JPWO2021241580A1 - - Google Patents
Info
- Publication number
- JPWO2021241580A1 JPWO2021241580A1 JP2022526583A JP2022526583A JPWO2021241580A1 JP WO2021241580 A1 JPWO2021241580 A1 JP WO2021241580A1 JP 2022526583 A JP2022526583 A JP 2022526583A JP 2022526583 A JP2022526583 A JP 2022526583A JP WO2021241580 A1 JPWO2021241580 A1 JP WO2021241580A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
- G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
- G05B23/0254—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2223/00—Indexing scheme associated with group G05B23/00
- G05B2223/02—Indirect monitoring, e.g. monitoring production to detect faults of a system
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- Mathematical Physics (AREA)
- Testing And Monitoring For Control Systems (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020095040 | 2020-05-29 | ||
| JP2020095040 | 2020-05-29 | ||
| PCT/JP2021/019802 WO2021241580A1 (ja) | 2020-05-29 | 2021-05-25 | 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2021241580A1 true JPWO2021241580A1 (https=) | 2021-12-02 |
| JP7604486B2 JP7604486B2 (ja) | 2024-12-23 |
Family
ID=78744083
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022526583A Active JP7604486B2 (ja) | 2020-05-29 | 2021-05-25 | 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230213924A1 (https=) |
| EP (1) | EP4160339A4 (https=) |
| JP (1) | JP7604486B2 (https=) |
| CN (1) | CN115698881B (https=) |
| WO (1) | WO2021241580A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116844076A (zh) * | 2022-03-23 | 2023-10-03 | 浙江宇视科技有限公司 | 一种目标滞留检测方法、系统、电子设备和存储介质 |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2020461851A1 (en) * | 2020-08-05 | 2022-05-26 | Chiyoda Corporation | Method for managing plant, plant design device, and plant management device |
| WO2023127748A1 (ja) * | 2021-12-27 | 2023-07-06 | 株式会社ダイセル | 異常検知装置、異常検知方法及び異常検知プログラム |
| JP7759847B2 (ja) * | 2022-05-23 | 2025-10-24 | カナデビア株式会社 | 状態監視システム、診断モデル作成装置および状態監視方法 |
| CN119213378A (zh) * | 2022-06-03 | 2024-12-27 | 欧姆龙株式会社 | 异常检测装置、异常检测方法以及程序 |
| JP2024129552A (ja) * | 2023-03-13 | 2024-09-27 | 株式会社キューピクル | 保守点検装置 |
| WO2025234232A1 (ja) * | 2024-05-08 | 2025-11-13 | パナソニックＩｐマネジメント株式会社 | 情報処理装置、情報処理方法およびプログラム |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06309584A (ja) * | 1993-04-27 | 1994-11-04 | Toshiba Corp | プラント運転支援装置 |
| JP2016164772A (ja) * | 2015-02-26 | 2016-09-08 | 富士電機株式会社 | プロセス監視装置、プロセス監視方法及びプログラム |
| WO2018104985A1 (ja) * | 2016-12-08 | 2018-06-14 | 日本電気株式会社 | 異常分析方法、プログラムおよびシステム |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5282261A (en) * | 1990-08-03 | 1994-01-25 | E. I. Du Pont De Nemours And Co., Inc. | Neural network process measurement and control |
| US9110452B2 (en) * | 2011-09-19 | 2015-08-18 | Fisher-Rosemount Systems, Inc. | Inferential process modeling, quality prediction and fault detection using multi-stage data segregation |
| EP3093335A1 (de) * | 2015-05-13 | 2016-11-16 | Bayer Technology Services GmbH | Prozessleitsystem zur regelung und steuerung einer modular aufgebauten anlage zur produktion von biopharmazeutischen und biologischen makromolekularen produkten |
| JP6842299B2 (ja) | 2016-12-28 | 2021-03-17 | 三菱パワー株式会社 | 診断装置、診断方法及びプログラム |
| JP6862190B2 (ja) | 2017-01-24 | 2021-04-21 | 株式会社東芝 | プロセス診断装置、プロセス診断方法及びプロセス診断システム |
| JP6895816B2 (ja) * | 2017-06-15 | 2021-06-30 | 株式会社 日立産業制御ソリューションズ | 異常診断装置、異常診断方法及び異常診断プログラム |
| JP6711323B2 (ja) * | 2017-07-04 | 2020-06-17 | Ｊｆｅスチール株式会社 | プロセスの異常状態診断方法および異常状態診断装置 |
| JP6884078B2 (ja) | 2017-09-21 | 2021-06-09 | 三菱パワー株式会社 | プラント異常監視システム |
| EP4216216B1 (en) * | 2018-08-10 | 2025-02-19 | Nippon Telegraph And Telephone Corporation | Probability distribution learning apparatus and autoencoder learning apparatus |
-
2021
- 2021-05-25 JP JP2022526583A patent/JP7604486B2/ja active Active
- 2021-05-25 US US17/928,029 patent/US20230213924A1/en active Pending
- 2021-05-25 EP EP21812645.6A patent/EP4160339A4/en active Pending
- 2021-05-25 CN CN202180039073.XA patent/CN115698881B/zh active Active
- 2021-05-25 WO PCT/JP2021/019802 patent/WO2021241580A1/ja not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06309584A (ja) * | 1993-04-27 | 1994-11-04 | Toshiba Corp | プラント運転支援装置 |
| JP2016164772A (ja) * | 2015-02-26 | 2016-09-08 | 富士電機株式会社 | プロセス監視装置、プロセス監視方法及びプログラム |
| WO2018104985A1 (ja) * | 2016-12-08 | 2018-06-14 | 日本電気株式会社 | 異常分析方法、プログラムおよびシステム |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116844076A (zh) * | 2022-03-23 | 2023-10-03 | 浙江宇视科技有限公司 | 一种目标滞留检测方法、系统、电子设备和存储介质 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7604486B2 (ja) | 2024-12-23 |
| WO2021241580A1 (ja) | 2021-12-02 |
| CN115698881B (zh) | 2026-02-24 |
| EP4160339A1 (en) | 2023-04-05 |
| CN115698881A (zh) | 2023-02-03 |
| US20230213924A1 (en) | 2023-07-06 |
| EP4160339A4 (en) | 2024-07-10 |
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