JPWO2022124131A1 - - Google Patents
Info
- Publication number
- JPWO2022124131A1 JPWO2022124131A1 JP2022568199A JP2022568199A JPWO2022124131A1 JP WO2022124131 A1 JPWO2022124131 A1 JP WO2022124131A1 JP 2022568199 A JP2022568199 A JP 2022568199A JP 2022568199 A JP2022568199 A JP 2022568199A JP WO2022124131 A1 JPWO2022124131 A1 JP WO2022124131A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/813—Electronic components shared by multiple pixels, e.g. one amplifier shared by two pixels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
- H10F39/8037—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
- H10F39/80373—Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor characterised by the gate of the transistor
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
- H10F30/221—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier being a PN homojunction
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/014—Manufacture or treatment of image sensors covered by group H10F39/12 of CMOS image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
- H10F39/8027—Geometry of the photosensitive area
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/807—Pixel isolation structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/95—Circuit arrangements
- H10F77/953—Circuit arrangements for devices having potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/199—Back-illuminated image sensors
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020206044 | 2020-12-11 | ||
| JP2020206044 | 2020-12-11 | ||
| PCT/JP2021/043778 WO2022124131A1 (ja) | 2020-12-11 | 2021-11-30 | 受光素子、受光装置及び電子機器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022124131A1 true JPWO2022124131A1 (https=) | 2022-06-16 |
| JPWO2022124131A5 JPWO2022124131A5 (https=) | 2024-10-24 |
| JP7826226B2 JP7826226B2 (ja) | 2026-03-09 |
Family
ID=81973929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022568199A Active JP7826226B2 (ja) | 2020-12-11 | 2021-11-30 | 受光素子、受光装置及び電子機器 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20240021632A1 (https=) |
| EP (1) | EP4261900B1 (https=) |
| JP (1) | JP7826226B2 (https=) |
| KR (1) | KR20230117114A (https=) |
| CN (1) | CN116438664A (https=) |
| DE (1) | DE112021006412T5 (https=) |
| TW (1) | TWI912406B (https=) |
| WO (1) | WO2022124131A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7693422B2 (ja) * | 2021-07-08 | 2025-06-17 | キヤノン株式会社 | 光電変換装置、光電変換システム、移動体 |
| TW202445845A (zh) * | 2023-05-10 | 2024-11-16 | 日商索尼半導體解決方案公司 | 半導體裝置 |
| CN121844730A (zh) * | 2023-10-17 | 2026-04-10 | 索尼半导体解决方案公司 | 光电检测装置和电子设备 |
| WO2025100321A1 (ja) * | 2023-11-06 | 2025-05-15 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置 |
| WO2025150445A1 (ja) * | 2024-01-11 | 2025-07-17 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置、電子機器 |
| WO2026038469A1 (ja) * | 2024-08-16 | 2026-02-19 | ソニーセミコンダクタソリューションズ株式会社 | 半導体装置、光検出装置および電子機器 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010114273A (ja) * | 2008-11-06 | 2010-05-20 | Sony Corp | 固体撮像装置、及び電子機器 |
| WO2016136487A1 (ja) * | 2015-02-27 | 2016-09-01 | ソニー株式会社 | 撮像素子、撮像装置、並びに、製造装置および方法 |
| JP2017055050A (ja) * | 2015-09-11 | 2017-03-16 | 株式会社東芝 | 固体撮像装置および固体撮像装置の製造方法 |
| WO2020008907A1 (ja) * | 2018-07-06 | 2020-01-09 | ソニーセミコンダクタソリューションズ株式会社 | 受光素子、測距モジュール、および、電子機器 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11322533B2 (en) * | 2013-03-14 | 2022-05-03 | Sony Semiconductor Solutions Corporation | Solid state image sensor tolerant to misalignment and having a high photoelectric conversion efficiency |
| JP6138661B2 (ja) * | 2013-10-23 | 2017-05-31 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像素子およびその製造方法、並びに電子機器 |
| JP2016136584A (ja) * | 2015-01-23 | 2016-07-28 | 株式会社東芝 | 固体撮像装置および固体撮像装置の製造方法 |
| TWI860337B (zh) * | 2019-03-15 | 2024-11-01 | 日商索尼半導體解決方案公司 | 攝像元件及半導體元件 |
| JP2020174157A (ja) * | 2019-04-12 | 2020-10-22 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置 |
| KR102879888B1 (ko) * | 2020-12-17 | 2025-10-31 | 삼성전자주식회사 | 이미지 센서의 픽셀 그룹 및 픽셀 어레이 |
-
2021
- 2021-11-11 TW TW110141963A patent/TWI912406B/zh active
- 2021-11-30 JP JP2022568199A patent/JP7826226B2/ja active Active
- 2021-11-30 KR KR1020237017424A patent/KR20230117114A/ko active Pending
- 2021-11-30 EP EP21903235.6A patent/EP4261900B1/en active Active
- 2021-11-30 US US18/255,533 patent/US20240021632A1/en active Pending
- 2021-11-30 WO PCT/JP2021/043778 patent/WO2022124131A1/ja not_active Ceased
- 2021-11-30 DE DE112021006412.6T patent/DE112021006412T5/de active Pending
- 2021-11-30 CN CN202180071238.1A patent/CN116438664A/zh active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010114273A (ja) * | 2008-11-06 | 2010-05-20 | Sony Corp | 固体撮像装置、及び電子機器 |
| WO2016136487A1 (ja) * | 2015-02-27 | 2016-09-01 | ソニー株式会社 | 撮像素子、撮像装置、並びに、製造装置および方法 |
| JP2017055050A (ja) * | 2015-09-11 | 2017-03-16 | 株式会社東芝 | 固体撮像装置および固体撮像装置の製造方法 |
| WO2020008907A1 (ja) * | 2018-07-06 | 2020-01-09 | ソニーセミコンダクタソリューションズ株式会社 | 受光素子、測距モジュール、および、電子機器 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022124131A1 (ja) | 2022-06-16 |
| DE112021006412T5 (de) | 2023-10-05 |
| JP7826226B2 (ja) | 2026-03-09 |
| TW202230769A (zh) | 2022-08-01 |
| EP4261900A4 (en) | 2024-06-05 |
| CN116438664A (zh) | 2023-07-14 |
| US20240021632A1 (en) | 2024-01-18 |
| TWI912406B (zh) | 2026-01-21 |
| KR20230117114A (ko) | 2023-08-07 |
| EP4261900A1 (en) | 2023-10-18 |
| EP4261900B1 (en) | 2025-10-08 |
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