JPWO2021199937A1 - - Google Patents

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Publication number
JPWO2021199937A1
JPWO2021199937A1 JP2021533827A JP2021533827A JPWO2021199937A1 JP WO2021199937 A1 JPWO2021199937 A1 JP WO2021199937A1 JP 2021533827 A JP2021533827 A JP 2021533827A JP 2021533827 A JP2021533827 A JP 2021533827A JP WO2021199937 A1 JPWO2021199937 A1 JP WO2021199937A1
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JP
Japan
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JP2021533827A
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JP7173345B2 (ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/32—Polishing; Etching
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/01—Dynamic search techniques; Heuristics; Dynamic trees; Branch-and-bound
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
    • G06V10/993—Evaluation of the quality of the acquired pattern
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/70—Labelling scene content, e.g. deriving syntactic or semantic representations
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/64—Computer-aided capture of images, e.g. transfer from script file into camera, check of taken image quality, advice or proposal for image composition or decision on when to take image
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • Artificial Intelligence (AREA)
  • Computational Linguistics (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Data Mining & Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Medical Informatics (AREA)
  • Databases & Information Systems (AREA)
  • Signal Processing (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Molecular Biology (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2021533827A 2020-03-31 2021-03-08 金属組織の撮影条件決定方法、金属組織の撮影方法、金属組織の相分類方法、金属組織の撮影条件決定装置、金属組織の撮影装置、金属組織の相分類装置、金属材料の材料特性予測方法および金属材料の材料特性予測装置 Active JP7173345B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020063414 2020-03-31
JP2020063414 2020-03-31
PCT/JP2021/009006 WO2021199937A1 (ja) 2020-03-31 2021-03-08 金属組織の撮影条件決定方法、金属組織の撮影方法、金属組織の相分類方法、金属組織の撮影条件決定装置、金属組織の撮影装置、金属組織の相分類装置、金属材料の材料特性予測方法および金属材料の材料特性予測装置

Publications (2)

Publication Number Publication Date
JPWO2021199937A1 true JPWO2021199937A1 (ja) 2021-10-07
JP7173345B2 JP7173345B2 (ja) 2022-11-16

Family

ID=77929098

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021533827A Active JP7173345B2 (ja) 2020-03-31 2021-03-08 金属組織の撮影条件決定方法、金属組織の撮影方法、金属組織の相分類方法、金属組織の撮影条件決定装置、金属組織の撮影装置、金属組織の相分類装置、金属材料の材料特性予測方法および金属材料の材料特性予測装置

Country Status (6)

Country Link
US (1) US20230153976A1 (ja)
EP (1) EP4131159A4 (ja)
JP (1) JP7173345B2 (ja)
KR (1) KR20220156044A (ja)
CN (1) CN115398228A (ja)
WO (1) WO2021199937A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023172382A (ja) * 2022-05-23 2023-12-06 Ｊｆｅスチール株式会社 代表組織写真決定方法、代表組織写真決定装置、撮影装置及びプログラム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4548903A (en) * 1984-03-30 1985-10-22 The United States Of America As Represented By The Secretary Of The Air Force Method to reveal microstructures in single phase alloys
JPS6279361A (ja) * 1985-10-02 1987-04-11 Daido Steel Co Ltd 二相ステンレス鋼の相定量方法
JPH06148062A (ja) * 1992-10-30 1994-05-27 Sumitomo Metal Ind Ltd 金属材の寿命評価方法
JP2007204772A (ja) * 2006-01-31 2007-08-16 Jfe Steel Kk 鋼のミクロ組織観察用着色エッチング液およびエッチング方法
JP2019012037A (ja) * 2017-06-30 2019-01-24 Ｊｆｅスチール株式会社 材料特性推定装置及び材料特性推定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106660090B (zh) * 2014-09-10 2019-03-19 东芝三菱电机产业系统株式会社 轧制模拟装置
JP6483826B2 (ja) 2015-07-15 2019-03-13 国立大学法人大阪大学 画像解析装置、画像解析方法、画像解析システム、画像解析プログラム、および記録媒体
JP2018121752A (ja) 2017-01-30 2018-08-09 国立大学法人 東京大学 画像解析装置、画像解析方法、および画像解析プログラム
JP7131617B2 (ja) * 2018-03-06 2022-09-06 オムロン株式会社 照明条件を設定する方法、装置、システム及びプログラム並びに記憶媒体
JP7147974B2 (ja) * 2020-01-29 2022-10-05 Ｊｆｅスチール株式会社 金属組織の相の分類方法、金属組織の相の分類装置、金属材料の材料特性予測方法および金属材料の材料特性予測装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4548903A (en) * 1984-03-30 1985-10-22 The United States Of America As Represented By The Secretary Of The Air Force Method to reveal microstructures in single phase alloys
JPS6279361A (ja) * 1985-10-02 1987-04-11 Daido Steel Co Ltd 二相ステンレス鋼の相定量方法
JPH06148062A (ja) * 1992-10-30 1994-05-27 Sumitomo Metal Ind Ltd 金属材の寿命評価方法
JP2007204772A (ja) * 2006-01-31 2007-08-16 Jfe Steel Kk 鋼のミクロ組織観察用着色エッチング液およびエッチング方法
JP2019012037A (ja) * 2017-06-30 2019-01-24 Ｊｆｅスチール株式会社 材料特性推定装置及び材料特性推定方法

Also Published As

Publication number Publication date
JP7173345B2 (ja) 2022-11-16
CN115398228A (zh) 2022-11-25
EP4131159A4 (en) 2023-11-08
US20230153976A1 (en) 2023-05-18
WO2021199937A1 (ja) 2021-10-07
EP4131159A1 (en) 2023-02-08
KR20220156044A (ko) 2022-11-24

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