JPWO2021053717A1 - - Google Patents

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Publication number
JPWO2021053717A1
JPWO2021053717A1 JP2021546079A JP2021546079A JPWO2021053717A1 JP WO2021053717 A1 JPWO2021053717 A1 JP WO2021053717A1 JP 2021546079 A JP2021546079 A JP 2021546079A JP 2021546079 A JP2021546079 A JP 2021546079A JP WO2021053717 A1 JPWO2021053717 A1 JP WO2021053717A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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JP2021546079A
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Japanese (ja)
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JP7396361B2 (ja
JPWO2021053717A5 (https=
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Publication of JPWO2021053717A5 publication Critical patent/JPWO2021053717A5/ja
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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32368—Quality control
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45135—Welding

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
JP2021546079A 2019-09-17 2019-09-17 異常判定装置及び異常判定方法 Active JP7396361B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/036383 WO2021053717A1 (ja) 2019-09-17 2019-09-17 異常判定装置及び異常判定方法

Publications (3)

Publication Number Publication Date
JPWO2021053717A1 true JPWO2021053717A1 (https=) 2021-03-25
JPWO2021053717A5 JPWO2021053717A5 (https=) 2022-07-08
JP7396361B2 JP7396361B2 (ja) 2023-12-12

Family

ID=74883052

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021546079A Active JP7396361B2 (ja) 2019-09-17 2019-09-17 異常判定装置及び異常判定方法

Country Status (6)

Country Link
US (1) US11604458B2 (https=)
EP (1) EP4033219B1 (https=)
JP (1) JP7396361B2 (https=)
CN (1) CN114391093B (https=)
MX (1) MX2022003138A (https=)
WO (1) WO2021053717A1 (https=)

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US20230419402A1 (en) * 2022-06-23 2023-12-28 The Toronto-Dominion Bank Systems and methods of optimizing machine learning models for automated anomaly detection
US12244469B2 (en) * 2022-12-08 2025-03-04 Microsoft Technology Licensing, Llc System and method for supervised event monitoring
TR2022020156A2 (tr) * 2022-12-23 2023-01-23 Siskon Enduestriyel Otomasyon Sistemleri Sanayi Ve Ticaret Anonim Sirketi Bi̇r uyari ve bi̇ldi̇ri̇m si̇stemi̇
JP7731940B2 (ja) * 2023-07-11 2025-09-01 株式会社Ｓｃｒｅｅｎホールディングス 吐出圧力監視装置、吐出圧力監視方法、コンピュータプログラム、および塗布装置
WO2025225038A1 (ja) * 2024-04-22 2025-10-30 三菱電機株式会社 情報処理装置、情報処理方法、及び情報処理プログラム

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JPH05337663A (ja) * 1991-10-22 1993-12-21 Mitsubishi Heavy Ind Ltd 溶接状況監視装置
JP2007257366A (ja) * 2006-03-23 2007-10-04 Kagawa Univ 診断装置及び診断方法
WO2014176625A1 (en) * 2013-05-01 2014-11-06 National Ict Australia Limited Determining a health condition of a structure
US20180100784A1 (en) * 2016-10-06 2018-04-12 General Electric Company Multi-layer anomaly detection framework
JP2018120300A (ja) * 2017-01-23 2018-08-02 株式会社リコー 情報処理装置、情報処理方法およびプログラム
JP2018142256A (ja) * 2017-02-28 2018-09-13 ファナック株式会社 在庫管理および予防保全を行う機能を有する在庫管理システム
WO2019058775A1 (ja) * 2017-09-21 2019-03-28 株式会社アダコテック 異常検出装置および異常検出方法
JP2019124984A (ja) * 2018-01-12 2019-07-25 株式会社明電舎 設備診断装置、設備診断方法
JP2019145079A (ja) * 2018-12-12 2019-08-29 エヌ・ティ・ティ・コミュニケーションズ株式会社 異常監視装置、異常監視方法および異常監視プログラム

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JP4605132B2 (ja) * 2006-09-29 2011-01-05 パナソニック電工株式会社 異常検出装置、異常検出方法
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JP7010641B2 (ja) * 2017-09-27 2022-01-26 パナソニック インテレクチュアル プロパティ コーポレーション オブ アメリカ 異常診断方法および異常診断装置
EP3514555B1 (en) * 2018-01-22 2020-07-22 Siemens Aktiengesellschaft Apparatus for monitoring an actuator system, method for providing an apparatus for monitoring an actuator system and method for monitoring an actuator system
CN110108486B (zh) * 2018-01-31 2022-07-05 阿里巴巴集团控股有限公司 轴承故障预测方法、设备及系统
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Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05337663A (ja) * 1991-10-22 1993-12-21 Mitsubishi Heavy Ind Ltd 溶接状況監視装置
JP2007257366A (ja) * 2006-03-23 2007-10-04 Kagawa Univ 診断装置及び診断方法
WO2014176625A1 (en) * 2013-05-01 2014-11-06 National Ict Australia Limited Determining a health condition of a structure
US20180100784A1 (en) * 2016-10-06 2018-04-12 General Electric Company Multi-layer anomaly detection framework
JP2018120300A (ja) * 2017-01-23 2018-08-02 株式会社リコー 情報処理装置、情報処理方法およびプログラム
JP2018142256A (ja) * 2017-02-28 2018-09-13 ファナック株式会社 在庫管理および予防保全を行う機能を有する在庫管理システム
WO2019058775A1 (ja) * 2017-09-21 2019-03-28 株式会社アダコテック 異常検出装置および異常検出方法
JP2019124984A (ja) * 2018-01-12 2019-07-25 株式会社明電舎 設備診断装置、設備診断方法
JP2019145079A (ja) * 2018-12-12 2019-08-29 エヌ・ティ・ティ・コミュニケーションズ株式会社 異常監視装置、異常監視方法および異常監視プログラム

Also Published As

Publication number Publication date
JP7396361B2 (ja) 2023-12-12
EP4033219A4 (en) 2022-10-05
CN114391093A (zh) 2022-04-22
MX2022003138A (es) 2022-11-09
CN114391093B (zh) 2023-10-24
EP4033219B1 (en) 2023-10-11
EP4033219A1 (en) 2022-07-27
WO2021053717A1 (ja) 2021-03-25
US20220350317A1 (en) 2022-11-03
US11604458B2 (en) 2023-03-14

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