JPWO2022009990A1 - - Google Patents
Info
- Publication number
- JPWO2022009990A1 JPWO2022009990A1 JP2022535406A JP2022535406A JPWO2022009990A1 JP WO2022009990 A1 JPWO2022009990 A1 JP WO2022009990A1 JP 2022535406 A JP2022535406 A JP 2022535406A JP 2022535406 A JP2022535406 A JP 2022535406A JP WO2022009990 A1 JPWO2022009990 A1 JP WO2022009990A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020118713 | 2020-07-09 | ||
| JP2020118713 | 2020-07-09 | ||
| PCT/JP2021/026014 WO2022009990A1 (ja) | 2020-07-09 | 2021-07-09 | 研磨用組成物及び研磨方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2022009990A1 true JPWO2022009990A1 (enrdf_load_html_response) | 2022-01-13 |
| JP7671756B2 JP7671756B2 (ja) | 2025-05-02 |
Family
ID=79552564
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022535406A Active JP7671756B2 (ja) | 2020-07-09 | 2021-07-09 | 研磨用組成物及び研磨方法 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP7671756B2 (enrdf_load_html_response) |
| TW (1) | TW202214815A (enrdf_load_html_response) |
| WO (1) | WO2022009990A1 (enrdf_load_html_response) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2024541256A (ja) * | 2021-10-27 | 2024-11-08 | インテグリス・インコーポレーテッド | 多結晶結晶材料の研磨 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60155359A (ja) * | 1984-01-20 | 1985-08-15 | Sumitomo Special Metals Co Ltd | セラミツクス材料の無孔化研摩方法 |
| JPH09131662A (ja) * | 1995-11-10 | 1997-05-20 | Fuji Elelctrochem Co Ltd | セラミックスの研磨方法 |
| JP2003117806A (ja) * | 2001-10-10 | 2003-04-23 | Kobe Steel Ltd | 多結晶セラミックスの鏡面研磨方法 |
| JP2020029472A (ja) * | 2018-08-20 | 2020-02-27 | 株式会社ダイセル | 多結晶yag研磨用スラリー組成物 |
-
2021
- 2021-07-09 JP JP2022535406A patent/JP7671756B2/ja active Active
- 2021-07-09 WO PCT/JP2021/026014 patent/WO2022009990A1/ja not_active Ceased
- 2021-07-09 TW TW110118444A patent/TW202214815A/zh unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60155359A (ja) * | 1984-01-20 | 1985-08-15 | Sumitomo Special Metals Co Ltd | セラミツクス材料の無孔化研摩方法 |
| JPH09131662A (ja) * | 1995-11-10 | 1997-05-20 | Fuji Elelctrochem Co Ltd | セラミックスの研磨方法 |
| JP2003117806A (ja) * | 2001-10-10 | 2003-04-23 | Kobe Steel Ltd | 多結晶セラミックスの鏡面研磨方法 |
| JP2020029472A (ja) * | 2018-08-20 | 2020-02-27 | 株式会社ダイセル | 多結晶yag研磨用スラリー組成物 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW202214815A (zh) | 2022-04-16 |
| JP7671756B2 (ja) | 2025-05-02 |
| WO2022009990A1 (ja) | 2022-01-13 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240415 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20250121 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20250321 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20250401 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20250421 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7671756 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |