JPWO2021112194A1 - - Google Patents
Info
- Publication number
- JPWO2021112194A1 JPWO2021112194A1 JP2021562728A JP2021562728A JPWO2021112194A1 JP WO2021112194 A1 JPWO2021112194 A1 JP WO2021112194A1 JP 2021562728 A JP2021562728 A JP 2021562728A JP 2021562728 A JP2021562728 A JP 2021562728A JP WO2021112194 A1 JPWO2021112194 A1 JP WO2021112194A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G61/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Materials For Photolithography (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019219931 | 2019-12-04 | ||
PCT/JP2020/045103 WO2021112194A1 (ja) | 2019-12-04 | 2020-12-03 | リソグラフィー用下層膜形成用組成物、リソグラフィー用下層膜、レジストパターン形成方法及び、回路パターン形成方法、オリゴマー、及び、精製方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPWO2021112194A1 true JPWO2021112194A1 (ko) | 2021-06-10 |
Family
ID=76221742
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021562728A Pending JPWO2021112194A1 (ko) | 2019-12-04 | 2020-12-03 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2021112194A1 (ko) |
TW (1) | TW202134792A (ko) |
WO (1) | WO2021112194A1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022009966A1 (ja) * | 2020-07-08 | 2022-01-13 | 三菱瓦斯化学株式会社 | 膜形成用組成物、レジスト組成物、感放射線性組成物、アモルファス膜の製造方法、レジストパターン形成方法、リソグラフィー用下層膜形成用組成物、リソグラフィー用下層膜の製造方法及び回路パターン形成方法、光学部材形成用組成物、膜形成用樹脂、レジスト樹脂、感放射線性樹脂、リソグラフィー用下層膜形成用樹脂 |
EP4206174A4 (en) * | 2020-08-28 | 2024-10-16 | Sekisui Chemical Co Ltd | JOINT, METHOD FOR PRODUCING THE JOINT, ADHESIVE COMPOSITION AND ADHESIVE TAPE |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5177418B2 (ja) * | 2008-12-12 | 2013-04-03 | 信越化学工業株式会社 | 反射防止膜形成材料、反射防止膜及びこれを用いたパターン形成方法 |
JP5485185B2 (ja) * | 2011-01-05 | 2014-05-07 | 信越化学工業株式会社 | レジスト下層膜材料及びこれを用いたパターン形成方法 |
CN105143979B (zh) * | 2013-04-17 | 2019-07-05 | 日产化学工业株式会社 | 抗蚀剂下层膜形成用组合物 |
JP6712188B2 (ja) * | 2015-07-13 | 2020-06-17 | 信越化学工業株式会社 | レジスト下層膜形成用組成物及びこれを用いたパターン形成方法 |
-
2020
- 2020-12-03 JP JP2021562728A patent/JPWO2021112194A1/ja active Pending
- 2020-12-03 WO PCT/JP2020/045103 patent/WO2021112194A1/ja active Application Filing
- 2020-12-04 TW TW109142861A patent/TW202134792A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2021112194A1 (ja) | 2021-06-10 |
TW202134792A (zh) | 2021-09-16 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20231010 |