JPWO2022024999A1 - - Google Patents
Info
- Publication number
- JPWO2022024999A1 JPWO2022024999A1 JP2022540297A JP2022540297A JPWO2022024999A1 JP WO2022024999 A1 JPWO2022024999 A1 JP WO2022024999A1 JP 2022540297 A JP2022540297 A JP 2022540297A JP 2022540297 A JP2022540297 A JP 2022540297A JP WO2022024999 A1 JPWO2022024999 A1 JP WO2022024999A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
- G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/58—SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020130552 | 2020-07-31 | ||
| PCT/JP2021/027558 WO2022024999A1 (ja) | 2020-07-31 | 2021-07-26 | 原子間力顕微鏡及び距離制御方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022024999A1 true JPWO2022024999A1 (zh) | 2022-02-03 |
Family
ID=80036450
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022540297A Pending JPWO2022024999A1 (zh) | 2020-07-31 | 2021-07-26 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2022024999A1 (zh) |
| WO (1) | WO2022024999A1 (zh) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0887328A (ja) * | 1994-09-14 | 1996-04-02 | Res Dev Corp Of Japan | 光操作方法 |
| JP2003114185A (ja) * | 2001-10-04 | 2003-04-18 | Communication Research Laboratory | プローブ位置固定式微小力測定装置及び測定方法 |
| US7617720B2 (en) * | 2005-01-06 | 2009-11-17 | National University Corporation Hokkaido University | Surface position measuring method and surface position measuring device |
| US8904560B2 (en) * | 2007-05-07 | 2014-12-02 | Bruker Nano, Inc. | Closed loop controller and method for fast scanning probe microscopy |
| US8239968B2 (en) * | 2009-07-06 | 2012-08-07 | Georgia Tech Research Corporation | Athermal atomic force microscope probes |
| WO2014132341A1 (ja) * | 2013-02-26 | 2014-09-04 | 株式会社島津製作所 | 原子間力顕微鏡を用いた表面電荷密度測定装置 |
-
2021
- 2021-07-26 JP JP2022540297A patent/JPWO2022024999A1/ja active Pending
- 2021-07-26 WO PCT/JP2021/027558 patent/WO2022024999A1/ja active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022024999A1 (ja) | 2022-02-03 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20220726 |