JPWO2021166388A1 - - Google Patents
Info
- Publication number
- JPWO2021166388A1 JPWO2021166388A1 JP2022501649A JP2022501649A JPWO2021166388A1 JP WO2021166388 A1 JPWO2021166388 A1 JP WO2021166388A1 JP 2022501649 A JP2022501649 A JP 2022501649A JP 2022501649 A JP2022501649 A JP 2022501649A JP WO2021166388 A1 JPWO2021166388 A1 JP WO2021166388A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/2859—Peak detecting in spectrum
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Plasma & Fusion (AREA)
- Engineering & Computer Science (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020028438 | 2020-02-21 | ||
JP2020028438 | 2020-02-21 | ||
PCT/JP2020/045999 WO2021166388A1 (ja) | 2020-02-21 | 2020-12-10 | 試料分析システム、学習済みモデル生成方法、及び試料分析方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JPWO2021166388A1 true JPWO2021166388A1 (ja) | 2021-08-26 |
JPWO2021166388A5 JPWO2021166388A5 (ja) | 2022-12-02 |
JP7388775B2 JP7388775B2 (ja) | 2023-11-29 |
Family
ID=77390675
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022501649A Active JP7388775B2 (ja) | 2020-02-21 | 2020-12-10 | 試料分析システム、学習済みモデル生成方法、及び試料分析方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20230070781A1 (ja) |
JP (1) | JP7388775B2 (ja) |
CN (1) | CN115135990A (ja) |
WO (1) | WO2021166388A1 (ja) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005837A (ja) * | 2000-06-23 | 2002-01-09 | Horiba Ltd | 分光分析装置 |
JP3134776U (ja) * | 2007-06-13 | 2007-08-23 | 株式会社島津製作所 | 発光分析装置 |
JP2015194402A (ja) * | 2014-03-31 | 2015-11-05 | 株式会社日立ハイテクサイエンス | Icp発光分光分析装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6545240B2 (en) * | 1996-02-16 | 2003-04-08 | Huron Valley Steel Corporation | Metal scrap sorting system |
US7006205B2 (en) * | 2002-05-30 | 2006-02-28 | Applied Materials Inc. | Method and system for event detection in plasma processes |
DE102014212682A1 (de) * | 2014-07-01 | 2016-01-07 | Trumpf Werkzeugmaschinen Gmbh + Co. Kg | Verfahren und Vorrichtung zum Bestimmen einer Werkstoffart und/oder einer Oberflächenbeschaffenheit eines Werkstücks |
JP2018018354A (ja) * | 2016-07-28 | 2018-02-01 | 高砂香料工業株式会社 | ディープラーニングを用いた飲食品の品質予測方法及び飲食品 |
CN109063773B (zh) * | 2018-08-03 | 2021-07-27 | 华中科技大学 | 一种利用图像特征提高激光探针分类精度的方法 |
CN109345506A (zh) * | 2018-08-23 | 2019-02-15 | 中国科学院合肥物质科学研究院 | 一种基于卷积神经网络的热点与marfe自动检测方法 |
CN110705372B (zh) * | 2019-09-10 | 2023-05-05 | 中国科学院上海技术物理研究所 | 基于深度学习卷积神经网络的libs多成分定量反演方法 |
-
2020
- 2020-12-10 JP JP2022501649A patent/JP7388775B2/ja active Active
- 2020-12-10 CN CN202080096891.9A patent/CN115135990A/zh active Pending
- 2020-12-10 WO PCT/JP2020/045999 patent/WO2021166388A1/ja active Application Filing
- 2020-12-10 US US17/904,383 patent/US20230070781A1/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005837A (ja) * | 2000-06-23 | 2002-01-09 | Horiba Ltd | 分光分析装置 |
JP3134776U (ja) * | 2007-06-13 | 2007-08-23 | 株式会社島津製作所 | 発光分析装置 |
JP2015194402A (ja) * | 2014-03-31 | 2015-11-05 | 株式会社日立ハイテクサイエンス | Icp発光分光分析装置 |
Also Published As
Publication number | Publication date |
---|---|
CN115135990A (zh) | 2022-09-30 |
US20230070781A1 (en) | 2023-03-09 |
JP7388775B2 (ja) | 2023-11-29 |
WO2021166388A1 (ja) | 2021-08-26 |
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