JPWO2021053865A1 - - Google Patents

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Publication number
JPWO2021053865A1
JPWO2021053865A1 JP2021546498A JP2021546498A JPWO2021053865A1 JP WO2021053865 A1 JPWO2021053865 A1 JP WO2021053865A1 JP 2021546498 A JP2021546498 A JP 2021546498A JP 2021546498 A JP2021546498 A JP 2021546498A JP WO2021053865 A1 JPWO2021053865 A1 JP WO2021053865A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021546498A
Other versions
JPWO2021053865A5 (ja
JP7226570B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021053865A1 publication Critical patent/JPWO2021053865A1/ja
Publication of JPWO2021053865A5 publication Critical patent/JPWO2021053865A5/ja
Application granted granted Critical
Publication of JP7226570B2 publication Critical patent/JP7226570B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2021546498A 2019-09-18 2020-04-13 イオン分析装置 Active JP7226570B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2019169230 2019-09-18
JP2019169230 2019-09-18
JP2020064842 2020-03-31
JP2020064842 2020-03-31
PCT/JP2020/016269 WO2021053865A1 (ja) 2019-09-18 2020-04-13 イオン分析装置

Publications (3)

Publication Number Publication Date
JPWO2021053865A1 true JPWO2021053865A1 (ja) 2021-03-25
JPWO2021053865A5 JPWO2021053865A5 (ja) 2022-04-08
JP7226570B2 JP7226570B2 (ja) 2023-02-21

Family

ID=74883779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021546498A Active JP7226570B2 (ja) 2019-09-18 2020-04-13 イオン分析装置

Country Status (4)

Country Link
US (1) US20220344140A1 (ja)
JP (1) JP7226570B2 (ja)
CN (1) CN114342040A (ja)
WO (1) WO2021053865A1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020255346A1 (ja) * 2019-06-20 2020-12-24 株式会社日立ハイテク 物質分析装置及び物質分析方法
US20230386814A1 (en) * 2020-11-02 2023-11-30 Shimadzu Corporation Ion Analyzer
CN118043937A (zh) * 2021-10-14 2024-05-14 株式会社岛津制作所 质量分析方法及质量分析装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015025008A1 (en) * 2013-08-21 2015-02-26 Thermo Fisher Scientific (Bremen) Gmbh Mass spectrometer
WO2018186286A1 (ja) * 2017-04-04 2018-10-11 株式会社島津製作所 イオン分析装置
JP2019056598A (ja) * 2017-09-20 2019-04-11 株式会社島津製作所 分析方法および分析装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0623234A (ja) * 1992-07-07 1994-02-01 Senichi Masuda ガス中窒素酸化物の低減方法
GB2299711B (en) * 1992-11-09 1997-04-02 Lg Electronics Inc Apparatus for making or treating a semiconductor
JP4221232B2 (ja) * 2003-02-28 2009-02-12 キヤノンアネルバ株式会社 イオン付着を利用する質量分析装置および質量分析方法
CN1938453B (zh) * 2004-04-23 2010-10-20 东曹株式会社 用于产生氢的电极及其制造方法和使用该电极的电解方法
CN109411111B (zh) * 2018-09-30 2021-08-06 苏州澋宬精密仪器科技有限公司 一种质谱电离子源用高导电性电极板及其制备方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015025008A1 (en) * 2013-08-21 2015-02-26 Thermo Fisher Scientific (Bremen) Gmbh Mass spectrometer
WO2018186286A1 (ja) * 2017-04-04 2018-10-11 株式会社島津製作所 イオン分析装置
JP2019056598A (ja) * 2017-09-20 2019-04-11 株式会社島津製作所 分析方法および分析装置

Also Published As

Publication number Publication date
US20220344140A1 (en) 2022-10-27
JP7226570B2 (ja) 2023-02-21
CN114342040A (zh) 2022-04-12
WO2021053865A1 (ja) 2021-03-25

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