CN115698881B - 异常调制原因确定装置、异常调制原因确定方法以及异常调制原因确定程序 - Google Patents

异常调制原因确定装置、异常调制原因确定方法以及异常调制原因确定程序

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Publication number
CN115698881B
CN115698881B CN202180039073.XA CN202180039073A CN115698881B CN 115698881 B CN115698881 B CN 115698881B CN 202180039073 A CN202180039073 A CN 202180039073A CN 115698881 B CN115698881 B CN 115698881B
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China
Prior art keywords
process data
abnormality
cause
degree
modulation
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CN202180039073.XA
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Chinese (zh)
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CN115698881A (zh
Inventor
冈洋辉
山野幸一
松本博治
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Daicel Corp
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Daicel Corp
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0254—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2223/00—Indexing scheme associated with group G05B23/00
    • G05B2223/02—Indirect monitoring, e.g. monitoring production to detect faults of a system
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
CN202180039073.XA 2020-05-29 2021-05-25 异常调制原因确定装置、异常调制原因确定方法以及异常调制原因确定程序 Active CN115698881B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020095040 2020-05-29
JP2020-095040 2020-05-29
PCT/JP2021/019802 WO2021241580A1 (ja) 2020-05-29 2021-05-25 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

Publications (2)

Publication Number Publication Date
CN115698881A CN115698881A (zh) 2023-02-03
CN115698881B true CN115698881B (zh) 2026-02-24

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Country Status (5)

Country Link
US (1) US20230213924A1 (https=)
EP (1) EP4160339A4 (https=)
JP (1) JP7604486B2 (https=)
CN (1) CN115698881B (https=)
WO (1) WO2021241580A1 (https=)

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Publication number Priority date Publication date Assignee Title
AU2020461851A1 (en) * 2020-08-05 2022-05-26 Chiyoda Corporation Method for managing plant, plant design device, and plant management device
WO2023127748A1 (ja) * 2021-12-27 2023-07-06 株式会社ダイセル 異常検知装置、異常検知方法及び異常検知プログラム
CN116844076A (zh) * 2022-03-23 2023-10-03 浙江宇视科技有限公司 一种目标滞留检测方法、系统、电子设备和存储介质
JP7759847B2 (ja) * 2022-05-23 2025-10-24 カナデビア株式会社 状態監視システム、診断モデル作成装置および状態監視方法
CN119213378A (zh) * 2022-06-03 2024-12-27 欧姆龙株式会社 异常检测装置、异常检测方法以及程序
JP2024129552A (ja) * 2023-03-13 2024-09-27 株式会社キューピクル 保守点検装置
WO2025234232A1 (ja) * 2024-05-08 2025-11-13 パナソニックＩｐマネジメント株式会社 情報処理装置、情報処理方法およびプログラム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06309584A (ja) * 1993-04-27 1994-11-04 Toshiba Corp プラント運転支援装置
WO2018104985A1 (ja) * 2016-12-08 2018-06-14 日本電気株式会社 異常分析方法、プログラムおよびシステム

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US5282261A (en) * 1990-08-03 1994-01-25 E. I. Du Pont De Nemours And Co., Inc. Neural network process measurement and control
US9110452B2 (en) * 2011-09-19 2015-08-18 Fisher-Rosemount Systems, Inc. Inferential process modeling, quality prediction and fault detection using multi-stage data segregation
JP6733164B2 (ja) 2015-02-26 2020-07-29 富士電機株式会社 プロセス監視装置、プロセス監視方法及びプログラム
EP3093335A1 (de) * 2015-05-13 2016-11-16 Bayer Technology Services GmbH Prozessleitsystem zur regelung und steuerung einer modular aufgebauten anlage zur produktion von biopharmazeutischen und biologischen makromolekularen produkten
JP6842299B2 (ja) 2016-12-28 2021-03-17 三菱パワー株式会社 診断装置、診断方法及びプログラム
JP6862190B2 (ja) 2017-01-24 2021-04-21 株式会社東芝 プロセス診断装置、プロセス診断方法及びプロセス診断システム
JP6895816B2 (ja) * 2017-06-15 2021-06-30 株式会社 日立産業制御ソリューションズ 異常診断装置、異常診断方法及び異常診断プログラム
JP6711323B2 (ja) * 2017-07-04 2020-06-17 Ｊｆｅスチール株式会社 プロセスの異常状態診断方法および異常状態診断装置
JP6884078B2 (ja) 2017-09-21 2021-06-09 三菱パワー株式会社 プラント異常監視システム
EP4216216B1 (en) * 2018-08-10 2025-02-19 Nippon Telegraph And Telephone Corporation Probability distribution learning apparatus and autoencoder learning apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06309584A (ja) * 1993-04-27 1994-11-04 Toshiba Corp プラント運転支援装置
WO2018104985A1 (ja) * 2016-12-08 2018-06-14 日本電気株式会社 異常分析方法、プログラムおよびシステム

Also Published As

Publication number Publication date
JP7604486B2 (ja) 2024-12-23
WO2021241580A1 (ja) 2021-12-02
EP4160339A1 (en) 2023-04-05
JPWO2021241580A1 (https=) 2021-12-02
CN115698881A (zh) 2023-02-03
US20230213924A1 (en) 2023-07-06
EP4160339A4 (en) 2024-07-10

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