JPWO2021241535A1 - - Google Patents

Info

Publication number
JPWO2021241535A1
JPWO2021241535A1 JP2022526554A JP2022526554A JPWO2021241535A1 JP WO2021241535 A1 JPWO2021241535 A1 JP WO2021241535A1 JP 2022526554 A JP2022526554 A JP 2022526554A JP 2022526554 A JP2022526554 A JP 2022526554A JP WO2021241535 A1 JPWO2021241535 A1 JP WO2021241535A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2022526554A
Other languages
Japanese (ja)
Other versions
JPWO2021241535A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021241535A1 publication Critical patent/JPWO2021241535A1/ja
Publication of JPWO2021241535A5 publication Critical patent/JPWO2021241535A5/ja
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/02—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0232—Glass, ceramics, concrete or stone
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/025—Change of phase or condition
    • G01N2291/0258—Structural degradation, e.g. fatigue of composites, ageing of oils
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20016—Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30132—Masonry; Concrete

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Electromagnetism (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2022526554A 2020-05-29 2021-05-25 Abandoned JPWO2021241535A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020094327 2020-05-29
PCT/JP2021/019702 WO2021241535A1 (ja) 2020-05-29 2021-05-25 構造物の検査方法及び検査システム

Publications (2)

Publication Number Publication Date
JPWO2021241535A1 true JPWO2021241535A1 (https=) 2021-12-02
JPWO2021241535A5 JPWO2021241535A5 (https=) 2023-03-24

Family

ID=78744405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022526554A Abandoned JPWO2021241535A1 (https=) 2020-05-29 2021-05-25

Country Status (3)

Country Link
US (1) US20230082753A1 (https=)
JP (1) JPWO2021241535A1 (https=)
WO (1) WO2021241535A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114136998A (zh) * 2021-12-28 2022-03-04 北京西管安通检测技术有限责任公司 一种微波无损检测的方法、装置、系统、设备及介质
WO2023136030A1 (ja) * 2022-01-14 2023-07-20 富士フイルム株式会社 情報処理装置、情報処理方法、及び情報処理プログラム
CN117819857B (zh) * 2024-01-18 2024-09-24 玉田县致泰钢纤维制造有限公司 一种钢纤维的防锈方法
WO2025239193A1 (ja) * 2024-05-13 2025-11-20 ソニーグループ株式会社 情報処理システム、情報処理方法およびプログラム

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1183754A (ja) * 1997-09-04 1999-03-26 Mitsui High Tec Inc リードフレーム検査装置
JP2002257744A (ja) * 2001-03-02 2002-09-11 Takenaka Komuten Co Ltd コンクリートの欠陥検査方法およびコンクリートの欠陥検査装置
JP2002350365A (ja) * 2001-05-23 2002-12-04 Hitachi Ltd 電波が伝播できる検査対象の検査装置
JP2004325246A (ja) * 2003-04-24 2004-11-18 Toshiba Corp 欠陥検査装置
US20050110672A1 (en) * 2003-10-10 2005-05-26 L-3 Communications Security And Detection Systems, Inc. Mmw contraband screening system
JP2006132973A (ja) * 2004-11-02 2006-05-25 Fujimitsu Komuten:Kk コンクリート構造物のクラック検査装置及びクラック検査方法
JP2007178384A (ja) * 2005-12-28 2007-07-12 Aichi Mach Ind Co Ltd 検査装置および検査方法
WO2018037689A1 (ja) * 2016-08-22 2018-03-01 富士フイルム株式会社 画像処理装置及び画像処理方法
JP2019027908A (ja) * 2017-07-28 2019-02-21 株式会社ＴｏｎＴｏｎ 外面材調査システム
JP2019144191A (ja) * 2018-02-23 2019-08-29 株式会社市川工務店 橋梁などの構造物を検査するための画像処理システム、画像処理方法及びプログラム
JP2019158793A (ja) * 2018-03-16 2019-09-19 公益財団法人鉄道総合技術研究所 ひび割れ調査装置
JP2020016667A (ja) * 2019-10-25 2020-01-30 東急建設株式会社 変状部の検査装置

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1183754A (ja) * 1997-09-04 1999-03-26 Mitsui High Tec Inc リードフレーム検査装置
JP2002257744A (ja) * 2001-03-02 2002-09-11 Takenaka Komuten Co Ltd コンクリートの欠陥検査方法およびコンクリートの欠陥検査装置
JP2002350365A (ja) * 2001-05-23 2002-12-04 Hitachi Ltd 電波が伝播できる検査対象の検査装置
JP2004325246A (ja) * 2003-04-24 2004-11-18 Toshiba Corp 欠陥検査装置
US20050110672A1 (en) * 2003-10-10 2005-05-26 L-3 Communications Security And Detection Systems, Inc. Mmw contraband screening system
JP2006132973A (ja) * 2004-11-02 2006-05-25 Fujimitsu Komuten:Kk コンクリート構造物のクラック検査装置及びクラック検査方法
JP2007178384A (ja) * 2005-12-28 2007-07-12 Aichi Mach Ind Co Ltd 検査装置および検査方法
WO2018037689A1 (ja) * 2016-08-22 2018-03-01 富士フイルム株式会社 画像処理装置及び画像処理方法
JP2019027908A (ja) * 2017-07-28 2019-02-21 株式会社ＴｏｎＴｏｎ 外面材調査システム
JP2019144191A (ja) * 2018-02-23 2019-08-29 株式会社市川工務店 橋梁などの構造物を検査するための画像処理システム、画像処理方法及びプログラム
JP2019158793A (ja) * 2018-03-16 2019-09-19 公益財団法人鉄道総合技術研究所 ひび割れ調査装置
JP2020016667A (ja) * 2019-10-25 2020-01-30 東急建設株式会社 変状部の検査装置

Also Published As

Publication number Publication date
US20230082753A1 (en) 2023-03-16
WO2021241535A1 (ja) 2021-12-02

Similar Documents

Publication Publication Date Title
BR112023005462A2 (https=)
BR112023012656A2 (https=)
BR112021014123A2 (https=)
BR112023009656A2 (https=)
BR112022009896A2 (https=)
BR112021017747A2 (https=)
JPWO2021241535A1 (https=)
BR112022024743A2 (https=)
BR112022026905A2 (https=)
BR112023011738A2 (https=)
BR112023004146A2 (https=)
BR112023006729A2 (https=)
BR102021018859A2 (https=)
BR102021015500A2 (https=)
BR102021007058A2 (https=)
BR102020022030A2 (https=)
BR112023016292A2 (https=)
BR112023011539A2 (https=)
BR112023011610A2 (https=)
BR112023008976A2 (https=)
BR102021020147A2 (https=)
BR102021018926A2 (https=)
BR102021018167A2 (https=)
BR102021017576A2 (https=)
BR102021016837A2 (https=)

Legal Events

Date Code Title Description
A529 Written submission of copy of amendment under article 34 pct

Free format text: JAPANESE INTERMEDIATE CODE: A5211

Effective date: 20221020

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230131

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230131

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240124

A762 Written abandonment of application

Free format text: JAPANESE INTERMEDIATE CODE: A762

Effective date: 20240322