JPWO2021261157A1 - - Google Patents

Info

Publication number
JPWO2021261157A1
JPWO2021261157A1 JP2022532435A JP2022532435A JPWO2021261157A1 JP WO2021261157 A1 JPWO2021261157 A1 JP WO2021261157A1 JP 2022532435 A JP2022532435 A JP 2022532435A JP 2022532435 A JP2022532435 A JP 2022532435A JP WO2021261157 A1 JPWO2021261157 A1 JP WO2021261157A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022532435A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021261157A1 publication Critical patent/JPWO2021261157A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/16Error detection or correction of the data by redundancy in hardware
    • G06F11/20Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP2022532435A 2020-06-25 2021-05-25 Pending JPWO2021261157A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020109955 2020-06-25
PCT/JP2021/019859 WO2021261157A1 (ja) 2020-06-25 2021-05-25 半導体記憶装置

Publications (1)

Publication Number Publication Date
JPWO2021261157A1 true JPWO2021261157A1 (zh) 2021-12-30

Family

ID=79282448

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022532435A Pending JPWO2021261157A1 (zh) 2020-06-25 2021-05-25

Country Status (2)

Country Link
JP (1) JPWO2021261157A1 (zh)
WO (1) WO2021261157A1 (zh)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0756816A (ja) * 1993-08-20 1995-03-03 Yokogawa Electric Corp メモリの制御装置
JP3270367B2 (ja) * 1997-09-29 2002-04-02 エヌイーシーフィールディング株式会社 半導体記憶装置
JP2011108306A (ja) * 2009-11-16 2011-06-02 Sony Corp 不揮発性メモリおよびメモリシステム
WO2012001944A1 (ja) * 2010-06-29 2012-01-05 パナソニック株式会社 不揮発性記憶装置及びその駆動方法

Also Published As

Publication number Publication date
WO2021261157A1 (ja) 2021-12-30

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Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20240328