JPWO2022030154A1 - - Google Patents
Info
- Publication number
- JPWO2022030154A1 JPWO2022030154A1 JP2022541162A JP2022541162A JPWO2022030154A1 JP WO2022030154 A1 JPWO2022030154 A1 JP WO2022030154A1 JP 2022541162 A JP2022541162 A JP 2022541162A JP 2022541162 A JP2022541162 A JP 2022541162A JP WO2022030154 A1 JPWO2022030154 A1 JP WO2022030154A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020134152 | 2020-08-06 | ||
| PCT/JP2021/025154 WO2022030154A1 (ja) | 2020-08-06 | 2021-07-02 | 電離放射線変換デバイスおよび電離放射線の検出方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022030154A1 true JPWO2022030154A1 (ja) | 2022-02-10 |
Family
ID=80119732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022541162A Pending JPWO2022030154A1 (ja) | 2020-08-06 | 2021-07-02 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20230141202A1 (ja) |
| EP (1) | EP4194903A4 (ja) |
| JP (1) | JPWO2022030154A1 (ja) |
| WO (1) | WO2022030154A1 (ja) |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102014225543B4 (de) * | 2014-12-11 | 2021-02-25 | Siemens Healthcare Gmbh | Perowskit-Partikel mit Beschichtung aus einem Halbleitermaterial, Verfahren zu deren Herstellung, Detektor, umfassend beschichtete Partikel, Verfahren zur Herstellung eines Detektors und Verfahren zur Herstellung einer Schicht umfassend beschichtete Partikel |
| CN108028263B (zh) * | 2015-09-17 | 2022-10-21 | 皇家飞利浦有限公司 | 用于制造辐射探测器的方法和辐射探测器 |
| DE102015220793A1 (de) * | 2015-10-23 | 2017-04-27 | Siemens Healthcare Gmbh | Röntgendetektor und/oder Gammadetektor mit Lichtbias |
| DE102015225145A1 (de) * | 2015-12-14 | 2017-06-14 | Siemens Healthcare Gmbh | Perowskitpartikel für die Herstellung von Röntgendetektoren mittels Abscheidung aus der Trockenphase |
| DE102016102501A1 (de) * | 2016-02-12 | 2017-08-17 | Technische Universität Darmstadt | Mikroelektronische Elektrodenanordnung |
| WO2017165434A1 (en) * | 2016-03-21 | 2017-09-28 | Nutech Ventures | Sensitive x-ray and gamma-ray detectors including perovskite single crystals |
| CN109313278A (zh) * | 2016-06-07 | 2019-02-05 | 皇家飞利浦有限公司 | 直接光子转换探测器 |
| US11195967B2 (en) * | 2017-09-07 | 2021-12-07 | Northwestern University | High radiation detection performance from photoactive semiconductor single crystals |
-
2021
- 2021-07-02 WO PCT/JP2021/025154 patent/WO2022030154A1/ja active Application Filing
- 2021-07-02 EP EP21853521.9A patent/EP4194903A4/en active Pending
- 2021-07-02 JP JP2022541162A patent/JPWO2022030154A1/ja active Pending
-
2023
- 2023-01-06 US US18/150,838 patent/US20230141202A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP4194903A4 (en) | 2024-01-17 |
| WO2022030154A1 (ja) | 2022-02-10 |
| EP4194903A1 (en) | 2023-06-14 |
| US20230141202A1 (en) | 2023-05-11 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20240213 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240411 |