JPWO2021176568A1 - - Google Patents

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Publication number
JPWO2021176568A1
JPWO2021176568A1 JP2022504822A JP2022504822A JPWO2021176568A1 JP WO2021176568 A1 JPWO2021176568 A1 JP WO2021176568A1 JP 2022504822 A JP2022504822 A JP 2022504822A JP 2022504822 A JP2022504822 A JP 2022504822A JP WO2021176568 A1 JPWO2021176568 A1 JP WO2021176568A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022504822A
Other versions
JP7375909B2 (ja
JPWO2021176568A5 (ja
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Publication of JPWO2021176568A5 publication Critical patent/JPWO2021176568A5/ja
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Publication of JP7375909B2 publication Critical patent/JP7375909B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Toxicology (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2022504822A 2020-03-03 2020-03-03 設備診断システム、及び、設備診断方法 Active JP7375909B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/008962 WO2021176568A1 (ja) 2020-03-03 2020-03-03 設備診断システム、及び、設備診断方法

Publications (3)

Publication Number Publication Date
JPWO2021176568A1 true JPWO2021176568A1 (ja) 2021-09-10
JPWO2021176568A5 JPWO2021176568A5 (ja) 2022-09-26
JP7375909B2 JP7375909B2 (ja) 2023-11-08

Family

ID=77613199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022504822A Active JP7375909B2 (ja) 2020-03-03 2020-03-03 設備診断システム、及び、設備診断方法

Country Status (2)

Country Link
JP (1) JP7375909B2 (ja)
WO (1) WO2021176568A1 (ja)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003012122A (ja) * 2001-06-28 2003-01-15 Nisshin Seifun Group Inc 入出庫管理システム
WO2010046968A1 (ja) * 2008-10-21 2010-04-29 西日本高速道路エンジニアリング四国株式会社 コンクリート構造物の診断装置および診断方法
JP2012242252A (ja) * 2011-05-20 2012-12-10 Hitachi Kokusai Electric Inc レール敷石陥没検出装置
JP2016218813A (ja) * 2015-05-22 2016-12-22 株式会社日立製作所 下水管路施設の点検システム
JP2018037078A (ja) * 2016-08-26 2018-03-08 伊達　博 障害検出機能付き発電モニタリングシステム
JP2019009919A (ja) * 2017-06-26 2019-01-17 株式会社東芝 巡視点検支援システム及び巡視点検支援制御プログラム
US20190204814A1 (en) * 2016-05-24 2019-07-04 Siemens Aktiengesellschaft System and Method for Visualizing and Validating Process Events
US20190256208A1 (en) * 2017-03-13 2019-08-22 General Electric Company System and method for integrating flight path and site operating data
JP2019141909A (ja) * 2012-03-09 2019-08-29 株式会社トヨコー 付着物除去方法及び付着物除去装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6681173B2 (ja) * 2015-11-09 2020-04-15 株式会社日立製作所 管路施設点検飛行体とそれを用いた管路施設点検システム
JP6646527B2 (ja) * 2016-06-14 2020-02-14 株式会社日立ソリューションズ 物体検知評価システム及び物体検知評価方法

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003012122A (ja) * 2001-06-28 2003-01-15 Nisshin Seifun Group Inc 入出庫管理システム
WO2010046968A1 (ja) * 2008-10-21 2010-04-29 西日本高速道路エンジニアリング四国株式会社 コンクリート構造物の診断装置および診断方法
JP2012242252A (ja) * 2011-05-20 2012-12-10 Hitachi Kokusai Electric Inc レール敷石陥没検出装置
JP2019141909A (ja) * 2012-03-09 2019-08-29 株式会社トヨコー 付着物除去方法及び付着物除去装置
JP2016218813A (ja) * 2015-05-22 2016-12-22 株式会社日立製作所 下水管路施設の点検システム
US20190204814A1 (en) * 2016-05-24 2019-07-04 Siemens Aktiengesellschaft System and Method for Visualizing and Validating Process Events
JP2018037078A (ja) * 2016-08-26 2018-03-08 伊達　博 障害検出機能付き発電モニタリングシステム
US20190256208A1 (en) * 2017-03-13 2019-08-22 General Electric Company System and method for integrating flight path and site operating data
JP2019009919A (ja) * 2017-06-26 2019-01-17 株式会社東芝 巡視点検支援システム及び巡視点検支援制御プログラム

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
""センシンロボティクスとベイシス、 ドローン点検サービスにおける業務提携を開始 - 外壁点検・調査を自動", センシンロボティクス［ONLINE］, JPN6023014845, 9 September 2019 (2019-09-09), ISSN: 0005093219 *

Also Published As

Publication number Publication date
JP7375909B2 (ja) 2023-11-08
WO2021176568A1 (ja) 2021-09-10

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