JPWO2022085591A1 - - Google Patents

Info

Publication number
JPWO2022085591A1
JPWO2022085591A1 JP2022557487A JP2022557487A JPWO2022085591A1 JP WO2022085591 A1 JPWO2022085591 A1 JP WO2022085591A1 JP 2022557487 A JP2022557487 A JP 2022557487A JP 2022557487 A JP2022557487 A JP 2022557487A JP WO2022085591 A1 JPWO2022085591 A1 JP WO2022085591A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022557487A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022085591A1 publication Critical patent/JPWO2022085591A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • G01N23/204Measuring back scattering using neutrons
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/316Accessories, mechanical or electrical features collimators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2022557487A 2020-10-19 2021-10-15 Pending JPWO2022085591A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020175252 2020-10-19
PCT/JP2021/038273 WO2022085591A1 (ja) 2020-10-19 2021-10-15 非破壊検査装置と非破壊検査方法

Publications (1)

Publication Number Publication Date
JPWO2022085591A1 true JPWO2022085591A1 (ja) 2022-04-28

Family

ID=81290430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022557487A Pending JPWO2022085591A1 (ja) 2020-10-19 2021-10-15

Country Status (4)

Country Link
US (1) US20230393082A1 (ja)
EP (1) EP4231002A4 (ja)
JP (1) JPWO2022085591A1 (ja)
WO (1) WO2022085591A1 (ja)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2549176A (en) * 1947-05-31 1951-04-17 Texas Co Detection of scattered neutrons
US5098640A (en) * 1990-01-10 1992-03-24 Science Applications International Corporation Apparatus and method for detecting contraband using fast neutron activation
ES2291861T3 (es) * 2003-03-14 2008-03-01 Force Technology Procedimiento y dispositivo para detectar agua en la cubierta de un barco.
JP6712418B2 (ja) * 2015-09-09 2020-06-24 国立研究開発法人理化学研究所 非破壊検査装置と方法
JP6985206B2 (ja) * 2018-04-18 2021-12-22 キヤノン電子管デバイス株式会社 放射線位置検出器
JP7223993B2 (ja) * 2019-02-27 2023-02-17 株式会社トプコン 非破壊検査システム及び非破壊検査方法
CN110320564B (zh) * 2019-06-03 2021-02-23 中国工程物理研究院核物理与化学研究所 一种基于概率矩阵溯源的中子背散射塑性地雷成像方法
CN110333547B (zh) * 2019-07-24 2020-10-23 中国工程物理研究院核物理与化学研究所 一种用于塑性地雷探测的中子背散射成像装置

Also Published As

Publication number Publication date
EP4231002A4 (en) 2024-04-24
US20230393082A1 (en) 2023-12-07
WO2022085591A1 (ja) 2022-04-28
EP4231002A1 (en) 2023-08-23

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