JPWO2021214994A1 - - Google Patents

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Publication number
JPWO2021214994A1
JPWO2021214994A1 JP2022516807A JP2022516807A JPWO2021214994A1 JP WO2021214994 A1 JPWO2021214994 A1 JP WO2021214994A1 JP 2022516807 A JP2022516807 A JP 2022516807A JP 2022516807 A JP2022516807 A JP 2022516807A JP WO2021214994 A1 JPWO2021214994 A1 JP WO2021214994A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022516807A
Other versions
JP7359297B2 (ja
JPWO2021214994A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021214994A1 publication Critical patent/JPWO2021214994A1/ja
Publication of JPWO2021214994A5 publication Critical patent/JPWO2021214994A5/ja
Application granted granted Critical
Publication of JP7359297B2 publication Critical patent/JP7359297B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/215—Motion-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/20—Analysis of motion
    • G06T7/254—Analysis of motion involving subtraction of images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
JP2022516807A 2020-04-24 2020-04-24 検査システム Active JP7359297B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017749 WO2021214994A1 (ja) 2020-04-24 2020-04-24 検査システム

Publications (3)

Publication Number Publication Date
JPWO2021214994A1 true JPWO2021214994A1 (ja) 2021-10-28
JPWO2021214994A5 JPWO2021214994A5 (ja) 2022-12-22
JP7359297B2 JP7359297B2 (ja) 2023-10-11

Family

ID=78270676

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022516807A Active JP7359297B2 (ja) 2020-04-24 2020-04-24 検査システム

Country Status (4)

Country Link
US (1) US20230175975A1 (ja)
EP (1) EP4141421A4 (ja)
JP (1) JP7359297B2 (ja)
WO (1) WO2021214994A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023175943A1 (ja) 2022-03-18 2023-09-21 日本電気株式会社 異物検査装置
WO2024127554A1 (ja) * 2022-12-14 2024-06-20 日本電気株式会社 情報処理装置、推論方法、推論プログラム、および特徴量生成モデルの生成方法
WO2024161565A1 (ja) * 2023-02-01 2024-08-08 日本電気株式会社 検査システム

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004354100A (ja) * 2003-05-27 2004-12-16 Matsushita Electric Works Ltd 容器内液体中の異物検出方法及びその装置
JP2013044688A (ja) * 2011-08-25 2013-03-04 Mutual Corp 気泡判別検査装置および気泡判別検査方法
CN108414534A (zh) * 2018-05-04 2018-08-17 无锡恩特卫自动化检测设备有限公司 一种白酒低密度极轻异物自动检测方法及装置
JP2019174346A (ja) * 2018-03-29 2019-10-10 富士通株式会社 検査方法、検査装置、及び検査プログラム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0954047A (ja) * 1995-08-18 1997-02-25 Takara Shuzo Co Ltd 瓶検査方法及び装置
JP5974870B2 (ja) * 2012-12-03 2016-08-23 株式会社 日立産業制御ソリューションズ 製品画像検査装置および製品画像検査方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004354100A (ja) * 2003-05-27 2004-12-16 Matsushita Electric Works Ltd 容器内液体中の異物検出方法及びその装置
JP2013044688A (ja) * 2011-08-25 2013-03-04 Mutual Corp 気泡判別検査装置および気泡判別検査方法
JP2019174346A (ja) * 2018-03-29 2019-10-10 富士通株式会社 検査方法、検査装置、及び検査プログラム
CN108414534A (zh) * 2018-05-04 2018-08-17 无锡恩特卫自动化检测设备有限公司 一种白酒低密度极轻异物自动检测方法及装置

Also Published As

Publication number Publication date
US20230175975A1 (en) 2023-06-08
WO2021214994A1 (ja) 2021-10-28
EP4141421A1 (en) 2023-03-01
JP7359297B2 (ja) 2023-10-11
EP4141421A4 (en) 2023-06-21

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