JPWO2022059629A1 - - Google Patents

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Publication number
JPWO2022059629A1
JPWO2022059629A1 JP2022550537A JP2022550537A JPWO2022059629A1 JP WO2022059629 A1 JPWO2022059629 A1 JP WO2022059629A1 JP 2022550537 A JP2022550537 A JP 2022550537A JP 2022550537 A JP2022550537 A JP 2022550537A JP WO2022059629 A1 JPWO2022059629 A1 JP WO2022059629A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022550537A
Other versions
JPWO2022059629A5 (ja
JP7460202B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Publication of JPWO2022059629A1 publication Critical patent/JPWO2022059629A1/ja
Publication of JPWO2022059629A5 publication Critical patent/JPWO2022059629A5/ja
Application granted granted Critical
Publication of JP7460202B2 publication Critical patent/JP7460202B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; Plastics; Rubber; Leather
    • G01N33/442—Resins; Plastics

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Radiation Pyrometers (AREA)
JP2022550537A 2020-09-16 2021-09-13 非接触材料同定方法、非接触温度同定方法、及び熱処理加工進行度同定方法 Active JP7460202B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020155085 2020-09-16
JP2020155085 2020-09-16
PCT/JP2021/033443 WO2022059629A1 (ja) 2020-09-16 2021-09-13 非接触材料同定方法、非接触温度同定方法、及び熱処理加工進行度同定方法

Publications (3)

Publication Number Publication Date
JPWO2022059629A1 true JPWO2022059629A1 (ja) 2022-03-24
JPWO2022059629A5 JPWO2022059629A5 (ja) 2023-06-05
JP7460202B2 JP7460202B2 (ja) 2024-04-02

Family

ID=80776644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022550537A Active JP7460202B2 (ja) 2020-09-16 2021-09-13 非接触材料同定方法、非接触温度同定方法、及び熱処理加工進行度同定方法

Country Status (3)

Country Link
US (1) US20230333023A1 (ja)
JP (1) JP7460202B2 (ja)
WO (1) WO2022059629A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117169273A (zh) * 2023-09-07 2023-12-05 华南理工大学 一种基于反射法测量材料常温方向发射率的装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60169742A (ja) * 1984-02-13 1985-09-03 Shinkawa Ltd ダイボンド接着状態の検査装置
US6333501B1 (en) * 2000-01-27 2001-12-25 Perkin-Elmer Corporation Methods, apparatus, and articles of manufacture for performing spectral calibration
JP4689093B2 (ja) * 2001-06-29 2011-05-25 浜松ホトニクス株式会社 レーザ照射領域監視装置、レーザ照射領域監視方法、レーザ加工装置及びレーザ加工方法
US8829437B2 (en) 2012-07-04 2014-09-09 Apple Inc. Method for quantifying amorphous content in bulk metallic glass parts using thermal emissivity
JP6831350B2 (ja) * 2018-06-20 2021-02-17 日立グローバルライフソリューションズ株式会社 誘導加熱調理器

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117169273A (zh) * 2023-09-07 2023-12-05 华南理工大学 一种基于反射法测量材料常温方向发射率的装置及方法
CN117169273B (zh) * 2023-09-07 2024-04-26 华南理工大学 一种基于反射法测量材料常温方向发射率的装置及方法

Also Published As

Publication number Publication date
US20230333023A1 (en) 2023-10-19
WO2022059629A1 (ja) 2022-03-24
JP7460202B2 (ja) 2024-04-02

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