JPWO2021241536A1 - - Google Patents

Info

Publication number
JPWO2021241536A1
JPWO2021241536A1 JP2022526555A JP2022526555A JPWO2021241536A1 JP WO2021241536 A1 JPWO2021241536 A1 JP WO2021241536A1 JP 2022526555 A JP2022526555 A JP 2022526555A JP 2022526555 A JP2022526555 A JP 2022526555A JP WO2021241536 A1 JPWO2021241536 A1 JP WO2021241536A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2022526555A
Other versions
JPWO2021241536A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021241536A1 publication Critical patent/JPWO2021241536A1/ja
Publication of JPWO2021241536A5 publication Critical patent/JPWO2021241536A5/ja
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
    • G01N33/383—Concrete or cement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0008—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings of bridges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/043—Analysing solids in the interior, e.g. by shear waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/045—Analysing solids by imparting shocks to the workpiece and detecting the vibrations or the acoustic waves caused by the shocks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0232—Glass, ceramics, concrete or stone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Acoustics & Sound (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Ceramic Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022526555A 2020-05-29 2021-05-25 Abandoned JPWO2021241536A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020094328 2020-05-29
PCT/JP2021/019703 WO2021241536A1 (ja) 2020-05-29 2021-05-25 構造物の検査方法及び検査システム

Publications (2)

Publication Number Publication Date
JPWO2021241536A1 true JPWO2021241536A1 (ja) 2021-12-02
JPWO2021241536A5 JPWO2021241536A5 (ja) 2023-03-24

Family

ID=78744426

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022526555A Abandoned JPWO2021241536A1 (ja) 2020-05-29 2021-05-25

Country Status (3)

Country Link
US (1) US20230111766A1 (ja)
JP (1) JPWO2021241536A1 (ja)
WO (1) WO2021241536A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114136998A (zh) * 2021-12-28 2022-03-04 北京西管安通检测技术有限责任公司 一种微波无损检测的方法、装置、系统、设备及介质

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07151719A (ja) * 1993-11-30 1995-06-16 Dai Ichi High Frequency Co Ltd コンクリート中の鉄筋の発錆進行状況判定方法
JPH11259656A (ja) * 1998-03-10 1999-09-24 Teito Rapid Transit Authority トンネル壁面判定装置
JP2005037366A (ja) * 2003-06-24 2005-02-10 Constec Engi Co 赤外線構造物診断システム及び赤外線構造物診断方法
JP2007183227A (ja) * 2006-01-10 2007-07-19 Nippon Telegr & Teleph Corp <Ntt> 電磁波イメージングシステム、構造物透視装置および構造物透視方法
JP2008151809A (ja) * 2008-03-10 2008-07-03 West Nippon Expressway Engineering Shikoku Co Ltd 赤外線カメラによる構造物調査方法
JP2011039690A (ja) * 2009-08-07 2011-02-24 Nippon Telegr & Teleph Corp <Ntt> 画像処理方法、画像処理装置及びひび割れ検知システム
JP2017138239A (ja) * 2016-02-04 2017-08-10 学校法人桐蔭学園 非接触音響探査システム
WO2017154731A1 (ja) * 2016-03-11 2017-09-14 Ntn株式会社 振動検査装置
JP2018054319A (ja) * 2016-09-26 2018-04-05 新日鐵住金株式会社 煙道又は煙突の調査方法
JP2020024184A (ja) * 2018-07-26 2020-02-13 直人 今西 構造内部変状特性検出装置
JP2020063969A (ja) * 2018-10-17 2020-04-23 株式会社神戸製鋼所 学習装置、推定装置、亀裂検出装置、亀裂検出システム、学習方法、推定方法、亀裂検出方法、及びプログラム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5275968B2 (ja) * 2009-12-24 2013-08-28 株式会社パスコ 内部変状検出支援装置及び内部変状検出支援プログラム
CN102095755B (zh) * 2010-12-09 2012-10-03 重庆建工市政交通工程有限责任公司 一种混凝土结构的无损检测方法
JP5591165B2 (ja) * 2011-03-25 2014-09-17 公益財団法人鉄道総合技術研究所 コンクリート表面の変状領域の検出方法
JP2015219014A (ja) * 2014-05-14 2015-12-07 コニカミノルタ株式会社 物体診断装置
JP6939255B2 (ja) * 2017-08-28 2021-09-22 積水ハウス株式会社 シーリング目地検査方法

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07151719A (ja) * 1993-11-30 1995-06-16 Dai Ichi High Frequency Co Ltd コンクリート中の鉄筋の発錆進行状況判定方法
JPH11259656A (ja) * 1998-03-10 1999-09-24 Teito Rapid Transit Authority トンネル壁面判定装置
JP2005037366A (ja) * 2003-06-24 2005-02-10 Constec Engi Co 赤外線構造物診断システム及び赤外線構造物診断方法
JP2007183227A (ja) * 2006-01-10 2007-07-19 Nippon Telegr & Teleph Corp <Ntt> 電磁波イメージングシステム、構造物透視装置および構造物透視方法
JP2008151809A (ja) * 2008-03-10 2008-07-03 West Nippon Expressway Engineering Shikoku Co Ltd 赤外線カメラによる構造物調査方法
JP2011039690A (ja) * 2009-08-07 2011-02-24 Nippon Telegr & Teleph Corp <Ntt> 画像処理方法、画像処理装置及びひび割れ検知システム
JP2017138239A (ja) * 2016-02-04 2017-08-10 学校法人桐蔭学園 非接触音響探査システム
WO2017154731A1 (ja) * 2016-03-11 2017-09-14 Ntn株式会社 振動検査装置
JP2018054319A (ja) * 2016-09-26 2018-04-05 新日鐵住金株式会社 煙道又は煙突の調査方法
JP2020024184A (ja) * 2018-07-26 2020-02-13 直人 今西 構造内部変状特性検出装置
JP2020063969A (ja) * 2018-10-17 2020-04-23 株式会社神戸製鋼所 学習装置、推定装置、亀裂検出装置、亀裂検出システム、学習方法、推定方法、亀裂検出方法、及びプログラム

Also Published As

Publication number Publication date
WO2021241536A1 (ja) 2021-12-02
US20230111766A1 (en) 2023-04-13

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