also Published As

Publication number Publication date
WO2022130827A1 (ja) 2022-06-23
CN115698732A (zh) 2023-02-03
US20230088396A1 (en) 2023-03-23
DE112021001992T5 (de) 2023-01-12

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Legal Events

Date Code Title Description
A521 Request for written amendment filed

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Effective date: 20221209

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Effective date: 20221209

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