JPWO2021067011A5 - - Google Patents
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- Publication number
- JPWO2021067011A5 JPWO2021067011A5 JP2022520034A JP2022520034A JPWO2021067011A5 JP WO2021067011 A5 JPWO2021067011 A5 JP WO2021067011A5 JP 2022520034 A JP2022520034 A JP 2022520034A JP 2022520034 A JP2022520034 A JP 2022520034A JP WO2021067011 A5 JPWO2021067011 A5 JP WO2021067011A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962907891P | 2019-09-30 | 2019-09-30 | |
| US62/907,891 | 2019-09-30 | ||
| PCT/US2020/049824 WO2021067011A1 (en) | 2019-09-30 | 2020-09-09 | Reduced impedance variation in a modular 2-terminal terminal contacting electrical measurement system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2022550414A JP2022550414A (ja) | 2022-12-01 |
| JPWO2021067011A5 true JPWO2021067011A5 (ko) | 2022-12-08 |
Family
ID=75338521
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022520034A Pending JP2022550414A (ja) | 2019-09-30 | 2020-09-09 | 電気測定システムに接触するモジュール型２端子におけるインピーダンス変化の減少 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20220299555A1 (ko) |
| JP (1) | JP2022550414A (ko) |
| KR (1) | KR20220070434A (ko) |
| CN (1) | CN114585940A (ko) |
| MX (1) | MX2022002862A (ko) |
| TW (1) | TW202115408A (ko) |
| WO (1) | WO2021067011A1 (ko) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60140160A (ja) * | 1983-12-27 | 1985-07-25 | Sumitomo Wiring Syst Ltd | コネクタの端子検査器 |
| US6734681B2 (en) * | 2001-08-10 | 2004-05-11 | James Sabey | Apparatus and methods for testing circuit boards |
| DE10144542C1 (de) * | 2001-09-10 | 2003-06-05 | Walter Ag | Schneidplatte und Fräswerkzeug |
| US6759842B2 (en) * | 2002-04-17 | 2004-07-06 | Eagle Test Systems, Inc. | Interface adapter for automatic test systems |
| WO2008052940A2 (en) * | 2006-10-30 | 2008-05-08 | Koninklijke Philips Electronics N.V. | Test structure for detection of defect devices with lowered resistance |
| US7839138B2 (en) * | 2007-01-29 | 2010-11-23 | Electro Scientific Industries, Inc. | Adjustable force electrical contactor |
| TWI534432B (zh) * | 2010-09-07 | 2016-05-21 | 瓊斯科技國際公司 | 用於微電路測試器之電氣傳導針腳 |
| EP3095159A4 (en) * | 2014-01-17 | 2017-09-27 | Nuvotronics, Inc. | Wafer scale test interface unit: low loss and high isolation devices and methods for high speed and high density mixed signal interconnects and contactors |
| US9594114B2 (en) * | 2014-06-26 | 2017-03-14 | Teradyne, Inc. | Structure for transmitting signals in an application space between a device under test and test electronics |
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2020
- 2020-09-09 MX MX2022002862A patent/MX2022002862A/es unknown
- 2020-09-09 TW TW109130941A patent/TW202115408A/zh unknown
- 2020-09-09 KR KR1020227008231A patent/KR20220070434A/ko unknown
- 2020-09-09 US US17/633,828 patent/US20220299555A1/en not_active Abandoned
- 2020-09-09 JP JP2022520034A patent/JP2022550414A/ja active Pending
- 2020-09-09 WO PCT/US2020/049824 patent/WO2021067011A1/en active Application Filing
- 2020-09-09 CN CN202080060297.4A patent/CN114585940A/zh active Pending