JPWO2021199264A1 - - Google Patents

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Publication number
JPWO2021199264A1
JPWO2021199264A1 JP2022512984A JP2022512984A JPWO2021199264A1 JP WO2021199264 A1 JPWO2021199264 A1 JP WO2021199264A1 JP 2022512984 A JP2022512984 A JP 2022512984A JP 2022512984 A JP2022512984 A JP 2022512984A JP WO2021199264 A1 JPWO2021199264 A1 JP WO2021199264A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022512984A
Other versions
JP7400950B2 (ja
JPWO2021199264A5 (ja
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Publication of JPWO2021199264A1 publication Critical patent/JPWO2021199264A1/ja
Publication of JPWO2021199264A5 publication Critical patent/JPWO2021199264A5/ja
Application granted granted Critical
Publication of JP7400950B2 publication Critical patent/JP7400950B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/13—Edge detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/60—Extraction of image or video features relating to illumination properties, e.g. using a reflectance or lighting model
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/94—Hardware or software architectures specially adapted for image or video understanding
    • G06V10/945—User interactive design; Environments; Toolboxes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00—Scenes; Scene-specific elements
    • G06V20/70—Labelling scene content, e.g. deriving syntactic or semantic representations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Software Systems (AREA)
  • Immunology (AREA)
  • Computing Systems (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Artificial Intelligence (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Computational Linguistics (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Image Analysis (AREA)
JP2022512984A 2020-03-31 2020-03-31 検出装置、ラベル付与方法、及びプログラム Active JP7400950B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/014786 WO2021199264A1 (ja) 2020-03-31 2020-03-31 検出装置、ラベル付与方法、及び非一時的なコンピュータ可読媒体

Publications (3)

Publication Number Publication Date
JPWO2021199264A1 true JPWO2021199264A1 (ja) 2021-10-07
JPWO2021199264A5 JPWO2021199264A5 (ja) 2022-11-25
JP7400950B2 JP7400950B2 (ja) 2023-12-19

Family

ID=77928173

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022512984A Active JP7400950B2 (ja) 2020-03-31 2020-03-31 検出装置、ラベル付与方法、及びプログラム

Country Status (3)

Country Link
US (1) US20230136554A1 (ja)
JP (1) JP7400950B2 (ja)
WO (1) WO2021199264A1 (ja)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106127771A (zh) * 2016-06-28 2016-11-16 上海数联空间科技有限公司 基于激光雷达lidar点云数据获取隧道正射影像系统及方法
EP3273266A1 (en) * 2016-07-21 2018-01-24 Grupo Empresarial Copisa, S.L. A system and a method for surface aerial inspection
JP2018025919A (ja) * 2016-08-09 2018-02-15 株式会社東芝 情報処理装置、情報処理方法、および移動体
CN108537221A (zh) * 2018-03-29 2018-09-14 陕西师范大学 基于兴趣区域的桥梁或路面裂缝检测方法和评价方法
JP2018198053A (ja) * 2017-05-22 2018-12-13 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
CN110390683A (zh) * 2018-04-17 2019-10-29 河海大学 一种基于密集点云的古城墙三维裂缝检测方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106127771A (zh) * 2016-06-28 2016-11-16 上海数联空间科技有限公司 基于激光雷达lidar点云数据获取隧道正射影像系统及方法
EP3273266A1 (en) * 2016-07-21 2018-01-24 Grupo Empresarial Copisa, S.L. A system and a method for surface aerial inspection
JP2018025919A (ja) * 2016-08-09 2018-02-15 株式会社東芝 情報処理装置、情報処理方法、および移動体
JP2018198053A (ja) * 2017-05-22 2018-12-13 キヤノン株式会社 情報処理装置、情報処理方法、及びプログラム
CN108537221A (zh) * 2018-03-29 2018-09-14 陕西师范大学 基于兴趣区域的桥梁或路面裂缝检测方法和评价方法
CN110390683A (zh) * 2018-04-17 2019-10-29 河海大学 一种基于密集点云的古城墙三维裂缝检测方法

Also Published As

Publication number Publication date
WO2021199264A1 (ja) 2021-10-07
JP7400950B2 (ja) 2023-12-19
US20230136554A1 (en) 2023-05-04

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